Testing apparatus for a sequence of transistors and the like having a condition responsive marker

Claim 1

A TRANSISTOR TESTING DEVICE COMPRISING A MOVABLE SUPPORT, ELEMENT ON SAID SUPPORT FOR MAKING ELECTRICAL CONNECTION WITH THE BASE, EMITTER AND COLLECTOR RESPECTIVELY OF A TRANSISTOR SPECIMEN UNDER WHEN SAID SUPPORT IS MOVED TOWARD SAID SPECIMEN, MEANS FOR MOVING SAID SUPPORT SO AS TO BRING SAID ELEMENT INTO OPERATIVE ENGAGEMENT WITH SAID SPECIMEN, FIRST AND SECOND CIRCUITRY MEANS CONNECTED TO SAID ELEMENTS FOR TESTING FIRST AND AND SECOND OPERATIONAL CONDITIONS RESPECTIVELY OF SAID SPECIMEN, MEANS FOR ACTUATING SAID FIRST CIRCUITRY MEANS, TIME DELAY MEANS OPERATIVELY CONNECTED TO SAID SECOND CIRCUITRY MEANS FOR ACTUATING THE LATTER A PREDETERMINED PERIOD OF TIME AFTER SAID CIRCUITRY MEANS HAS BEEN ACTUATED, AND INDICATING MEANS OPERATIVELY CONNECTED TO SAID FIRST AND SECOND CIRCUITRY MEANS AND ACTUATED THEREBY IN ACCORDANCE WITH THE RESULTS OF THE TESTS CARRIED OUT, SAID INDICATING MEANS COMPRISING A SPECIMEN-MARKING DEVICE AND MEANS FOR ACTUATING SAID DEVICE IN ACCORDANCE WITH THE RESPONSE OF A SPECIMEN TO SAID TESTS, SAID SPECIMEN MARKING DEVICE BEING SPACED LATERALLY FROM SAID ELEMENTS SO AS TO ENGAGE A GIVEN SPECIMEN SPATIALLY DISPLACED FROM THE TEST SPECIMEN ENGAGED BY SAID ELEMENTS AT A PARTICULAR MOMENT, SAID ACTUATING MEANS BEING EFFECTIVE ON SAID MARKING DEVICE TO CAUSE SAID MARKING DEVICE TO MARK SAID GIVEN SPECIMEN.