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EP0081368A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

A semiconductor memory device

Assignee: Fujitsu Ltd
•
Filing: 1982-12-06
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Granted: —
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Expires: 2002-12-06
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Abstract

Abstract A semiconductor memory device comprises a plurality of memory cells (MCA), each having a capacitor (28), and peripheral circuits (23), integrated on a semiconductor substrate (20). The capacitor has a storage electrode (30) and an opposite electrode (31) which is connected to a ground. The ground supply line (26 b, e) connected to the opposite electrode (31) of each capacitor (28) is physically separate and independent of other ground supply lines (26 a, c, d, f, g) connected to the peripheral circuits (23) over its entire length between a common portion (25, 32) having an impedance lower than the impedance of any ground line (26) so that data stored in the capacitors (28) is prevented from being destroyed by voltage fluctuations generated in the ground supply line (26 b, e) by the operation of the peripheral circuits (23).

Inventors

  • 👤 Shigeki Nozaki
  • 👤 Hatsuo Miyahara

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-31 20:22
CPC Classifications
G; G11; G11C; G11C5/00; G11C5/14; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/4063; G11C11/407; G11C11/4074

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 161 words
A semiconductor memory device comprising a semiconductor substrate (20); a plurality of memory cells (Figure 3) integrated on the semiconductor substrate (20), each of the memory cells having a capacitor (28) for storing data, the capacitors (28) having a storage electrode (30) and an opposite electrode (31) the opposite electrode (31) being connected to a first ground-potential supply line (26 b, e); and one or more peripheral circuits (23) integrated on the semiconductor substrate and arranged around the periphery of the memory cells, the peripheral circuits (23) being connected to second ground-potential supply lines (26, a, c, d, f, g); characterised in that the first ground-potential supply line (26 b, e) is physically separate and independent of the second ground-potential supply lines (26 a, c, d, f, g) over its entire length from a common connection portion (25, 32) having an impedance lower than the impedance of any of the first and second ground-potential supply lines to the memory cells. _
Claim 2
Dependent Claim 161 words
A semiconductor memory device comprising a semiconductor substrate (20); a plurality of memory cells (Figure 3) integrated on the semiconductor substrate (20), each of the memory cells having a capacitor (28) for storing data, the capacitors (28) having a storage electrode (30) and an opposite electrode (31) the opposite electrode (31) being connected to a first ground-potential supply line (26 b, e); and one or more peripheral circuits (23) integrated on the semiconductor substrate and arranged around the periphery of the memory cells, the peripheral circuits (23) being connected to second ground-potential supply lines (26, a, c, d, f, g); characterised in that the first ground-potential supply line (26 b, e) is physically separate and independent of the second ground-potential supply lines (26 a, c, d, f, g) over its entire length from a common connection portion (25, 32) having an impedance lower than the impedance of any of the first and second ground-potential supply lines to the memory cells. _
Claim 3
Dependent Claim 33 words
A semiconductor memory device according to claim 1, wherein the common connection portion comprises a ground pad (25) provided on the semiconductor substrate (20), the ground pad in use receiving a ground voltage.
Claim 4
Dependent Claim 77 words
A semiconductor memory device according to claim 2, wherein the common connection portion (Fig 4) comprises a common-wiring line (32) connected to the ground pad (25), the first ground-potential supply lines (26 a, c, d, f, g) branching from the common-wiring line (32), the common-wiring line having a line width larger than the line width of the first ground-potential supply line (26 e) or each of the second ground-potential supply lines (26 a, c, d, f, g).
Claim 5
Dependent Claim 23 words
A semiconductor memory device according to any one of the preceding claims, wherein the capacitor (28) is formed by a depletion-type MOS transistor.

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