JPS5276969A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Rotary probe
Assignee: Fujitsu Ltd
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Filing: 1975-12-23
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Granted: —
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Expires: 1995-12-23
Abstract
Abstract PURPOSE: In a probe used for continuity test, etc., the probe is pushed onto the surface to be examined, whereby its tip is rotated to break an oxide film, etc. and perfect electrical contact is thereby obtained. COPYRIGHT: (C)1977,JPO&Japio
Inventors
- 👤 Toshinori Okada
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-09 13:38
CPC Classifications
—
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