US3323045A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dielectric measuring system including a clamp circuit for modifying one of two detection signals
Assignee: Industrial Nucleonics Corp
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Filing: 1963-10-21
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Granted: 1967-05-30
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Expires: 1983-10-21
Abstract
No abstract record available.
Inventors
- 👤 Clyde W Baird
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 16:14
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/22; G01N27/223
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
172 words
A SYSTEM FOR DETERMINING A PROPERTY OF A DIELECTRIC MATERIAL COMPRISING: A MEASURING PROBE HAVING SPACED ELECTRODES FOR COUPLING SAID PROBE TO SAID MATERIAL, FIRST SIGNAL GENERATING MEANS FOR GENERATING A HIGH FREQUENCY SIGNAL, SECOND SIGNAL GENERATING MEANS FOR GENERATING A LOW FREQUENCY SIGNAL, MEANS CONNECTED TO SAID FIRST AND SECOND SIGNAL GENERATING MEANS FOR COUPLING SAID HIGH AND LOW FREQUENCY SIGNALS TO SAID MEASURING PROBE, MEANS COUPLED TO SAID MEASURING PROBE FOR DERIVING A FIRST DETECTION SIGNAL RELATED TO SIGNALS FROM SAID PROBE OCCASIONED BY SAID MATERIAL AT SAID HIGH FREQUENCY AND A SECOND DETECTION SIGNAL RELATED TO SIGNALS FROM SAID PROBE OCCASIONED BY SAID MATERIAL AT SAID LOW FREQUENCY, NONLINEAR MEANS FOR MODIFYING AT LEAST ONE OF SAID FIRST AND SECOND DETECTION SIGNALS, AND MEANS RESPONSIVE TO SAID FIRST AND SECOND DETECTION SIGNALS FOR COMPARING SAID SIGNALS TO DERIVE AN INDICATION OF SAID PROPERTY OF SAID DIELECTRIC MATERIAL, SAID LAST NAMED MEANS BEING RESPONSIVE TO AT LEAST ONE OF SAID FIRST AND SECOND SIGNALS AS MODIFIED BY SAID NON-LINEAR MEANS.
Claim 2
Independent Claim
172 words
A SYSTEM FOR DETERMINING A PROPERTY OF A DIELECTRIC MATERIAL COMPRISING: A MEASURING PROBE HAVING SPACED ELECTRODES FOR COUPLING SAID PROBE TO SAID MATERIAL, FIRST SIGNAL GENERATING MEANS FOR GENERATING A HIGH FREQUENCY SIGNAL, SECOND SIGNAL GENERATING MEANS FOR GENERATING A LOW FREQUENCY SIGNAL, MEANS CONNECTED TO SAID FIRST AND SECOND SIGNAL GENERATING MEANS FOR COUPLING SAID HIGH AND LOW FREQUENCY SIGNALS TO SAID MEASURING PROBE, MEANS COUPLED TO SAID MEASURING PROBE FOR DERIVING A FIRST DETECTION SIGNAL RELATED TO SIGNALS FROM SAID PROBE OCCASIONED BY SAID MATERIAL AT SAID HIGH FREQUENCY AND A SECOND DETECTION SIGNAL RELATED TO SIGNALS FROM SAID PROBE OCCASIONED BY SAID MATERIAL AT SAID LOW FREQUENCY, NONLINEAR MEANS FOR MODIFYING AT LEAST ONE OF SAID FIRST AND SECOND DETECTION SIGNALS, AND MEANS RESPONSIVE TO SAID FIRST AND SECOND DETECTION SIGNALS FOR COMPARING SAID SIGNALS TO DERIVE AN INDICATION OF SAID PROPERTY OF SAID DIELECTRIC MATERIAL, SAID LAST NAMED MEANS BEING RESPONSIVE TO AT LEAST ONE OF SAID FIRST AND SECOND SIGNALS AS MODIFIED BY SAID NON-LINEAR MEANS.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1970-05-29 | 1970-11-28 | 1971-05-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1974-05-29 | 1974-11-28 | 1975-05-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1978-05-29 | 1978-11-28 | 1979-05-30 | $7700.00 | Window Closed / Lapsed |