US4112362A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for the nondestructive testing of voltage limiting blocks
Assignee: Electric Power Research Institute
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Filing: 1976-12-30
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Granted: 1978-09-05
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Expires: 1996-12-30
Abstract
Abstract A method for the nondestructive testing of voltage limiting blocks includes the steps of providing several discrete electrical contacts across the block, sequentially applying to each of the contacts a voltage to determine the corresponding current and utilizing the current and voltage values to determine constants related to the microstructure of that particular location. The constants can then be utilized to derive a contour map which will be indicative of a hot spot in such block as determined by a maxima of the contour map.
Inventors
- 👤 Philip L. Hower
- 👤 William G. Carlson
- 👤 Tapan K. Gupta
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 16:51
CPC Classifications
G; G01; G01R; G01R31/00; G01R15/00
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
106 words
A method for the nondestructive testing of voltage limiting blocks comprising the following steps: placing a plurality of discrete electrical contacts on one surface of a block and a full electrode on the opposite surface of the block; sequentially applying a voltage to each contact and measuring the resultant current; deriving from said voltage and current empirical constants representative of the particular microstructure of said block in proximity to a respective contact; utilizing said derived constants to effectively draw a contour map of current density across said block; and determining the maxima of said contour to permit the calculation of a quality rating of said block.
Claim 2
Independent Claim
106 words
A method for the nondestructive testing of voltage limiting blocks comprising the following steps: placing a plurality of discrete electrical contacts on one surface of a block and a full electrode on the opposite surface of the block; sequentially applying a voltage to each contact and measuring the resultant current; deriving from said voltage and current empirical constants representative of the particular microstructure of said block in proximity to a respective contact; utilizing said derived constants to effectively draw a contour map of current density across said block; and determining the maxima of said contour to permit the calculation of a quality rating of said block.
Claim 3
Dependent Claim
19 words
A method as in claim 1 where in said contour map step an assumed operating voltage is also utilized.
Claim 4
Dependent Claim
20 words
A method as in claim 2 where said quality rating is change of temperature given an assumed voltage pulse time.
References Cited (Backward Citations)
US2776402A
Cited
US3090112A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-09-04 | 1982-03-06 | 1982-09-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-09-04 | 1986-03-06 | 1986-09-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-09-04 | 1990-03-06 | 1990-09-05 | $7700.00 | Window Closed / Lapsed |