US3840301A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus and method for analyzing surface contour
Assignee: Sensor Adaptive Machines Inc
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Filing: 1973-02-02
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Granted: 1974-10-08
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Expires: 1993-02-02
Abstract
Abstract Surface contour is analyzed by providing a plurality of surface contact members in a housing. A first portion of the members contacts the surface. A second portion serves as a diffraction wave producing means. The housing also includes a second diffraction wave producing means spaced from the first. Electromagnetic radiation is directed at the first and second diffraction wave producing means to form a plurality of discrete interference patterns each caused by the interaction of waves produced from said first and second diffraction wave producing means.
Inventors
- 👤 T Pryor
- 👤 O Hageniers
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 11:37
CPC Classifications
G; G01; G01B; G01B5/00; G01B5/20; G01B5/205; G01B11/00; G01B11/02; G01B11/24; G01B11/245
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
136 words
A method of analyzing the contour of a surface comprising the steps of: providing a plurality of members in a housing, each member having a surface contact portion, and a first diffraction wave producing means portion and being moveable to contact said surface with said surface contact portion; providing at least one second diffraction wave producing means in said housing spaced from the diffraction wave producing means portion of said members; directing electromagnetic radiation at said diffraction wave producing means portion of said members and said second diffraction wave producing means to form a plurality of discrete interference patterns each caused by the interaction of waves produced from said first diffraction wave producing means portion and said second diffraction wave producing means; and directing said plurality of discrete interference patterns to a central location for analysis.
Claim 2
Independent Claim
136 words
A method of analyzing the contour of a surface comprising the steps of: providing a plurality of members in a housing, each member having a surface contact portion, and a first diffraction wave producing means portion and being moveable to contact said surface with said surface contact portion; providing at least one second diffraction wave producing means in said housing spaced from the diffraction wave producing means portion of said members; directing electromagnetic radiation at said diffraction wave producing means portion of said members and said second diffraction wave producing means to form a plurality of discrete interference patterns each caused by the interaction of waves produced from said first diffraction wave producing means portion and said second diffraction wave producing means; and directing said plurality of discrete interference patterns to a central location for analysis.
Claim 3
Dependent Claim
28 words
A method according to claim 1 wherein said members are elongate, one end constituting said contact portion and the other end constituting said diffraction wave producing means portion.
Claim 4
Dependent Claim
25 words
A method according to claim 2 wherein said second diffraction wave producing means comprises a straight edge spaced from said diffraction wave producing means portion.
Claim 5
Dependent Claim
25 words
A method according to claim 2 wherein said second diffraction wave producing means comprises a stepped edge spaced from said diffraction wave producing means portion.
Claim 6
Dependent Claim
130 words
Apparatus for analyzing the contour of a surface comprising: a housing including a plurality of members, each member having a surface contact portion and a first diffraction wave producing means portion and being moveable to contact said surface with said surface contact portion, said housing further including at least one second diffraction wave producing means spaced from said first diffraction wave producing means; means for directing electromagnetic radiation at said first and second diffraction wave producing means to form a plurality of discrete interference patterns, each caused by the interaction of waves produced from said first and second diffraction wave producing means; detector means located at a central location; and means for directing said plurality of discrete interference patterns onto said detector at said central location for detecting said patterns.
Claim 7
Dependent Claim
130 words
Apparatus for analyzing the contour of a surface comprising: a housing including a plurality of members, each member having a surface contact portion and a first diffraction wave producing means portion and being moveable to contact said surface with said surface contact portion, said housing further including at least one second diffraction wave producing means spaced from said first diffraction wave producing means; means for directing electromagnetic radiation at said first and second diffraction wave producing means to form a plurality of discrete interference patterns, each caused by the interaction of waves produced from said first and second diffraction wave producing means; detector means located at a central location; and means for directing said plurality of discrete interference patterns onto said detector at said central location for detecting said patterns.
Claim 8
Dependent Claim
27 words
Apparatus according to claim 5 wherein said members are elongate, one end constituting said contact portion and the other end constituting said diffraction wave producing means portion.
Claim 9
Dependent Claim
24 words
Apparatus according to claim 5 wherein said second diffraction wave producing means comprises a straight edge spaced from said diffraction wave producing means portion.
Claim 10
Dependent Claim
24 words
Apparatus according to claim 5 wherein said second diffraction wave producing means comprises a stepped edge spaced from said diffraction wave producing means portion.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-10-07 | 1978-04-08 | 1978-10-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-10-07 | 1982-04-08 | 1982-10-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-10-07 | 1986-04-08 | 1986-10-08 | $7700.00 | Window Closed / Lapsed |