Automatic test probe positioning apparatus

Claim 2

A test probe system for use in automatic testing of printed circuit boards, said test probe system comprising in combination: a. a substantially flat slide surface; b. first and second threaded shafts extending over said slide surface, said first and second threaded shafts being substantially parallel to said slide surface, said first threaded shaft crossing over said second threaded shaft; c. first and second drive means for controllably axially rotating said first and second threaded shafts, respectively; d. support means for supporting said first and second drive means, said support means having first and second points located in fixed relationship to said slide surface; e. pivot means for pivotally connecting said first and second drive means to said support means at said first and second points, said first and second threaded shafts being pivotable laterally over said slide surface; f. first and second shaft receiving means for receiving said first and second shafts, respectively; g. connecting means for pivotally connecting said first and second shaft receiving means, a triangle substantially parallel to said slide surface being defined by said first and second points and a point at which said connecting means pivotally connects said first and second shaft receiving means, the angles and lengths of the sides of the triangle being variably dependent on the angular positions of said first and second threaded shafts with respect to first and second reference angular positions of said first and second threaded shafts, respectively; and h. probe support means carried by one of said first and second shaft receiving means for supporting a first conductive probe.

Claim 3

The test probe system of claim 1 further including slide support means supporting said first and second shaft receiving means, said slide support means having a low friction surface which slides across said slide surface as said first and second shaft supporting means are moved toward or away from said first and second points in response to rotation of said first and second threaded shafts, respectively.

Claim 4

The test probe system of claim 2 wherein said first and second shaft receiving means includes first and second nut blocks having threaded apertures through which said first and second threaded shafts extend, respectively.

Claim 5

The test probe system of claim 3 wherein said threads of said first and second nut blocks are complementary to the threads of said first and second threaded shafts, respectively.

Claim 6

The test probe system of claim 2 further including first probe raising means for raising said first probe support means in response to a first control signal.

Claim 7

The test probe system of claim 5 wherein said first and second drive means include first and second stepper motors having rotary shafts connected to ends of said first and second threaded shafts, respectively, said first and second stepper motors being responsive to first and second digital control signals, respectively, to turn said first and second threaded shafts either clockwise or counterclockwise, depending on the digital patterns comprised by said first and second digital control signals.

Claim 8

The test probe system of claim 6 further including first and second sensing means for sensing the angular displacements of said first and second threaded shafts, respectively.

Claim 9

The test probe system of claim 7 wherein one of said first and second sensing means includes a first optical coupler and a disc having a plurality of substantially equally angularly exposed light admitting openings therein for repetitively interrupting the light path of said first optical coupler.

Claim 10

The test probe system of claim 8 wherein each of said first and second sensing means further includes a sensing circuit responsive to said first optical coupler for producing a digital signal each time one of said light admitting openings allows the light path of said first optical coupler to be completed.

Claim 11

The test probe system of claim 9 wherein each of said first and second sensing means further includes reference establishing means for establishing reference angular positions with respect to which said angular displacements are measured.

Claim 12

The test probe system of claim 10 wherein said reference establishing means includes a light interrupting element attached to one of said first and second shaft receiving means and a second optical coupler attached in fixed relationship to one of said stepper motors for producing a signal indicating that the angular position of one of the threaded shafts is the reference angular position of that shaft when the light interrupting element interrupts the light path of said optical coupler as a result of said one of said shaft receiving means being moved toward said second optical coupler.

Claim 13

The test probe system of claim 11 wherein said first shaft receiving means includes: a. a horizontal rigid support plate; b. a threaded nut block through which said first shaft extends, the threads of said first shaft mating with the threads of said nut block; c. a first flexure centrally attached to said support plate and having opposed ends extending beyond the ends of said support plate; d. first and second insulating probe supports having upper end portions engaging said opposed ends of said flexure, respectively; e. a second flexure engaging lower ends of said first and second insulating probe supports, respectively; and f. first and second solenoids connected between said second flexure and said support plate adjacent said first and second insulating probe supports, respectively, said first and second solenoid lifting said insulating probe supports when said first and second solenoids, respectively, are actuated.

