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US3644770A Expired / Lapsed US ⏱️ 0.0 years remaining

Photoemitter having a p-type semiconductive substrate overlaid with cesium and n-type cesium oxide layers

Assignee: Varian Medical Systems Inc
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Filing: 1968-01-18
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Granted: 1972-02-22
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Expires: 1988-01-18
📄 Original PDF 🌐 Google Patents

Abstract

Abstract A junction-type photoemitter is disclosed. The photoemitter includes a heavily doped P-type semiconductive substrate for absorbing photons of radiation to be converted into electrons to be emitted. An alkali metal layer such as cesium metal is formed over the substrate member for filling the surface energy states of the P-semiconductive substrate. Finally, a layer of cesium oxide is formed over the alkali metal layer to provide a low-work function surface facing the vacuum into which the electrons are emitted from the photoemitter. The substrate member may be made of a III-V compound semiconductor or an alloy of two different III-V compound semiconductors (each compound semiconductor including one element from the third group of Periodic Table and another element of the fifth group of the Periodic Table) to provide a semiconductive band-gap energy which is equal to or slightly more than the work function of the cesium oxide layer. The P-type semiconductive substrate member is heavily doped with a concentration of acceptor dopant greater than 3 X 1018 acceptors per cubic centimeter. Likewise, the cesium oxide layer is heavily doped with donor atoms of cesium to provide the relatively low-work function characteristic of such material. In a preferred embodiment, the P-semiconductive substrate is formed of InP or an alloy of InP and InAs. The photoemitter has improved conversion efficiency in the wavelength range from 0.5 microns to 1.37 microns wavelength.

Inventors

  • 👤 Ronald L Bell

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 19:35
CPC Classifications
H; H01; H01J; H01J1/00; H01J1/02; H01J1/34; H01J2201/00; H01J2201/34; H01J2201/342; H01J2201/3421; H01J2201/3423

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 30 words
The apparatus of claim 1 wherein said heavily doped P-type semiconductive substrate material has a semiconductive band-gap energy at least equal to the work function of said N-type cesium oxide.
Claim 2
Dependent Claim 37 words
The apparatus of claim 1 wherein said heavily doped P-type semiconductive substrate material has a semiconductive band-gap energy greater than 0.75 electron volts and at least equal to the work function of said N-type cesium oxide material.
Claim 3
Dependent Claim 12 words
The apparatus of claim 1 wherein said substrate is formed of InP.
Claim 4
Dependent Claim 19 words
The apparatus of claim 1 wherein said intermediate layer of alkali metal is a layer of cesium alkali metal.
Claim 5
Dependent Claim 20 words
The apparatus of claim 5 wherein said intermediate cesium metal layer has a characteristic thickness less than five atoms thick.
Claim 6
Dependent Claim 48 words
The apparatus of claim 1 wherein said P-type semiconductiVe substrate material is formed by an alloy of first and second different compound semiconductors, each of said first and second compound semiconductors being formed of compounds of elements selected from the third and fifth column of the Periodic Table.
Claim 7
Dependent Claim 18 words
The apparatus of claim 7 wherein said P-type semiconductive substrate material includes an alloy of InP and InAs.
Claim 8
Dependent Claim 19 words
The apparatus of claim 8 wherein said acceptor dopant is selected from the class consisting of zinc and beryllium.
Claim 9
Dependent Claim 17 words
The apparatus of claim 8 wherein said substrate alloy includes a preponderance by mole ratio of InP.
Claim 10
Dependent Claim 21 words
The apparatus of claim 10 wherein said P-type semiconductive substrate alloy comprises approximately 66 percent InP and approximately 34 percent InAs.
Claim 11
Dependent Claim 28 words
The apparatus of claim 7 wherein said P-type semiconductive substrate alloy material includes an alloy selected from the class consisting of InAs and GaAs, and GaSb and GaAs.
Claim 12
Dependent Claim 16 words
The apparatus of claim 9 wherein the concentration of said dopant is approximately 5 X 1018/cm.3.
Claim 13
Dependent Claim 22 words
The apparatus of claim 4 wherein said InP substrate is doped with zinc dopant to a concentration of approximately 5 X 1018/cm.3.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-02-21 1975-08-23 1976-02-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-02-21 1979-08-23 1980-02-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-02-21 1983-08-23 1984-02-22 $7700.00 Window Closed / Lapsed

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