US4094602A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Microform card alignment device
Assignee: BELL & HOWELL COMPANY A CORP OF DELAWARE
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Filing: 1977-07-03
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Granted: 1978-06-13
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Expires: 1997-07-03
Abstract
Abstract A device for uniformly aligning each of a series of microform cards with a projected test pattern, including means for moving a card relative to said test pattern, and means for perforating the card while aligned.
Inventors
- 👤 Robert George Holliday
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 18:08
CPC Classifications
G; G03; G03B; G03B27/00; G03B27/32; G03B27/52; G03B27/62; G03B27/6271; G03B27/6292
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
113 words
An apparatus for aligning a series of microform cards with a spatially-defined test pattern, comprising: (a) a platen having at least one substantially transparent area bearing a spatially-defined test pattern; (b) means for retaining a microform card upon said platen and said test pattern; (c) optical means proximate said platen for projecting said test pattern and that portion of said microfiche card overlapping thereon onto a viewing surface; (d) adjustable means in contact with said retaining means for moving said retaining means and thus said microform card relative to said platen and said test pattern; and (e) means for perforating said microform card when said card is in contact with said retaining means.
Claim 2
Independent Claim
113 words
An apparatus for aligning a series of microform cards with a spatially-defined test pattern, comprising: (a) a platen having at least one substantially transparent area bearing a spatially-defined test pattern; (b) means for retaining a microform card upon said platen and said test pattern; (c) optical means proximate said platen for projecting said test pattern and that portion of said microfiche card overlapping thereon onto a viewing surface; (d) adjustable means in contact with said retaining means for moving said retaining means and thus said microform card relative to said platen and said test pattern; and (e) means for perforating said microform card when said card is in contact with said retaining means.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-06-12 | 1981-12-12 | 1982-06-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-06-12 | 1985-12-12 | 1986-06-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-06-12 | 1989-12-12 | 1990-06-13 | $7700.00 | Window Closed / Lapsed |