Claim 14

The test probe system of claim 12 wherein said second shaft means is constructed similarly to said first shaft receiving means, said test probe system further including means for sensing when the angle between said first and second shaft receiving means exceeds a predetermined angle.

Claim 15

The test probe system of claim 12 including a digital control system storing digital information representing coordinates corresponding to locations of a plurality of test points to be automatically probed by said test probe system.

Claim 16

The test probe system of claim 14 wherein said digital control system produces said first and second digital control signals for said first and second stepper motors, causing said first and second stepper motors to rotate said threaded shafts to move a test probe supported by one of said probe support means to a first location corresponding to one set of said coordinates, said digital control system stopping rotation of said threaded shafts when the signals received from said sensing circuits indicate that said first location has been reached by said test probe.

Claim 17

A test probe system for use in automatic testing of printed circuit boards, said test probe system comprising in combination: a. a substantially flat slide surface; b. first and second threaded shafts extending over said slide surface, said first and second threaded shafts being substantially parallel to said slide surface, said first threaded shaft crossing over said second threaded shaft; c. first and second shaft receiving means rigidly attached to said first and second shafts, respectively; d. first and second rotatable threaded shaft receiving means for mating with the threads of said first and second threaded shafts, respectively, to cause lateral movement of said first and second shafts and said first and second shaft receiving means with respect to said slide surface; e. first and second drive means for controllably rotating said first and second rotatable threaded shaft receiving means, respectively; f. support means for supporting said first and second drive means, said support means having first and second points located in fixed relationship to said slide surface; g. pivot means for pivotally connecting said first and second drive means to said support means at said first and second points, said first and second threaded shafts being pivotable laterally over said slide surface; h. connecting means for pivotally connecting said first and second shaft receiving means, a triangle substantially parallel to said slide surface being defined by said first and second points and a point at which said connection means pivotally connects said first and second shaft receiving means, the angles and lengths of the sides of the triangle being variably dependent on the angular positions of said first and second threaded shafts with respect to first and second reference angular positions of said first and second threaded shafts, respectively; and i. probe support means carried by one of said first and second shaft receiving means for supporting a first conductive probe.

Claim 18

A test probe system for use in automatic testing of printed circuit boards, said test probe system comprising in combination: a. a substantially flat slide surface; b. first and second threaded shafts extending over said slide surface, said first and second threaded shafts being substantially parallel to said slide surface, said first threaded shaft crossing over said second threaded shaft; c. first and second shaft receiving means rigidly attached to said first and second shafts, respectively; d. first and second rotatable threaded shaft receiving means for mating with the threads of said first and second threaded shafts, respectively, to cause lateral movement of said first and second shafts and said first and second shaft receiving means with respect to said slide surface; e. first and second drive means for controllably rotating said first and second rotatable threaded shaft receiving means, respectively; f. support means for supporting said first and second drive means, said support means having first and second points located in fixed relationship to said slide surface; g. pivot means for pivotally connecting said first and second drive means to said support means at said first and second points, said first and second threaded shafts being pivotable laterally over said slide surface; h. connecting means for pivotally connecting said first and second shaft receiving means, a triangle substantially parallel to said slide surface being defined by said first and second points and a point at which said connection means pivotally connects said first and second shaft receiving means, the angles and lengths of the sides of the triangle being variably dependent on the angular positions of said first and second threaded shafts with respect to first and second reference angular positions of said first and second threaded shafts, respectively; and i. probe support means carried by one of said first and second shaft receiving means for supporting a first conductive probe.

Claim 19

The test probe system of claim 16 further including slide support means supporting said first and second shaft receiving means, said slide support means having a low friction surface which slides across said slide surface as said first and second shaft supporting means are moved toward or away from said first and second points in response to rotation of said first and second threaded shafts, respectively.

Claim 20

The test probe system of claim 17 further including first probe raising means for raising said first probe support means in response to a first control signal.

Claim 21

The test probe system of claim 18 wherein said first and second drive means include first and second stepper motors having rotary shafts which rotate said first and second rotatable threaded shaft receiving means, respectively, said first and second stepper motors being responsive to first and second digital control signals, respectively, to turn said first and second threaded shaft receiving means either clockwise or counterclockwise, depending on the digital patterns comprised by said first and second digital control signals.