JPS5224554A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Surface inspection device
Assignee: Hitachi Ltd
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Filing: 1975-08-20
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Granted: —
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Expires: 1995-08-20
Abstract
Abstract PURPOSE: To reliably detect flaws, foreign matters or stains on the surface of an object to be inspected, by effectively condensing the reflected and scattered light from the curved surface of the object which is shaped to, for example a cylindrically curved surface. COPYRIGHT: (C)1977,JPO&Japio
Inventors
- 👤 Yoshio Matsumoto
- 👤 Tomohiro Kuni
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-30 04:12
CPC Classifications
—
Claims Analysis
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References Cited (Backward Citations)
JPS4953491A
Cited
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