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US3270255A Expired / Lapsed US ⏱️ 0.0 years remaining

Silicon rectifying junction structures for electric power and process of production thereof

Assignee: Hitachi Ltd
•
Filing: 1962-10-17
•
Granted: 1966-08-30
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Expires: 1982-10-17
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Abstract

No abstract record available.

Inventors

  • 👤 Nakatogawa Takeshi
  • 👤 Ogawa Takuzo
  • 👤 Hara Masatoshi
  • 👤 Okano Sadao

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 23:50
CPC Classifications
H; H10; H10D; H10D99/00; H10D8/00; H10D8/50; H10P; H10P95/00

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 117 words
A HIGH CAPACITY SILICONN RETIFYING DEVICE FOR POWER USE COMPRISED OF A BASIC CIRCULAR INTRINSIC MONOCRYSTALLINE SILICON WAFER, A DOFFUSED IMPURITY REGION OF ONE CONDUCTIVITY, THE RADIUS OF WHICH IS SMALLER THAN THAT OF SAID WAFER BY AN AMOUNT CORRESPONDING TO THE THICKNESS OF SAID WAFER, ADJACENT TO AND CONCENTRIC WITH SAID NTRINSIC REGION ON ONE SIDE OF SAID WAFER, ANOTHER DIFFUSE IMPURITY REGION OF OPPOSITE CONDUCTIVITY ADJACENT TO AND COEXTENSIVE WITH SAID INTRINSIC REGION DISPOSED ON THE OPPOSITE SIDE INTRINSIC REGION DISPOSED ON THE WAFER IS UNIFORM AND IS SMALLER THAN ITTS RADIUS, THEDEPTH OF SAID IMPURITY REGIONS BEING SUBSTANTIALLY 1/3 OR LESS OF THE INTRINSIC REGION, AND CONDUCTIVE CONTACT MEANS TO SAID DIFFERENT IMPURITY REGIONS.
Claim 2
Dependent Claim 117 words
A HIGH CAPACITY SILICONN RETIFYING DEVICE FOR POWER USE COMPRISED OF A BASIC CIRCULAR INTRINSIC MONOCRYSTALLINE SILICON WAFER, A DOFFUSED IMPURITY REGION OF ONE CONDUCTIVITY, THE RADIUS OF WHICH IS SMALLER THAN THAT OF SAID WAFER BY AN AMOUNT CORRESPONDING TO THE THICKNESS OF SAID WAFER, ADJACENT TO AND CONCENTRIC WITH SAID NTRINSIC REGION ON ONE SIDE OF SAID WAFER, ANOTHER DIFFUSE IMPURITY REGION OF OPPOSITE CONDUCTIVITY ADJACENT TO AND COEXTENSIVE WITH SAID INTRINSIC REGION DISPOSED ON THE OPPOSITE SIDE INTRINSIC REGION DISPOSED ON THE WAFER IS UNIFORM AND IS SMALLER THAN ITTS RADIUS, THEDEPTH OF SAID IMPURITY REGIONS BEING SUBSTANTIALLY 1/3 OR LESS OF THE INTRINSIC REGION, AND CONDUCTIVE CONTACT MEANS TO SAID DIFFERENT IMPURITY REGIONS.

References Cited (Backward Citations)

US2794846A Cited
US2947924A Cited
US2820932A Cited
US3059124A Cited
US2967344A Cited
US3081404A Cited
US3169197A Cited
US3078196A Cited
US2983854A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1969-08-29 1970-02-28 1970-08-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1973-08-29 1974-02-28 1974-08-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1977-08-29 1978-02-28 1978-08-30 $7700.00 Window Closed / Lapsed

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