← Back to Patent Explorer
JPH03166757A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Fujitsu Ltd
•
Filing: 1989-11-27
•
Granted: —
•
Expires: 2009-11-27
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract PURPOSE:To stabilize element characteristics and to accelerate a speed by implanting impurity, so emitting an energy beam that it becomes substantially parallel in a beam scanning direction and a current direction, and providing a polysilicon film resistor to be so formed as to have positive temperature coefficient. CONSTITUTION:A polysilicon film 11b in which the scanning directions A1, A2 of an energy beam 12 are parallel to a current direction B2 is formed of a resistor having a positive temperature coefficient, and a polysilicon film 11a in which the scanning directions A1, A2 of the beam 12 are perpendicular to a current direction B1 is formed of a resist having a negative temperature coefficient. The film 11a having the negative temperature coefficient and the film 11b having the positive temperature coefficient are electrically connected in series to obtain a resistor having small temperature dependency. Thus, element characteristics can be stabilized, a junction capacity is reduced, and its speed can be increased.

Inventors

  • 👤 Kazuo Sukegawa
  • 👤 助川 和雄

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 18:00
CPC Classifications
—

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag