US4331872A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for measurement of distribution of inclusions in a slab by electron beam irradiation
Assignee: Seiko Instruments Inc
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Filing: 1980-06-17
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Granted: 1982-05-25
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Expires: 2000-06-17
Abstract
Abstract In a method for the measurement of the distribution of the inclusions in a slab by electron beam irradiation, an electron beam of relatively large diameter is irradiated onto a relatively large specimen of the slab and a spectrum analysis of the characteristic X-rays is effected by using planar analyzing crystals, in order to obtain the data of the two-dimensional distribution of the elements of the inclusions in the surface of the specimen.
Inventors
- 👤 Hiromu Soga
- 👤 Koichi Kitamura
- 👤 Tomio Sasaki
- 👤 Mitsuyoshi Sato
- 👤 Hiroshi Ishijima
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 09:54
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/225; G01N23/2251; G01N23/2252
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
144 words
A method for the measurement of the distribution of the inclusion in a slab by detecting the characteristic X-rays emitted by the elements of the inclusions due to the irradiation of an electron beam, characterized in that said method comprises the steps of: irradiating an electron beam having a cross-section with a diameter between 0.1 mm and 10 mm onto a specimen of a slab on a table in an evacuated chamber; effecting a spectrum analysis of the X-rays emitted from the surface of the specimen due to the irradiation of the electron beam by using flat surface analyzing crystals; moving the table relative to the electron beam for two-dimensionally varying the position of the electron beam irradiation on the surface of the specimen, and; obtaining the data of the two-dimensional distribution of the elements of the inclusions in the surface of the specimen.
Claim 2
Independent Claim
144 words
A method for the measurement of the distribution of the inclusion in a slab by detecting the characteristic X-rays emitted by the elements of the inclusions due to the irradiation of an electron beam, characterized in that said method comprises the steps of: irradiating an electron beam having a cross-section with a diameter between 0.1 mm and 10 mm onto a specimen of a slab on a table in an evacuated chamber; effecting a spectrum analysis of the X-rays emitted from the surface of the specimen due to the irradiation of the electron beam by using flat surface analyzing crystals; moving the table relative to the electron beam for two-dimensionally varying the position of the electron beam irradiation on the surface of the specimen, and; obtaining the data of the two-dimensional distribution of the elements of the inclusions in the surface of the specimen.
Claim 3
Dependent Claim
17 words
A method as defined in claim 1, wherein said specimen of a slab has a rough surface.
Claim 4
Independent Claim
156 words
A method for the measurement of the distribution of the inclusions in a slab including cracks on the surface thereof by detecting the characteristic X-rays omitted by the elements of the inclusions due to the irradiation of an electron beam, characterized in that said method comprises the steps of: irradiating an electron beam having a cross-section with a diameter between 0.1 mm and 10 mm onto a specimen of a slab, having rough surface, on a table in an evacuated chamber; effecting a spectrum analysis of the X-rays emitted from the surface of the specimen due to the irradiation of the electron beam by using flat surface analyzing crystals; moving the table relative to the electron beam for two-dimensionally varying the position of the electron beam irradiation on the surface of the specimen, and; obtaining the data of the two-dimensional distribution of the elements of the inclusions and the cracks in the surface of the specimen.
Claim 5
Independent Claim
156 words
A method for the measurement of the distribution of the inclusions in a slab including cracks on the surface thereof by detecting the characteristic X-rays omitted by the elements of the inclusions due to the irradiation of an electron beam, characterized in that said method comprises the steps of: irradiating an electron beam having a cross-section with a diameter between 0.1 mm and 10 mm onto a specimen of a slab, having rough surface, on a table in an evacuated chamber; effecting a spectrum analysis of the X-rays emitted from the surface of the specimen due to the irradiation of the electron beam by using flat surface analyzing crystals; moving the table relative to the electron beam for two-dimensionally varying the position of the electron beam irradiation on the surface of the specimen, and; obtaining the data of the two-dimensional distribution of the elements of the inclusions and the cracks in the surface of the specimen.
Claim 6
Dependent Claim
49 words
A method as defined in claim 1, 2 or 3, wherein a specimen of such a large scale as 2 m in length and 30 cm in width is used, said length and width being the same as the length and width of a slab produced by continuous casting.
Claim 7
Dependent Claim
28 words
A method as defined in claim 3, wherein the detection of the cracks is effected by the detection of the characteristic X-ray emitted from the element of iron.
Claim 8
Dependent Claim
31 words
A method as defined in claim 3, wherein the detection of the cracks is effected by the reflection or the absorption of the portion of the electrons irradiated onto the specimen.
Claim 9
Dependent Claim
62 words
A method as defined in claim 3, wherein said method further comprises the steps of: simultaneously with said irradiation of the electron beam onto a specimen, irradiating a light beam onto a specimen; detecting the light reflected at the surface of the specimen, and; producing a signal corresponding to the cracks, whereby data of the two-dimensional distribution of the cracks is obtained.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-05-24 | 1985-11-23 | 1986-05-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-05-24 | 1989-11-23 | 1990-05-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-05-24 | 1993-11-23 | 1994-05-25 | $7700.00 | Window Closed / Lapsed |