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JPS5954218A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor substrate

Assignee: NEC Corp
•
Filing: 1982-09-21
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Granted: —
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Expires: 2002-09-21
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Abstract

Abstract PURPOSE:To obtain the polycrystalline Si substrate suitable for an IGFET, in which mobility is high and leakage currents are little, by depositing a polycrystalline Si film on the surface of an insulating substrate or a conductive substrate coated with an insulating thin-film, radiating laser beams filled with H2 gas and increasing the crystal grain size of the Si film. CONSTITUTION:A sample base 4 is disposed in a vessel 6 made of a metal, the insulating substrate or the conductive substrate 5, the surface thereof has the insulating thin-film, is placed on the base 4, H2 gas is fed in from an opening formed to the bottom, and the polycrystalline Si film is vapor-grown on the substrate 5 while discharging H2 gas from an exhaust system. Nd:YAG Laser beams or Ar ion laser beams from a laser light source 1 are projected to glass 7 set up to the upper side of the vessel 6 through a scanning mirror 2 and a convergent lens 3, and the Si film is irradiated. Accordingly, the inside of the vessel 6 is filled previously with H2 gas, and the surface of the Si film is scanned uniformly while turning the mirror 2. That is, H2 is bonded with the dangling bonds of a Si grain boundary, and the bonds are terminated and grain size is increased.

Inventors

  • 👤 Kunio Nakamura
  • 👤 中村 邦雄

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-06 14:26
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3814; H10P14/32; H10P14/3202; H10P14/3238; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411

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