US3534263A
Expired / Lapsed
US
⏱️ 0.0 years remaining
In-circuit testing for diode leakage
Assignee: AT&T Teletype Corp
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Filing: 1968-09-03
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Granted: 1970-10-13
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Expires: 1988-09-03
Abstract
No abstract record available.
Inventors
- 👤 Harold D Cook
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 19:35
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2632
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US3445769A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-10-12 | 1974-04-13 | 1974-10-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-10-12 | 1978-04-13 | 1978-10-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-10-12 | 1982-04-13 | 1982-10-13 | $7700.00 | Window Closed / Lapsed |