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US4143268A Expired / Lapsed US ⏱️ 0.0 years remaining

Arrangement for measuring angles

Assignee: Jenoptik AG
•
Filing: 1977-12-12
•
Granted: 1979-03-06
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Expires: 1997-12-12
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Abstract

Abstract An arrangement for measuring angles, particularly for use in theodolites employs light electric detectors to carry out physical measurements. An index mark which is used in the measuring operation is arranged together with at least one reading position of a graduated circle in the object plane of an imaging system. The latter images the reading position of the graduated circle on to a first light electric detector and the index mark on to a second light electric detector. When two reading positions are used to obtain the reading value then the first reading position is imaged on to the second reading position which, together with the index mark, lies in the object plane of the imaging system. The common arrangement of the reading position and the index mark in the object plane of the imaging system eliminates any inaccuracies of the optical components and hence, accidental measuring errors. So it is possible to do without a very complicated light electrical evaluation system.

Inventors

  • 👤 Thomas Marold
  • 👤 Wieland Feist

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 13:17
CPC Classifications
G; G01; G01D; G01D5/00; G01D5/26; G01D5/32; G01D5/34; G01D5/347; G01D5/34707; G01D5/34715; G01C; G01C1/00; G01C1/02; G01C1/04

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 140 words
An optical arrangement for measuring angles, comprising a graduated circle with at least one reading position, a light source for illuminating said reading position, an optical imaging system, an index mark, said reading position and said index mark being arranged in the object plane of said imaging system, an optical micrometer including optical wedges, at least one of said wedges being adjustable, means for displacing the one wedge, and means for measuring the displacement of said one wedge, a first and a second light-electric detector being arranged in the image plane of said imaging system, the first light-electric detector scanning the image of said reading position, the second light-electric detector scanning the image of said index mark; said light source, said reading position, said index mark, said imaging system, said optical micrometer and the light-electric detectors being in optical alignment.
Claim 2
Dependent Claim 140 words
An optical arrangement for measuring angles, comprising a graduated circle with at least one reading position, a light source for illuminating said reading position, an optical imaging system, an index mark, said reading position and said index mark being arranged in the object plane of said imaging system, an optical micrometer including optical wedges, at least one of said wedges being adjustable, means for displacing the one wedge, and means for measuring the displacement of said one wedge, a first and a second light-electric detector being arranged in the image plane of said imaging system, the first light-electric detector scanning the image of said reading position, the second light-electric detector scanning the image of said index mark; said light source, said reading position, said index mark, said imaging system, said optical micrometer and the light-electric detectors being in optical alignment.
Claim 3
Dependent Claim 67 words
An optical arrangement as claimed in claim 1, wherein the graduated circle is provided with a first and a second reading position, the second reading position and the index mark being located in said object plane, and being further provided with a second imaging system arranged between said first reading position and said second reading position for imaging said first reading position onto said second reading position.
Claim 4
Dependent Claim 21 words
An optical arrangement as claimed in claim 1, wherein the index mark is a line mark on a partially silvered prism.

References Cited (Backward Citations)

US3458709A Cited
US3562772A Cited
US4064435A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-03-05 1982-09-04 1983-03-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-03-05 1986-09-04 1987-03-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-03-05 1990-09-04 1991-03-06 $7700.00 Window Closed / Lapsed

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