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US4375056A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin film resistance thermometer device with a predetermined temperature coefficent of resistance and its method of manufacture

Assignee: Leeds and Northrup Co
•
Filing: 1980-02-29
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Granted: 1983-02-22
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Expires: 2000-02-29
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Abstract

Abstract A thin film resistance thermometer is manufactured to have a predetermined temperature coefficient of resistance while minimizing the amount of metal in the film. The process involves the production of a metal film deposit on an insulating substrate such that the film deposited has a bulk coefficient substantially higher than the desired coefficient with the film being deposited to a thickness that produces the desired coefficient.

Inventors

  • 👤 Ronald D. Baxter
  • 👤 Paul J. Freud

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 12:46
CPC Classifications
H; H01; H01C; H01C7/00; H01C7/02; H01C7/021; G; G01; G01K; G01K7/00; G01K7/16; G01K7/18; G01K7/183; H01C17/00; H01C17/22; H01C17/232

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 54 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film being of a thickness between 0.05 and 0.8 microns purity and perfection such that its bulk TCR is substantially above the desired TCR.
Claim 2
Dependent Claim 54 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film being of a thickness between 0.05 and 0.8 microns purity and perfection such that its bulk TCR is substantially above the desired TCR.
Claim 3
Dependent Claim 62 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness as required to produce a desired TCR and in a range such that the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 4
Dependent Claim 62 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness as required to produce a desired TCR and in a range such that the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 5
Dependent Claim 69 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with a film thickness between 0.05 and 0.8 microns as required to produce a desired TCR and maintain the thickness in a range where the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 6
Dependent Claim 69 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with a film thickness between 0.05 and 0.8 microns as required to produce a desired TCR and maintain the thickness in a range where the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 7
Dependent Claim 65 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin electrically conductive metal film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness being that required to produce a desired TCR and in a range such that the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 8
Dependent Claim 65 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin electrically conductive metal film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness being that required to produce a desired TCR and in a range such that the ratio of relative change of TCR to relative change in film thickness is greater than 0.01.
Claim 9
Dependent Claim 81 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness between 0.05 and 0.8 microns as required to produce a desired TCR, and be below the thickness at which the metal has its bulk value and substantially above the thickness at which nucleation effects predominate in determining those characteristics of the film relating to its conductivity and its TCR.
Claim 10
Dependent Claim 81 words
A resistance thermometer element comprising: an electrically insulating substrate; and a thin platinum film deposited on said substrate in a pattern to produce a desired ice point resistance with the film thickness between 0.05 and 0.8 microns as required to produce a desired TCR, and be below the thickness at which the metal has its bulk value and substantially above the thickness at which nucleation effects predominate in determining those characteristics of the film relating to its conductivity and its TCR.

References Cited (Backward Citations)

US3781749A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-02-21 1986-08-23 1987-02-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-02-21 1990-08-23 1991-02-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-02-21 1994-08-23 1995-02-22 $7700.00 Window Closed / Lapsed

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