US4569697A
Expired / Lapsed
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Method of forming photovoltaic quality amorphous alloys by passivating defect states
Assignee: United Solar Systems Corp
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Filing: 1983-08-26
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Granted: 1986-02-11
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Expires: 2003-08-26
Abstract
Abstract Relatively dense, photovoltaic quality amorphous alloys which are characterized by reduced density of defect states in the band gaps thereof and which are particularly suited for use in tandem photovoltaic devices are formed by evaporating amorphous germanium and amorphous silicon in an ultrahigh vacuum environment, diffusing a density of states reducing element into and through the amorphous material, and finally annealing the resultant amorphous alloy to complete the diffusion process. The amorphous alloy, so formed, is a substantially contaminant-free, substantially tetrahedrally coordinated material. Fluorine is the preferred density of states reducing element which is added to the amorphous material for reducing the density of states through compensation, and for orbital promotion and expansion.
Inventors
- 👤 Raphael Tsu
- 👤 Stanford R. Ovshinsky
- 👤 Jesus Hernandez
- 👤 Denis Martin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 18:53
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/128; H10F71/10; H10F71/103; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50
Claims Analysis
Total Claims: 34
Claim 1
Independent Claim
243 words
A method of fabricating amorphous semiconductor alloys which are characterized by a low density of defect states in the band gaps thereof, said method including the steps of: forming unadulterated amorphous semiconductor material at a temperature of less than about 180° C. so that the amorphous semiconductor material is deposited in relatively porous form which is adapted to facilitate the chemical combination thereof with any available reactant; maintaining said unadulterated relatively porous amorphous semiconductor material in an ultrahigh vacuum environment of less than 10 -8 torr so that said environment is substantially free of all elemental reactants and other contaminants capable of competing for use of the valence electrons of said amorphous semiconductor material; introducing at a pressure of about several m torr at least one density of states reducing element into the ultrahigh vacuum environment such that the at least one density of states reducing element is the only material present for chemical combination with the available valence electrons of the reactive amorphous semiconductor material; and difussing the at least one density of states reducing element substantially throughout the bulk of the reactive amorphous semiconductor material for passivating the defect states in the band gap of the amorphous semiconductor material to form an amorphous semiconductor alloy; and annealing the amorphous semiconductor alloy to complete diffusion of the at least one density of states reducing element, whereby a dense photovoltaic quality amorphous semiconductor alloy having a low density of defect states is fabricated.
Claim 2
Independent Claim
243 words
A method of fabricating amorphous semiconductor alloys which are characterized by a low density of defect states in the band gaps thereof, said method including the steps of: forming unadulterated amorphous semiconductor material at a temperature of less than about 180° C. so that the amorphous semiconductor material is deposited in relatively porous form which is adapted to facilitate the chemical combination thereof with any available reactant; maintaining said unadulterated relatively porous amorphous semiconductor material in an ultrahigh vacuum environment of less than 10 -8 torr so that said environment is substantially free of all elemental reactants and other contaminants capable of competing for use of the valence electrons of said amorphous semiconductor material; introducing at a pressure of about several m torr at least one density of states reducing element into the ultrahigh vacuum environment such that the at least one density of states reducing element is the only material present for chemical combination with the available valence electrons of the reactive amorphous semiconductor material; and difussing the at least one density of states reducing element substantially throughout the bulk of the reactive amorphous semiconductor material for passivating the defect states in the band gap of the amorphous semiconductor material to form an amorphous semiconductor alloy; and annealing the amorphous semiconductor alloy to complete diffusion of the at least one density of states reducing element, whereby a dense photovoltaic quality amorphous semiconductor alloy having a low density of defect states is fabricated.
Claim 3
Dependent Claim
38 words
A method as in claim 1, including the further step of selecting the amorphous semiconductor material from a group of precursor materials consisting essentially of: silicon, silicon and a dopant, germanium, germanium and a dopant, and combinations thereof.
Claim 4
Dependent Claim
34 words
A method as in claim 2, including the further step of selecting the at least one density of states reducing element from the group consisting essentially of: fluorine, hydrogen, oxygen, chlorine, and combinations thereof.
Claim 5
Dependent Claim
26 words
A method as in claim 3, wherein silicon is selected as the amorphous semiconductor material and fluorine is selected as the density of states reducing element.
Claim 6
Dependent Claim
15 words
A method as in claim 4, wherein the fluorine is introduced in an activated state.
Claim 7
Dependent Claim
28 words
A method as in claim 5, including the further step of exciting the amorphous silicon as the activated fluorine bonds with the valence electrons of the amorphous silicon.
Claim 8
Dependent Claim
26 words
A method as in claim 3, wherein silicon is selected as the amorphous semiconductor material and hydrogen is selected as the density of states reducing element.
