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US4040080A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor cold electron emission device

Assignee: Hamamatsu Terebi KK
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Filing: 1976-09-20
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Granted: 1977-08-02
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Expires: 1996-09-20
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Abstract

Abstract A semiconductor cold emission device comprising at least two different semiconductors and a junction with a first region having n-type conductivity and a second region which is a p-type conductivity and an indirect transition type material whose effective forbidden bandwidth is smaller than that of the first region and means for applying voltage to the junction to cause electrons injected from the first region to the second region to be emitted from the surface of the second region to the exterior.

Inventors

  • 👤 Katsuo Hara
  • 👤 Minoru Hagino
  • 👤 Tokuzo Sukegawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 02:01
CPC Classifications
H; H01; H01J; H01J1/00; H01J1/02; H01J1/30; H01J1/308; H01J9/00; H01J9/02; H01J9/022

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 214 words
A cold emission semiconductor device comprising a first layer of GaAlP, and of several hundred Angstroms thickness and of n-type conductivity; a second layer of GaAlP of p-type conductivity and of a thickness less than the diffusion length of electrons, and whose effective forbidden band gap is smaller than that of said first layer, said first and said second layers being intimately in contact with each other through epitaxial growth and with substantial lattice match to form a heterojunction, said second layer having a surface opposite said heterojunction with zero or negative electron affinity for emission of electrons, a first electrode connectable to said first layer, and a second electrode connectable to said second layer with the distance between said second electrode and said heterojunction being more than the diffusion length of electrons, and means for applying a potential to said electrodes to bias said heterojunction and cause said first layer to generate electrons which are subsequently injected into said second layer and without substantially any recombination emitted from said surface of said second layer, wherein an insulating or high resistance layer is provided at selected portions toward either side of said junction to enable concentration of electron flow to areas of said junction not effectively convered by said insulating or high resistance layer.
Claim 2
Dependent Claim 214 words
A cold emission semiconductor device comprising a first layer of GaAlP, and of several hundred Angstroms thickness and of n-type conductivity; a second layer of GaAlP of p-type conductivity and of a thickness less than the diffusion length of electrons, and whose effective forbidden band gap is smaller than that of said first layer, said first and said second layers being intimately in contact with each other through epitaxial growth and with substantial lattice match to form a heterojunction, said second layer having a surface opposite said heterojunction with zero or negative electron affinity for emission of electrons, a first electrode connectable to said first layer, and a second electrode connectable to said second layer with the distance between said second electrode and said heterojunction being more than the diffusion length of electrons, and means for applying a potential to said electrodes to bias said heterojunction and cause said first layer to generate electrons which are subsequently injected into said second layer and without substantially any recombination emitted from said surface of said second layer, wherein an insulating or high resistance layer is provided at selected portions toward either side of said junction to enable concentration of electron flow to areas of said junction not effectively convered by said insulating or high resistance layer.
Claim 3
Dependent Claim 19 words
The device of claim 1, wherein said surface opposite said heterojunction is activated by cesium or cesium and oxygen.
Claim 4
Dependent Claim 17 words
The device of claim 1, further comprising means for providing drift electric field to increase transport factor.
Claim 5
Dependent Claim 87 words
The device of claim 1, comprising, in order, an electrode, n-type layer of GaP, n-type layer of Al(x)Ga(1-x)P, wherein x is a positive number less than 1, defining said first region, insulating layer covering selected parts of said layer of Al(x)Ga(1-x)P, p-type layer of GaP defining said second region and covering said insulating layer and the uncovered portion of said Al(x)Ga(1-x)P to form a junction therewith, an electron emissive surface on the opposite side thereof, and ohmic contacts covering selected portions of said p-type layer of GaP.
Claim 6
Dependent Claim 70 words
The device of claim 1, comprising, in order, an electrode, a base, p-type region covering selected parts of said base, n-type layer of Al(x)Ga(1-x)P, wherein x is a positive number less than 1, defining a first region, p-type layer forming a junctionwith said first region and defining a second regin with an electron emissive surface on the opposite side thereof, and ohmic contacts at selected portions of said p-type layer.
Claim 7
Dependent Claim 111 words
The deive of claim 1, comprising, in order, an electrode, an insulating layer covering selected portions of said electrode, an n-type layer of GaP covering said insulating layer and the uncovered portions of said electrode, an n-type layer of Al(x)Ga(1-x)P, wherein x is a positive number less than 1, defining said first region, a p-type layer of GaP defining said second region having a surface for electron emission directly opposite said uncovered portion, a p-type layer of Al(z)Ga(1-z)P, directly opposited said covered portion, wherein z is a positive number less than 1, a p-type layer of GaP on said p-type Al(z)Ga(1-z)P layer, and ohmic contacts on said p-type layer of GaP.

References Cited (Backward Citations)

US3696262A Cited
US3667007A Cited
USB309756I5 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1980-08-01 1981-01-31 1981-08-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1984-08-01 1985-01-31 1985-08-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1988-08-01 1989-01-31 1989-08-02 $7700.00 Window Closed / Lapsed

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