Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
29 words
A storable semiconductor cleaning solution consisting essentially of water, sulphuric acid at from 30% to 70% concentration by weight and hydrogen peroxide at from 1% to 20% by weight.
Claim 2
Dependent Claim
29 words
A storable semiconductor cleaning solution consisting essentially of water, sulphuric acid at from 30% to 70% concentration by weight and hydrogen peroxide at from 1% to 20% by weight.
Claim 3
Dependent Claim
23 words
A cleaning solution as claimed in claim 1 wherein the sulphuric acid is at a concentration of not more than 65% by weight.
Claim 4
Dependent Claim
25 words
A cleaning solution as claimed in claim 1 or 2 wherein the hydrogen peroxide is at a concentration of not more than 17% by weight.
Claim 5
Dependent Claim
13 words
A cleaning solution as claimed in any preceding claim also containing a sequestrant.
Claim 6
Dependent Claim
15 words
A cleaning solution as claimed in claim 4 containing at least 0.1% of the sequestrant.
Claim 7
Dependent Claim
18 words
A cleaning solution as claimed in claim 4 or 5 wherein the sequestrant is a pentavalent phosphorus compound.
Claim 8
Dependent Claim
13 words
A cleaning solution as claimed in any preceding claim also containing tin ions.
Claim 9
Dependent Claim
23 words
A cleaning solution as claimed in claim 7 containing at least 0.02 ppm by weight of a soluble tin compound expressed as Sn.
Claim 10
Dependent Claim
23 words
A cleaning solution as claimed in any preceding claim containing not more than 0.2 ppm of a soluble tin compound expressed as Sn.
Claim 11
Dependent Claim
18 words
A cleaning solution as claimed in any preceding claim containing less than 0.5 wt % of the sequestrant.
Claim 12
Dependent Claim
56 words
A process for the production of a cleaning solution as claimed in any preceding claim comprising diluting sulphuric acid by the addition of water, ageing the diluted acid until its temperature has dropped to below 30°C, introducing the hydrogen peroxide into the aged sulphuric acid while maintaining its temperature below 30°C, and equilibrating the resulting solution.
Claim 13
Dependent Claim
25 words
a process as claimed in claim 11 wherein the concentration of the hydrogen peroxide added to the diluted acid is at least 30% by weight.
Claim 14
Dependent Claim
25 words
A process as claimed in claim 11 wherein the concentration of the hydrogen peroxide added to the diluted acid is at least 65% by weight.
Claim 15
Dependent Claim
21 words
A process as claimed in claim 11 wherein the diluted acid has a concentration of not more than 80% by weight.
Claim 16
Independent Claim
23 words
A method of cleaning a semiconductor comprising contacting it with a cleaning solution as claimed in any one of claims 1 to 10.
Claim 17
Independent Claim
26 words
A method of cleaning a semiconductor comprising contacting it with a cleaning solution produced by the process claimed in any one of claims 11 to 14.
Claim 18
Dependent Claim
23 words
A method as claimed in claim 15 or 16 wherein the cleaning solution has a temperature of from ambient temperature to below 100°C.