US3792349A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dual channel, dual potential open-circuit test apparatus
Assignee: Bull HN Information Systems Italia SpA
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Filing: 1972-10-25
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Granted: 1974-02-12
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Expires: 1992-10-25
Abstract
Abstract A detector network for the indentification of discontinuities in integrated circuit lead connections in the presence of two different potentials such as positive or negative test pulses or different steady state voltages.
Inventors
- 👤 C Bobbitt
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 03:52
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2853
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
488 words
A systm for converting information received from a circuit under test energized by two different voltage potentials into indicator signals, said system comprising: a pair of test channels, a channel selector switch, an output gate, said selector switch being arranged to selectively connect a circuit under test between either of the two different potentials and either of said channels, said first channel comprising a first amplifier, having an input terminal connected to the circuit under test with one potential applied thereto by said selector switch and an output terminal connected to one terminal of a first comparator, a second gate having a first input terminal connected to an output terminal of said comparator, a first diode gate rendered conductive when said selector switch connects said first channel to the circuit under test and having an output terminal connected to a second input terminal of said second gate to permit conduction of said second gate according to the first input terminal of said second gate, said second gate having an output terminal connected to a first terminal of said output gate, said first comparator having a second input terminal connected to a source of potential which controls the polarity of the output signal of said first comparator, said second channel comprising a second amplifier having an input terminal connected to the circuit under test with the second potential applied thereto by said selector switch and an output terminal connected to one terminal of a second comparator, a third gate having a first input terminal connected to an output terminal of said second comparator, a second diod gate rendered conductive when said selector switch connects said second channel to the circuit udder test and having an output terminal connected to a second input terminal of said third gate to permit conduction of said third gate according to the first input terminal of said third gate, said third gate having an output terminal connected to a second terminal of said output gate, said second comparator having a second input terminal connected to a source of potential which controls the polarity of the output signal of said second comparator, said first channel transmitting a given signal to the first input terminal of said output gate when said selector switch connects the circuit under test to said first channel and continuity exists in the circuit under test, said second channel transmitting a given signal to the second input terminal of said output gate when said selector switch connects the circuit under test to said second channel and continuity exists in the circuit under test, said first diode gate rendered nonconductive when the circuit under test is connected via said selector switch to said second channel, said second diode gate rendered nonconductive when the circuit under test is connected via said selector switch to said first channel, said output gate transmitting an error signal when continuity does not exist in the circuit under test.
Claim 2
Dependent Claim
488 words
A systm for converting information received from a circuit under test energized by two different voltage potentials into indicator signals, said system comprising: a pair of test channels, a channel selector switch, an output gate, said selector switch being arranged to selectively connect a circuit under test between either of the two different potentials and either of said channels, said first channel comprising a first amplifier, having an input terminal connected to the circuit under test with one potential applied thereto by said selector switch and an output terminal connected to one terminal of a first comparator, a second gate having a first input terminal connected to an output terminal of said comparator, a first diode gate rendered conductive when said selector switch connects said first channel to the circuit under test and having an output terminal connected to a second input terminal of said second gate to permit conduction of said second gate according to the first input terminal of said second gate, said second gate having an output terminal connected to a first terminal of said output gate, said first comparator having a second input terminal connected to a source of potential which controls the polarity of the output signal of said first comparator, said second channel comprising a second amplifier having an input terminal connected to the circuit under test with the second potential applied thereto by said selector switch and an output terminal connected to one terminal of a second comparator, a third gate having a first input terminal connected to an output terminal of said second comparator, a second diod gate rendered conductive when said selector switch connects said second channel to the circuit udder test and having an output terminal connected to a second input terminal of said third gate to permit conduction of said third gate according to the first input terminal of said third gate, said third gate having an output terminal connected to a second terminal of said output gate, said second comparator having a second input terminal connected to a source of potential which controls the polarity of the output signal of said second comparator, said first channel transmitting a given signal to the first input terminal of said output gate when said selector switch connects the circuit under test to said first channel and continuity exists in the circuit under test, said second channel transmitting a given signal to the second input terminal of said output gate when said selector switch connects the circuit under test to said second channel and continuity exists in the circuit under test, said first diode gate rendered nonconductive when the circuit under test is connected via said selector switch to said second channel, said second diode gate rendered nonconductive when the circuit under test is connected via said selector switch to said first channel, said output gate transmitting an error signal when continuity does not exist in the circuit under test.
Claim 3
Dependent Claim
56 words
The system set forth in claim 1 wherein: said selector switch is provided with an OFF position and when said selector switch is in said OFF position said first and second channels each transmit to said output gate signals indicative of an unenergized condition, said output gate transmitting an output signal indicative of a fault condition.
Claim 4
Dependent Claim
41 words
The system set forth in claim 1 wherein: said selector switch simultaneously connects one end of the circuit under test to either of said first and second potentials and the other end of the circuit under test to a different potential.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-02-11 | 1977-08-13 | 1978-02-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-02-11 | 1981-08-13 | 1982-02-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-02-11 | 1985-08-13 | 1986-02-12 | $7700.00 | Window Closed / Lapsed |