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US3627427A Expired / Lapsed US ⏱️ 0.0 years remaining

Method and apparatus for contour measurement

Assignee: Lockheed Martin Corp
•
Filing: 1970-02-11
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Granted: 1971-12-14
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Expires: 1990-02-11
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Abstract

Abstract A technique for measuring the contour of a surface by generating a pattern of optical interference between a periodic shadow pattern cast onto the surface and a periodic reference pattern. Translating the shadow pattern and the reference pattern at least one complete cycle of spatial frequency causes the average intensity of the shadow pattern, the reference grid pattern, and various extraneous optical noise images to be minimized or cancelled, so that only contour lines accurately describing the contour of the surface remain on the surface to be viewed or photographed.

Inventors

  • 👤 Winston O Johnson
  • 👤 Donald M Meadows

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 13:38
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/24; G01B11/25; G01B11/254

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 204 words
Surface-contour-measuring apparatus comprising: a source of illumination casting illumination diverging outwardly toward an object space in which a surface of an object to be examined may be positioned; shadow-casting structure disposed in the optical path of said diverging illumination between said source of illumination and said object space, said shadow-casting structure having a periodically repetitive pattern of segments which are alternatively opaque and transmissive with respect to illumination from said source and which cast a periodically repetitive shadow pattern having a certain spatial frequency of bright and dark regions toward the object space for impingement onto a surface positioned therein; optical interference means positioned to receive an image of said periodically repetitive pattern reflected From such surface, said optical interference means having a periodically repetitive pattern of segments having the same characteristics of alternate opacity and transmissivity as said segments of said shadow-casting structure to establish optical interference between the reflected image and the periodically repetitive pattern of said optical interference means; and means operatively interrelated with said shadow-casting structure and said optical interference means for selectively translating said shadow-casting structure and said optical interference means in phase synchronism with each other in a direction substantially parallel to the direction of said periodic repetition.
Claim 2
Dependent Claim 204 words
Surface-contour-measuring apparatus comprising: a source of illumination casting illumination diverging outwardly toward an object space in which a surface of an object to be examined may be positioned; shadow-casting structure disposed in the optical path of said diverging illumination between said source of illumination and said object space, said shadow-casting structure having a periodically repetitive pattern of segments which are alternatively opaque and transmissive with respect to illumination from said source and which cast a periodically repetitive shadow pattern having a certain spatial frequency of bright and dark regions toward the object space for impingement onto a surface positioned therein; optical interference means positioned to receive an image of said periodically repetitive pattern reflected From such surface, said optical interference means having a periodically repetitive pattern of segments having the same characteristics of alternate opacity and transmissivity as said segments of said shadow-casting structure to establish optical interference between the reflected image and the periodically repetitive pattern of said optical interference means; and means operatively interrelated with said shadow-casting structure and said optical interference means for selectively translating said shadow-casting structure and said optical interference means in phase synchronism with each other in a direction substantially parallel to the direction of said periodic repetition.
Claim 3
Dependent Claim 63 words
Apparatus as in claim 1, wherein: said shadow-casting structure and said optical interference means comprise a unitary grid member having a periodically repetitive pattern of segments and being mounted for translational movement in a direction substantially parallel to the direction of said periodic repetition; said selectively translating means comprising motive means operatively connected with said grid member for selectively imparting translational movement thereto.
Claim 4
Dependent Claim 21 words
Apparatus as in claim 2, wherein said motive means is operative to translate said grid member at a substantially constant velocity.
Claim 5
Independent Claim 134 words
The method of measuring the contour of a surface, comprising the steps of: generating a pattern of illuminations having a first spatial frequency; directing said pattern of illumination onto a surface being examined so that the contour of the surface imparts spatial modulation to said first spatial frequency; optically mixing the spatially modulated first spatial frequency with a reference pattern having a second spatial frequency to establish an interference pattern of spatial frequency components including a modulation component which is a spatially variable function only of the surface contour which caused said spatial modulation; and spatially shifting the phase of said first and second spatial frequencies so that interference pattern components which are cyclically variable in the direction of and as a result of said spatial phase shift are averaged for said phase shifts.
Claim 6
Independent Claim 134 words
The method of measuring the contour of a surface, comprising the steps of: generating a pattern of illuminations having a first spatial frequency; directing said pattern of illumination onto a surface being examined so that the contour of the surface imparts spatial modulation to said first spatial frequency; optically mixing the spatially modulated first spatial frequency with a reference pattern having a second spatial frequency to establish an interference pattern of spatial frequency components including a modulation component which is a spatially variable function only of the surface contour which caused said spatial modulation; and spatially shifting the phase of said first and second spatial frequencies so that interference pattern components which are cyclically variable in the direction of and as a result of said spatial phase shift are averaged for said phase shifts.
Claim 7
Dependent Claim 19 words
The method as in claim 4, wherein said second spatial frequency is substantially equal to said first spatial frequency.
Claim 8
Dependent Claim 34 words
The method as in claim 4, wherein the amount of said phase shift is sufficient to cause at least some of said cyclically variable interference patterns to undergo at least one cycle of variation.
Claim 9
Dependent Claim 16 words
The method as in claim 4, wherein said phase shift occurs at a substantially uniform rate.
Claim 10
Dependent Claim 20 words
The method as in claim 4, wherein said first and second spatial frequencies are shifted in phase by one cycle.
Claim 11
Dependent Claim 70 words
