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JPH063271A Expired / Lapsed JP ⏱️ 0.0 years remaining

Spectroscopic analysis device

Assignee: Fujitsu Ltd
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Filing: 1992-06-22
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Granted: —
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Expires: 2012-06-22
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Abstract

Abstract Translated from Japanese (57)【要約】 【目的】本発明はラマン散乱を利用して試料の分析を行 う分光分析装置に関し、感度及び分解能を向上すること を目的とする。 【構成】試料12に向け光を照射するレーザ発生装置1 1と、試料12で散乱された散乱光を集光する集光光学 系13と、集光光学系13により集光された散乱光が入 射され散乱光を分光するポリクロメータ14と、このポ リクロメータ14より出射され結像したスペクトルパタ ーンを検出する1次元ライン型CCD15とにより構成 される分光分析装置において、上記CCD15を、上記 スペクトルパターンに沿って走査させる走査装置25, 27,18を設ける。 (57) [Summary] [Object] The present invention relates to a spectroscopic analyzer for analyzing a sample by utilizing Raman scattering, and an object thereof is to improve sensitivity and resolution. [Structure] Laser generator 1 for irradiating sample 12 with light 1, a condensing optical system 13 for condensing the scattered light scattered by the sample 12, a polychromator 14 for injecting the scattered light condensed by the condensing optical system 13 to disperse the scattered light, and this polychromator. In a spectroscopic analysis device including a one-dimensional line type CCD 15 for detecting the spectral pattern emitted from 14 and imaged, a scanning device 25 for scanning the CCD 15 along the spectral pattern, 27 and 18 are provided.

Inventors

  • 👤 Takuya Uzumaki
  • 👤 拓也 渦巻
  • 👤 Atsushi Tanaka
  • 👤 厚志 田中

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-06 14:21
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