Ultrasonic bond testing of semiconductor devices

Claim 1

The method of testing an assembled semiconductor device for unbonded areas in the bond between a metal layer on a semiconductor wafer and a structured copper heat sink member which has substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device with pulses of ultrasound which are incident on one surface thereof and are transmitted along said copper strands and highly attenuated in the lateral direction, and pass through said bond and metal layer and said semiconductor wafer without significant lateral spreading; detecting the ultrasound pulses that are transmitted to the other surface of said assembled device and producing received electrical signals; and processing and displaying said received signals such that a high amplitude signal designates a good bond and a low amplitude or no signal designates voids and unbonded areas in the bond of said structured copper member to the semiconductor wafer metal layer.

Claim 2

The method of testing an assembled semiconductor device for unbonded areas in the bond between a metal layer on a semiconductor wafer and a structured copper heat sink member which has substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device with pulses of ultrasound which are incident on one surface thereof and are transmitted along said copper strands and highly attenuated in the lateral direction, and pass through said bond and metal layer and said semiconductor wafer without significant lateral spreading; detecting the ultrasound pulses that are transmitted to the other surface of said assembled device and producing received electrical signals; and processing and displaying said received signals such that a high amplitude signal designates a good bond and a low amplitude or no signal designates voids and unbonded areas in the bond of said structured copper member to the semiconductor wafer metal layer.

Claim 6

The method of testing an assembled semiconductor device for voids and unbonded areas in the bonds above and below metal layers on a semiconductor wafer to structured copper heat sink members which have substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device in a water bath with pulses of ultrasound which are focused to a small spot at the end of a bundle of copper strands of one structured copper member and are transmitted along said copper strands and highly attenuated in the lateral direction, and pass through said bonds and metal layers and said semiconductor wafer without significant lateral spreading: detecting the ultrasound pulses that are transmitted through said assembled device and generating received electrical signals; and producing a bond interface image in which high amplitude received signals designate a good bond and low amplitude or no received signals designate a defective bond.

Claim 7

The method of testing an assembled semiconductor device for voids and unbonded areas in the bonds above and below metal layers on a semiconductor wafer to structured copper heat sink members which have substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device in a water bath with pulses of ultrasound which are focused to a small spot at the end of a bundle of copper strands of one structured copper member and are transmitted along said copper strands and highly attenuated in the lateral direction, and pass through said bonds and metal layers and said semiconductor wafer without significant lateral spreading: detecting the ultrasound pulses that are transmitted through said assembled device and generating received electrical signals; and producing a bond interface image in which high amplitude received signals designate a good bond and low amplitude or no received signals designate a defective bond.

Claim 12

The method of testing an assembled semiconductor device for voids and unbonds in the bond of a metal layer on a semiconductor wafer to a structured copper heat sink member which has substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device relative to a doubly focused acoustic system having focused transmitting and receiving transducers on a common axis; exciting said transmitting transducer to generate pulses of ultrasound that are focused to a small spot approximately at one surface of said assembled device and are transmitted along said strands of copper and highly attenuated in the lateral direction, and pass through said bond and metal layer and said semiconductor layer without significant lateral spreading; the transmitted ultrasound pulses being focused onto said receiving transducer which produces received electrical signals; and processing and mapping said received signals to produce a bond interface image in which high amplitude received signals designate a good bond and low amplitude or no received signals designate voids and unbonds.

Claim 13

The method of testing an assembled semiconductor device for voids and unbonds in the bond of a metal layer on a semiconductor wafer to a structured copper heat sink member which has substantially parallel closely packed strands of copper, comprising the steps of: scanning said assembled device relative to a doubly focused acoustic system having focused transmitting and receiving transducers on a common axis; exciting said transmitting transducer to generate pulses of ultrasound that are focused to a small spot approximately at one surface of said assembled device and are transmitted along said strands of copper and highly attenuated in the lateral direction, and pass through said bond and metal layer and said semiconductor layer without significant lateral spreading; the transmitted ultrasound pulses being focused onto said receiving transducer which produces received electrical signals; and processing and mapping said received signals to produce a bond interface image in which high amplitude received signals designate a good bond and low amplitude or no received signals designate voids and unbonds.