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US4061916A Expired / Lapsed US ⏱️ 0.0 years remaining

Silicon-insulator-polysilicon infrared imaging device and method of making same

Assignee: United States Department of the Army
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Filing: 1976-11-01
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Granted: 1977-12-06
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Expires: 1996-11-01
📄 Original PDF 🌐 Google Patents

Abstract

Abstract A layer of epitaxial silicon is grown on a silicon growth substrate, a thinayer of silicon dioxide or other suitable insulator is grown (in the case of silicon dioxide) or deposited (for other insulators) on the epitaxial layer, and a thick layer of polysilicon is grown on the dioxide layer. The silicon growth substrate is then removed, and the epitaxial layer is etched to form islands on the insulator layer. Some of the islands are doped to form an array of infrared sensitive detectors, and a large island is doped to act as CCD region. Electrical leads are fabricated, some to provide drive and output lines for the CCDs, other to provide connections of the detectors to respective CCDs, and yet others to provide common leads for the detectors.

Inventors

  • 👤 Gerard J. King
  • 👤 Joseph F. Martino, Jr.

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 01:47
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/15; H10F39/157; H10F39/1575

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 95 words
An imaging infrared detector device including a support substrate: an insulating layer on one side of said substrate; an array of infrared detectors on said insulating layer; a CCD on said insulating layer including an array of unit cells at least equal in number to the number of detectors, each unit cell including a coupling region; and electrical lead means including a common connector to one side of each of said detectors, individual connectors from an opposite side of each of said detectors to a respective CCD coupling region, and drive connectors for said CCD.
Claim 2
Dependent Claim 95 words
An imaging infrared detector device including a support substrate: an insulating layer on one side of said substrate; an array of infrared detectors on said insulating layer; a CCD on said insulating layer including an array of unit cells at least equal in number to the number of detectors, each unit cell including a coupling region; and electrical lead means including a common connector to one side of each of said detectors, individual connectors from an opposite side of each of said detectors to a respective CCD coupling region, and drive connectors for said CCD.
Claim 3
Dependent Claim 12 words
The device as recited in claim 1 wherein said substrate is polysilicon.
Claim 4
Dependent Claim 14 words
The device as recited in claim 2 wherein said insulating layer is silicon dioxide.
Claim 5
Dependent Claim 14 words
The device as recited in claim 1 wherein said insulating layer is aluminum oxide.
Claim 6
Dependent Claim 15 words
The device as recited in claim 1 wherein said insulating layer is silicon dioxide glass.
Claim 7
Dependent Claim 14 words
The device as recited in claim 1 wherein said insulating layer is silicon nitride.
Claim 8
Dependent Claim 13 words
The device as recited in claim 2 wherein said detectors are extrinsic silicon.
Claim 9
Dependent Claim 16 words
The device as recited in claim 7 wherein said detectors are in a two dimensional array.

References Cited (Backward Citations)

US3806729A Cited
US3842274A Cited
US3883437A Cited
US3996599A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1980-12-05 1981-06-06 1981-12-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1984-12-05 1985-06-06 1985-12-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1988-12-05 1989-06-06 1989-12-06 $7700.00 Window Closed / Lapsed

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