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EP0272433A2 Expired / Lapsed EP ⏱️ 0.0 years remaining

Integrated semiconductor circuit having load resistors arranged as thin-film bars in the field oxide regions separating the active transistor regions, and process for their manufacture

Assignee: Siemens AG
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Filing: 1987-11-11
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Granted: —
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Expires: 2007-11-11
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Abstract

Abstract Translated from German Bei einer integrierten MOS-Transistoren und/oder Bipolar-Tran­sistoren enthaltenden Schaltung bestehen die als Dünnschichtste­ge (14) auf den die aktiven Transistorbereiche trennenden Feld­oxidbereichen (2) angeordneten Lastwiderstände aus polykristal­linem Silizium (4), das gleichzeitig mit den Gate-Elektroden (24) und/oder den Emitter- bzw. Basisanschlußbereichen der Bipo­lartransistoren auf dem, die integreirte Schaltung enthaltenden Substrat (1) erzeugt wird. Die Strukturierung der Lastwiderstän­de (14) erfolgt mittels einer Oxidmaske (5), die als Ätzstop bei der Strukturierung der aus einer Doppelschicht aus Polysi­lizium (24) und hochschmelzendem Metallsilizid (27) bestehenden Gate-Elektode wirkt. Da für die Lastwiderstände (14) nur das Polysilizium (4) der Gate-Ebene (24) ohne darüberliegendes Si­lizid (27) verwendet wird, kann der Schichtwiderstand der Last­widerstände (14) unabhängig von den der Gates (24, 27) einge­stellt werden. Die Erfindung ist anwenbar für CMOS- und Bipo­lar/CMOS-Schaltungen., In the case of an integrated circuit comprising MOS transistors and / or bipolar transistors, the load resistors arranged as thin-film webs (14) on the field oxide regions (2) separating the active transistor regions consist of polycrystalline silicon (4) which, at the same time as the gate electrodes (24) and / or the emitter or base connection regions of the bipolar transistors are produced on the substrate (1) containing the integrated circuit. The load resistors (14) are structured by means of an oxide mask (5), which acts as an etching stop when structuring the gate electrode, which consists of a double layer of polysilicon (24) and high-melting metal silicide (27). Since only the polysilicon (4) of the gate level (24) without overlying silicide (27) is used for the load resistors (14), the sheet resistance of the load resistors (14) can be set independently of that of the gates (24, 27). The invention can be used for CMOS and bipolar / CMOS circuits.

Inventors

  • 👤 Josef Dr. Rer. Nat. Winnerl
  • 👤 Franz Dr. Rer. Nat. Neppl

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-29 23:13
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0107; H10D84/0109; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/064; H10W20/066; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01306; H10D64/01308; H10D64/0131; H10D88/00; H10P; H10P32/00; H10P32/30; H10P32/302; H10P76/00; H10P76/40; H10P76/408; H10P76/4085; H10W20/071; H10W20/074; H10W20/40; H10W20/41; H10W20/44; H10W20/4403; H10W20/4437; H10W20/4441

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