Semiconductor integrated circuit device

Abstract

Abstract PURPOSE:To enable a test by a write voltage lower (higher) than an ordinary voltage to be performed even after sealing a package by connecting a power source voltage terminal and an external terminal to a terminal on which the reference voltage of a limit circuit is applied via two switches. CONSTITUTION:The two switches Q1 and Q2 are connected to the terminal on the reference voltage supplying side of the limit circuit D1 which keeps a booster voltage constant for the voltage set as reference, and the switch Q1 on one side is connected to an internal power source voltage terminal, and also, the switch Q2 on the other side is connected to the external terminal T1 of a chip. In other words, by turning on either the two switches Q1 and Q2 selectively provided at the limit circuit D1, it is possible to perform write by the booster voltage setting an external voltage applied on the external terminal T1 as reference other than the ordinary write by the booster voltage setting the internal power source voltage as reference. In such a way, it is possible to perform the measurement of a margin, a withstand voltage test, and an acceleration test even after sealing the package.

Inventors

• 👤 Kazuaki Ujiie
• 👤 氏家　和聡
• 👤 Shinji Nabeya
• 👤 鍋谷　慎二

Bibliographic Details