US4387301A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Target for calibrating and testing infrared detection devices
Assignee: Raytheon Co
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Filing: 1981-04-20
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Granted: 1983-06-07
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Expires: 2001-04-20
Abstract
Abstract Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02° C. and below can be generated for calibrating and testing IR imaging devices.
Inventors
- 👤 Michael P. Wirick
- 👤 James P. Wright
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 14:01
CPC Classifications
G; G01; G01J; G01J5/00; G01J5/52; G01J5/53; F; F41; F41J; F41J2/00; F41J2/02; H; H04; H04N; H04N23/00; H04N23/20; H04N23/23
Claims Analysis
Total Claims: 26
Claim 1
Independent Claim
81 words
Apparatus for calibrating and testing IR detection devices comprising (a) a substrate having a front surface and a back surface; (b) a target pattern comprising dielectric material formed on at least one region of said front surface of said substrate, said dielectric material being at least partially absorbing to infrared radiation; and (c) means for providing heat to said back surface of said substrate sufficient to provide at least one apparent differential temperature contrast between said target pattern and said substrate.
Claim 2
Dependent Claim
81 words
Apparatus for calibrating and testing IR detection devices comprising (a) a substrate having a front surface and a back surface; (b) a target pattern comprising dielectric material formed on at least one region of said front surface of said substrate, said dielectric material being at least partially absorbing to infrared radiation; and (c) means for providing heat to said back surface of said substrate sufficient to provide at least one apparent differential temperature contrast between said target pattern and said substrate.
Claim 3
Dependent Claim
25 words
The apparatus of claim 1 in which said substrate is of sufficient conductivity and thin enough to pass heat from said back to said front.
Claim 4
Dependent Claim
23 words
The apparatus of claim 2 in which said substrate comprises a material selected from the group consisting of aluminum, copper, silver and nickel.
Claim 5
Dependent Claim
11 words
The apparatus of claim 3 in which said substrate comprises aluminum.
Claim 6
Dependent Claim
23 words
The apparatus of claim 2 in which said substrate includes a metallic coating at least about 50 A thick on its front surface.
Claim 7
Dependent Claim
24 words
The apparatus of claim 5 in which said metallic coating comprises a material selected from the group consisting of nickel, gold, aluminum and silver.
Claim 8
Dependent Claim
12 words
The apparatus of claim 6 in which said metallic coating comprises nickel.
Claim 9
Dependent Claim
33 words
The apparatus of claim 1 in which said dielectric material consists essentially of at least one material selected from the group consisting of silica, titania, polyethylene, neutral density glass, alumina and zinc selenide.
Claim 10
Dependent Claim
16 words
The apparatus of claim 8 in which said dielectric material consists essentially of silica or titania.
Claim 11
Dependent Claim
20 words
The apparatus of claim 1 in which said dielectric material ranges in thickness from about 100 A to 0.005 inch.
Claim 12
Dependent Claim
19 words
The apparatus of claim 10 in which said dielectric material ranges in thickness from about 100 to 20,000 A.
Claim 13
Dependent Claim
21 words
The apparatus of claim 1 in which said heating means comprises a heater and means for supplying power to said heater.
Claim 14
Independent Claim
141 words
A method for calibrating and testing IR detection devices for viewing a scene comprising (a) providing an apparatus for calibrating and testing IR detection devices, said device comprising (1) a substrate having a front surface and a back surface, (2) a target pattern comprising dielectric material formed on at least one region of said front surface of said substrate, said dielectric material being at least partially absorbing to infrared radiation; and (3) means for providing heat to said back surface of said substrate sufficient to provide at least one apparent differential temperature contrast between said target pattern and said substrate; (b) applying heat to said target pattern; (c) sensing at least one differential temperature contrast between said target pattern and said substrate; and (d) comparing said at least one differential temperature contrast to a visual or electronic depiction of said scene.
Claim 15
Independent Claim
141 words
A method for calibrating and testing IR detection devices for viewing a scene comprising (a) providing an apparatus for calibrating and testing IR detection devices, said device comprising (1) a substrate having a front surface and a back surface, (2) a target pattern comprising dielectric material formed on at least one region of said front surface of said substrate, said dielectric material being at least partially absorbing to infrared radiation; and (3) means for providing heat to said back surface of said substrate sufficient to provide at least one apparent differential temperature contrast between said target pattern and said substrate; (b) applying heat to said target pattern; (c) sensing at least one differential temperature contrast between said target pattern and said substrate; and (d) comparing said at least one differential temperature contrast to a visual or electronic depiction of said scene.
Claim 16
Dependent Claim
25 words
The method of claim 13 in which said substrate is of sufficient conductivity and thin enough to pass heat from said back to said front.
Claim 17
Dependent Claim
23 words
The method of claim 14 in which said substrate comprises a material selected from the group consisting of aluminum, copper, silver and nickel.
Claim 18
Dependent Claim
11 words
The method of claim 15 in which said substrate comprises aluminum.
Claim 19
Dependent Claim
23 words
The method of claim 14 in which said substrate includes a metallic coating at least about 50 A thick on its front surface.
Claim 20
Dependent Claim
24 words
The method of claim 17 in which said metallic coating comprises a material selected from the group consisting of nickel, gold, aluminum and silver.
Claim 21
Dependent Claim
12 words
The method of claim 18 in which said metallic coating comprises nickel.
Claim 22
Dependent Claim
33 words
The method of claim 13 in which said dielectric material consists essentially of at least one material selected from the group consisting of silica, titania, polyethylene, neutral density glass, alumina and zinc selenide.
Claim 23
Dependent Claim
16 words
The method of claim 20 in which said dielectric material consists essentially of silica or titania.
Claim 24
Dependent Claim
20 words
The method of claim 13 in which said dielectric material ranges in thickness from about 100 A to 0.005 inch.
Claim 25
Dependent Claim
19 words
The method of claim 22 in which said dielectric material ranges in thickness from about 100 to 20,000 A.
Claim 26
Dependent Claim
21 words
The method of claim 13 in which said heating means comprises a heater and means for supplying power to said heater.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-06-06 | 1986-12-06 | 1987-06-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-06-06 | 1990-12-06 | 1991-06-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-06-06 | 1994-12-06 | 1995-06-07 | $7700.00 | Window Closed / Lapsed |