The method as in claim 8, wherein said step of phase shifting comprises: spatially shifting the phase of said first and second spatial frequencies to each of a plurality of fixed phase positions spaced equidistant throughout a spatial frequency cycle; and combining the interference patterns present at each of said fixed phase positions to produce a composite interference pattern which is a summation of the fixed phase position interference patterns.
Claim 12
Dependent Claim 44 words
The method as in claim 7, wherein said rate of phase shift is sufficiently great that the instantaneous intensity of the interference pattern components which are cyclically varied by said phase shift is perceptually integrated to the average value of such cyclically varied components.
Claim 13
Dependent Claim 130 words
The method as in claim 4, wherein said steps of mixing and phase shifting comprise: pictorially recording the spatially modulated first spatial frequency at a number of predetermined discrete phase shift positions in a cycle of said first spatial frequency; mixing the image of each such pictorial record with the image of said reference pattern shifted in phase to the one of said discrete phase shift positions whereat the corresponding pictorial record was made to establish saId interference pattern of spatial frequency components for each of said discrete phase shift positions; and adding together said discrete phase position interference patterns for said spatial frequency cycle so that interference pattern components which are cyclically variable in the direction of spatial phase shift have an average value for said phase shift cycle.
Claim 14
Dependent Claim 20 words
The method as in claim 11, wherein the spatial phase separation between each of said phase shift positions is uniform.
Claim 15
Dependent Claim 275 words
The method as in claim 11, wherein said step of pictorially recording comprises: preparing a first pictorial record of the spatially modulated first spatial frequency at a first spatial phase position; preparing a second pictorial record of the spatially modulated first spatial frequency at a second phase position spatially displaced 90* in a predetermined direction from said first phase position; preparing a third pictorial record by making a negative duplicate of said first pictorial record; preparing a fourth pictorial record by making a negative duplicate of said second pictorial record; mixing the spatial frequency on said first record with an image of said reference pattern which is in phase with said first spatial position to establish said interference pattern for the first spatial position; mixing the spatial frequency on said second record with an image of said reference pattern which is spatially displaced 90* in said predetermined direction from said first phase position to establish said interference pattern for the second spatial position; mixing the spatial frequency on said third record with an image of said reference pattern which is spatially displaced 180* in said predetermined direction from said first phase position to establish said interference pattern for the third position; mixing the spatial frequency on said fourth record with an image of said reference pattern which is spatially displaced 270* in said predetermined direction from said first phase position to establish said interference pattern for the fourth position; and adding together all of said spatial position interference patterns for the cycle of spatial frequency so that interference pattern components which are cyclically variable in the direction of spatial phase shift have an average value.
Claim 16
Independent Claim 170 words
The method of measuring the contour of a surface, comprising the steps of: applying a pattern of periodically repetitive illumination to the surface being examined to establish on such surface a pattern of said illumination which is spatially displaced by the contour of the surface; reflecting said pattern of spatially displaced illumination from the surface toward an observation location; passing the reflected illumination pattern through a periodically repetitive viewing structure which alternately blocks and permits the passage of the reflected illumination to establish a pattern of optical interference between said reflected pattern and said viewing structure so that said interference pattern contains surface contour information resulting from said spatial displacement of said applied pattern of illumination; and shifting both said pattern of periodically repetitive illumination and said periodically repetitive viewing structure at least one repetitive period in the direction of pattern repetition to cancel at least some of the portions of said interference pattern not containing surface contour information resulting from said spatial displacement of said applied pattern of illumination.
Claim 17
Independent Claim 170 words
The method of measuring the contour of a surface, comprising the steps of: applying a pattern of periodically repetitive illumination to the surface being examined to establish on such surface a pattern of said illumination which is spatially displaced by the contour of the surface; reflecting said pattern of spatially displaced illumination from the surface toward an observation location; passing the reflected illumination pattern through a periodically repetitive viewing structure which alternately blocks and permits the passage of the reflected illumination to establish a pattern of optical interference between said reflected pattern and said viewing structure so that said interference pattern contains surface contour information resulting from said spatial displacement of said applied pattern of illumination; and shifting both said pattern of periodically repetitive illumination and said periodically repetitive viewing structure at least one repetitive period in the direction of pattern repetition to cancel at least some of the portions of said interference pattern not containing surface contour information resulting from said spatial displacement of said applied pattern of illumination.
Claim 18
Dependent Claim 27 words
The method as in claim 14, wherein said shift of both said patterns is substantially an integral number of repetitive periods in the direction of pattern repetition.
Claim 19
Dependent Claim 50 words
The method as in claim 14, wherein said shift of both said patterns takes place at a rate of shift sufficiently great that the instantaneous intensity of the portions of said interference pattern which are affected by said sHift is perceptually integrated to the average value of such shift-affected portions.
Claim 20
Dependent Claim 66 words
The method as in claim 14, wherein said step of shifting comprises: shifting both said pattern of periodically repetitive illumination and said viewing structure to each of a plurality of fixed positions spaced equidistant throughout said repetitive pattern; and combining the interference pattern present at each of said fixed positions to produce a composite interference pattern which is a summation of the fixed position interference patterns.

References Cited (Backward Citations)

US1590532A Cited
US2867149A Cited
US3244895A Cited
CH398097A Cited
US3396627A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-12-13 1975-06-14 1975-12-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-12-13 1979-06-14 1979-12-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-12-13 1983-06-14 1983-12-14 $7700.00 Window Closed / Lapsed

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