Non-contacting gage apparatus and method

Claim 2

In an apparatus for gaging the thickness of a material, said apparatus including a source of radiation, a detector spaced from the source of radiation, the space between the source and detector defining an inspection field which is adapted to receive the material, and means for generating measurement values as a function of the radiation attenuation caused by objects in the inspection field; an improvement for calibrating the source of radiation and/or the detector, comprising: means for storing a first set of measurement values associated with standard pieces of known thickness temporarily positioned in the inspection field; means responsive to said first set of measurement values for determining and storing a first function which represents the relationship between the thickness of the standard pieces and the measurement values determined therefrom; means for storing a second set of measurement values associated with material samples of known thickness temporarily positioned in the inspection field; means responsive to said second set of measurement values for determining and storing a second function; means for storing an operator-entered nominal thickness for said material; means for determining the expected measured value which would be obtained upon insertion of material of nominal thickness in the inspection field by computing said expected measured value from the operator-entered nominal thickness in conjunction with said first function and said second function; and means for adjusting said source and/or detector in accordance with the determined expected measured value.

Claim 3

Apparatus as defined by claim 1 wherein said second function represents the relationship between said relative attenuation attributable to said standard pieces and the relative attenuation attributable to said material samples for different thicknesses thereof.

Claim 4

Apparatus as defined by claim 1 wherein the means for determining the expected measured value includes means for determining an apparent thickness from said operator-entered nominal thickness and said second function; and means for determining the expected measured value from said apparent thickness and said first function.

Claim 5

Apparatus as defined by claim 2 wherein the means for determining the expected measured value includes means for determining an apparent thickness from said operator-entered nominal thickness and said second function; and means for determining the expected measured value from said apparent thickness and said first function.

Claim 6

For use in conjunction with an apparatus for gaging the thickness of a material, said apparatus including a source of radiation, a detector spaced from the source of radiation, the space between the source and detector defining an inspection field which is adapted to receive the material, and means for generating measurement values as a function of the radiation attenuation caused by objects in the inspection field; an improved method for calibrating the source and/or the detector, comprising the steps of: (a) storing a first set of measurement values associated with standard pieces of known thickness temporarily positioned in the inspection field; (b) determining and storing a first function which represents the relationship between the thickness of the standard pieces and the measurement values determined therefrom; (c) storing a second set of measurement values associated with material samples of known thickness temporarily positioned in the inspection field; (d) determining and storing a second function which represents the relationship between the relative attenuation attributable to the standard pieces and the relative attenuation attributable to the material samples for different thicknesses thereof; (e) storing an operator-entered nominal thickness for said material; (f) determining the expected measured value which would be obtained upon insertion of material of nominal thickness in the inspection field by computing the expected measured value from the operator-entered nominal thickness in conjunction with said first function and said second function; and (g) adjusting the source and/or detector in accordance with the determined expected measured value.

Claim 7

For use in conjunction with an apparatus for gaging the thickness of a material, said apparatus including a source of radiation, a detector spaced from the source of radiation, the space between the source and detector defining an inspection field which is adapted to receive the material, and means for generating measurement values as a function of the radiation attenuation caused by objects in the inspection field; an improved method for calibrating the source and/or the detector, comprising the steps of: (a) storing a first set of measurement values associated with standard pieces of known thickness temporarily positioned in the inspection field; (b) determining and storing a first function which represents the relationship between the thickness of the standard pieces and the measurement values determined therefrom; (c) storing a second set of measurement values associated with material samples of known thickness temporarily positioned in the inspection field; (d) determining and storing a second function which represents the relationship between the relative attenuation attributable to the standard pieces and the relative attenuation attributable to the material samples for different thicknesses thereof; (e) storing an operator-entered nominal thickness for said material; (f) determining the expected measured value which would be obtained upon insertion of material of nominal thickness in the inspection field by computing the expected measured value from the operator-entered nominal thickness in conjunction with said first function and said second function; and (g) adjusting the source and/or detector in accordance with the determined expected measured value.

Claim 8

The method as defined by claim 5 wherein the step (f) of dretermining the expected measured value includes the steps of determining an apparent thickness from said operator-entered nominal thickness and said second function; and determining the expected measured value from said apparent thickness and said first function.

Claim 9

Apparatus for gaging the thickness of a material, comprising: a source of radiation; detector means spaced from said source of radiation, the space between said source and said detector defining an inspection field and being adapted to receive the material; means for generating measurement values as a function of the radiation attenuation caused by objects in the inspection field; means for storing a first set of measurement values associated with standard pieces of known thickness temporarily positioned in the inspection field; means responsive to said first set of measurement values for determining and storing a first function which represents the relationship between the thickness of the standard pieces and the measurement values determined therefrom; means for storing a second set of measurement values associated with material samples of known thickness temporarily positioned in the inspection field; means responsive to said second set of measurement values for determining and storing a second function; means for storing an operator-entered nominal thickness for said material; means for determining the expected measured value which would be obtained upon insertion of material of nominal thickness in the inspection field by computing said expected measured value from the operator-entered nominal thickness in conjunction with said first function and said second function; means for adjusting said source and/or detector means in accordance with the determined expected measured value, whereby material of approximately nominal thickness can subsequently be gaged.

Claim 10

Apparatus for gaging the thickness of a material, comprising: a source of radiation; detector means spaced from said source of radiation, the space between said source and said detector defining an inspection field and being adapted to receive the material; means for generating measurement values as a function of the radiation attenuation caused by objects in the inspection field; means for storing a first set of measurement values associated with standard pieces of known thickness temporarily positioned in the inspection field; means responsive to said first set of measurement values for determining and storing a first function which represents the relationship between the thickness of the standard pieces and the measurement values determined therefrom; means for storing a second set of measurement values associated with material samples of known thickness temporarily positioned in the inspection field; means responsive to said second set of measurement values for determining and storing a second function; means for storing an operator-entered nominal thickness for said material; means for determining the expected measured value which would be obtained upon insertion of material of nominal thickness in the inspection field by computing said expected measured value from the operator-entered nominal thickness in conjunction with said first function and said second function; means for adjusting said source and/or detector means in accordance with the determined expected measured value, whereby material of approximately nominal thickness can subsequently be gaged.

Claim 11

Apparatus as defined by claim 7 wherein said second function represents the relationship between the relative attenuation attributable to said standard pieces and the relative attenuation attributable to said material samples for different thicknesses thereof.

Claim 12

Apparatus as defined by claim 8 wherein the means for determining the expected value includes means for determining an apparent thickness from said operator-entered nominal thickness and said second function; and means for determining the expected measured value from said apparent thickness and said first function.

Claim 13

Apparatus as defined by claim 9 wherein said first and second sets of measurement values are generated by adjusting source and/or detector supply level until a predetermined detector output is obtained and wherein subsequent measurements of material thickness are determined by deviations of the detector output after the source and/or detector supply has been adjusted in accordance with said expected measured value.

Claim 14

Apparatus as defined by claim 10 further comprising: means for storing an additional set of measurement values associated with the standard pieces, said additional set of measurement values being generated by inserting the standard pieces in the inspection field in conjunction with an additional percentage thickness for each standard piece and measuring the resultant detector output; means for determining an absorption coefficient from said first set of measurements and said additional set of measurements; and means for determining measurements of material thickness from said deviations of the detector output and said absorption coefficient.

Claim 15

Apparatus as defined by claim 11 wherein said means for determining an absorption coefficient is also responsive to said apparent thickness determined from said operator-entered nominal thickness.