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EP0223188A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Semiconductor programmable memory device

Assignee: Fujitsu Ltd
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Filing: 1986-11-11
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Granted: —
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Expires: 2006-11-11
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Abstract

Abstract A semiconductor programmable memory device especially an EEPROM of which checker board pattern for testing the operation of the memory matrix is easily written. The EEPROM is provided with a circuit which selects all of the word lines (WL) at the same time, a circuit which selects all of the bit lines (BL) at the same time, and a circuit which selects every other one word lines (WL) at the same time. By providing such circuits, the process to write the checker board pattern in the memory matrix has been reduced to only four steps regardless to the memory size. So, the process time to write the checker board pattern, which took more than a minute in prior art 64 k bits EEPROM for example, have been reduced to approximately 40 m sec, that is equivalent to write four bytes in the memory matrix.

Inventors

  • 👤 Hiromi Kawashima
  • 👤 Hideki Arakawa

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 00:34
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/04; G11C29/08; G11C29/12; G11C29/18; G11C29/30; G11C29/34; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C17/00; G11C17/14; G11C8/00; G11C8/12

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 70 words
A semiconductor programmable memory device in which a checker board pattern is written in a memory matrix for checking its operation, said device comprising; a first means for selecting all of the word lines (WL) at the same time; a second means for selecting all of the bit lines (BL) at the same time; and a third means for selecting every other one word lines (WL) at the same time.
Claim 2
Dependent Claim 70 words
A semiconductor programmable memory device in which a checker board pattern is written in a memory matrix for checking its operation, said device comprising; a first means for selecting all of the word lines (WL) at the same time; a second means for selecting all of the bit lines (BL) at the same time; and a third means for selecting every other one word lines (WL) at the same time.
Claim 3
Dependent Claim 21 words
A semiconductor programmable memory device ac­cording to claim 1, wherein said first means and second means are combined into one means.
Claim 4
Dependent Claim 21 words
A semiconductor programmable memory device ac­cording to claim 1, wherein said first means and third means are combined into one means.
Claim 5
Dependent Claim 21 words
A semiconductor programmable memory device ac­cording to claim 1, wherein said second means and third means are combined into one means.
Claim 6
Dependent Claim 23 words
A semiconductor programmable memory device ac­cording to claim 1, wherein said first means, second means and third means are combined into one means.
Claim 7
Independent Claim 145 words
A method to write a checker board pattern in a memory matrix of a semiconductor programmable memory device comprising following steps in sequence, step A): selecting all of the word lines and all of the bit lines at the same time, then erasing all bits in said memory matrix, and write a data "1" to all of the memory cells; step B); selecting all of the word lines at the same time, and writing to all of the bit lines alternately data of "0" and "1". step (C): selecting the word lines every other one at the same time, and writing to all of the bit lines a datum "0"; and step (D): selecting the word lines every other one at the same time, and writing to all of the bit lines an inverse data of the step (B), namely "1" "0" "1" "0" ···.
Claim 8
Independent Claim 145 words
A method to write a checker board pattern in a memory matrix of a semiconductor programmable memory device comprising following steps in sequence, step A): selecting all of the word lines and all of the bit lines at the same time, then erasing all bits in said memory matrix, and write a data "1" to all of the memory cells; step B); selecting all of the word lines at the same time, and writing to all of the bit lines alternately data of "0" and "1". step (C): selecting the word lines every other one at the same time, and writing to all of the bit lines a datum "0"; and step (D): selecting the word lines every other one at the same time, and writing to all of the bit lines an inverse data of the step (B), namely "1" "0" "1" "0" ···.

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