CA997481A
Expired / Lapsed
CA
⏱️ 0.0 years remaining
Dc testing of integrated circuits and a novel integrated circuit structure to facilitate such testing
Assignee: International Business Machines Corp
•
Filing: 1973-11-01
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Granted: 1976-09-21
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Expires: 1993-11-01
Abstract
No abstract record available.
Inventors
- 👤 Larry E. Freed
- 👤 Daniel Tuman
- 👤 William J. Nestork
Bibliographic Details
Application Number
—
Jurisdiction
CA
Data Source
google_patents
Last Synchronized
2026-11-03 20:00
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/277; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884; H10D; H10D84/00; H10D84/60; H10D84/611; H10D84/613; Y; Y10; Y10S; Y10S148/00; Y10S148/02; Y10S148/037; Y10S148/053; Y10S148/085; Y10S148/136
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
No citation records indexed.
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