US3699340A
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Compton spectrometer having primary and secondary detectors with low and high atomic numbers, respectively
Assignee: Oesterreichische Studiengesellschaft fuer Atomenergie GmbH
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Filing: 1969-10-27
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Granted: 1972-10-17
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Expires: 1989-10-27
Abstract
Abstract A compton spectrometer having semiconductors which intercept the primary and secondary or back scattered radiation. One of the detectors is made of a material having a low atomic number and the other detector is made of a material of high atomic number.
Inventors
- 👤 Harald Peter Hick
- 👤 Rudolf Pepelnik
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 15:44
CPC Classifications
G; G01; G01T; G01T1/00; G01T1/36
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
68 words
A compton spectrometer comprising semiconductor detectors including a primary semiconductor detector for intercepting primary radiation and a secondary semiconductor detector for secondary or scattered radiation, wherein the improvement comprises, said detector for the primary radiation being a semiconductor made of a material having a low atomic number and said detector for the secondary or scattered radiation being a semiconductor made of a material having a high atomic number.
Claim 2
Dependent Claim
68 words
A compton spectrometer comprising semiconductor detectors including a primary semiconductor detector for intercepting primary radiation and a secondary semiconductor detector for secondary or scattered radiation, wherein the improvement comprises, said detector for the primary radiation being a semiconductor made of a material having a low atomic number and said detector for the secondary or scattered radiation being a semiconductor made of a material having a high atomic number.
Claim 3
Dependent Claim
59 words
A compton spectrometer comprising semiconductor detectors including a primary semiconductor detector for intercepting the primary radiation and a secondary semiconductor detector for secondary or scattered radiation, wherein the improvement comprises, material of the semiconductor detectors being drifted and said detector for the primary radiation being a Si(Li)-detector and the detector for the secondary or scattered radiation being a Ge(Li)-detector.
Claim 4
Dependent Claim
59 words
A compton spectrometer comprising semiconductor detectors including a primary semiconductor detector for intercepting the primary radiation and a secondary semiconductor detector for secondary or scattered radiation, wherein the improvement comprises, material of the semiconductor detectors being drifted and said detector for the primary radiation being a Si(Li)-detector and the detector for the secondary or scattered radiation being a Ge(Li)-detector.
Claim 5
Dependent Claim
54 words
The compton spectrometer, as set forth in claim 1, wherein said first and second detectors are arranged with means for using the sum of the energies of the radiations detected by said two detectors for energy analysis of one radiation passing successively through both detectors in order to cancel disturbing effects of line broadening.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1975-10-17 | 1976-04-17 | 1976-10-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1979-10-17 | 1980-04-17 | 1980-10-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1983-10-17 | 1984-04-17 | 1984-10-17 | $7700.00 | Window Closed / Lapsed |