Claim 9
Dependent Claim
15 words
A method as in claim 7, wherein the hydrogen is introduced in an activated state.
Claim 10
Dependent Claim
28 words
A method as in claim 8, including the further step of exciting the amorphous silicon as the activated hydrogen bonds with the valence electrons of the amorphous silicon.
Claim 11
Dependent Claim
28 words
A method as in claim 3, wherein silicon is selected as the amorphous semiconductor material and fluorine and hydrogen are selected as the density of states reducing elements.
Claim 12
Dependent Claim
16 words
A method as in claim 10, wherein the fluorine and hydrogen are introduced in activated states.
Claim 13
Dependent Claim
30 words
A method as in claim 11, including the further step of exciting the amorphous silicon as the activated fluorine and hydrogen bond with the valence electrons of the amorphous silicon.
Claim 14
Dependent Claim
26 words
A method as in claim 3, wherein germanium is selected as the amorphous semiconductor material and fluorine is selected as the density of states reducing element.
Claim 15
Dependent Claim
15 words
A method as in claim 13, wherein the fluorine is introduced in an activated state.
Claim 16
Dependent Claim
28 words
A method as in claim 14, including the further step of exciting the amorphous germanium as the activated fluorine bonds with the valence electrons of the amorphous germanium.
Claim 17
Dependent Claim
26 words
A method as in claim 3, wherein germanium is selected as the amorphous semiconductor material and hydrogen is selected as the density of states reducing element.
Claim 18
Dependent Claim
15 words
A method as in claim 16, wherein the hydrogen is introduced in an activated state.
Claim 19
Dependent Claim
28 words
A method as in claim 17, including the further step of exciting the amorphous germanium as the activated fluorine bonds with the valence electrons of the amorphous germanium.
Claim 20
Dependent Claim
28 words
A method as in claim 3, wherein germanium is selected as the amorphous semiconductor material and fluorine and hydrogen are selected as the density of states reducing elements.
Claim 21
Dependent Claim
16 words
A method as in claim 19, wherein the fluorine and hydrogen are introduced in activated states.
Claim 22
Dependent Claim
30 words
A method as in claim 20, including the further step of exciting the amorphous germanium as the activated fluorine and hydrogen bond with the valence electrons of the amorphous germanium.
Claim 23
Dependent Claim
25 words
A method as in claim 3, wherein the amorphous semiconductor material is formed by evaporating crystals of the semiconductor material in the ultrahigh vacuum environment.
Claim 24
Dependent Claim
22 words
A method as in claim 22, including the further step of activating the density of states reducing element as it is introduced.
Claim 25
Dependent Claim
29 words
A method as in claim 23, including the further step of activating the amorphous semiconductor material before the valence electrons thereof combine with the density of states reducing element.
Claim 26
Dependent Claim
39 words
A method as in claim 24, including the further step of introducing a strain-relieving element after bonding of the density of states reducing element and the amorphous semiconductor material so as to relax bonding stresses in the resultant alloy.
Claim 27
Dependent Claim
41 words
A method as in claim 3, including the further step of introducing a strain relieving element after the bonding of the density of states reducing element and the amorphous semiconductor material so as to relax bonding stresses in the resultant alloy.
Claim 28
Dependent Claim
32 words
A method as in claim 3, including the further step of utilizing the amorphous semiconductor alloy as at least a portion of a multi-layer alloy of successively deposited layers of opposite conductivities.
Claim 29
Dependent Claim
26 words
A method as in claim 27, including the further step of providing an intrinsic layer containing said amorphous semiconductor alloy between the layers of opposite conductivities.
Claim 30
Dependent Claim
36 words
A method as in claim 28, including the further steps of; utilizing at least one doping material to form the layers of opposite conductivities; and introducing the at least one doping element in substantially discrete layers.
Claim 31
Dependent Claim
45 words
A method as in claim 3, wherein the step of introducing the at least one density of states reducing element includes the further step of combining the amorphous semiconductor material and the at least one density of states reducing element in a tetrahedral bonding configuration.
Claim 32
Dependent Claim
37 words
A method as in claim 30, wherein the energy of the free pairs of valence electrons of the amorphous semiconductor material is elevated to provide for deposition of the amorphous semiconductor alloy in said tetrahedral bonding configuration.
Claim 33
Dependent Claim
16 words
A method as in claim 1, wherein the formation temperature is maintained at approximately -25° C.
Claim 34
Dependent Claim
24 words
A method as in claim 1, including the further step of implanting ions into the annealed amorphous semiconductor alloy to additionally reduce defect states.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-02-10 | 1989-08-12 | 1990-02-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-02-10 | 1993-08-12 | 1994-02-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-02-10 | 1997-08-12 | 1998-02-11 | $7700.00 | Window Closed / Lapsed |