High voltage solid-state switch

Claim 2

A switching element comprising a semiconductor body whose bulk is of one conductivity type and relatively high resistivity and which includes anode, gate, and cathode regions spaced apart and localized along a common planar surface of the body, each being of relatively low resistivity, a shield region being of higher resistivity than the anode region and surrounding the cathode region so as to separate it from the bulk portion of the semiconductor body, the cathode and gate regions being of the same conductivity type as the bulk and the anode and shield regions being of the opposite conductivity type as the bulk, and separate cathode, anode, and gate electrode, the gate region being located essentially directly between the anode and shield regions, the parameters of the various portions of the switching element being such that with the potential of the anode region being forward biased with respect to the cathode region and the potential of the gate region being insufficient to essentially completely deplete a cross-sectional portion of the bulk of the semiconductor body between the anode and cathode regions there is facilitated a substantial current flow between the anode and cathode regions via the bulk, and with the anode region being forward biased with respect to the cathode region and the potential of the gate region being of sufficiently greater magnitude than that of the anode region to essentially completely deplete a cross-sectional portion of the bulk of the semiconductor body between the anode and cathode regions and to cause this portion of the bulk of the semiconductor body to be at a potential which is greater in magnitude than exists at the anode, cathode and shield regions, there is facilitated an inhibiting or interrupting (cutting off) of current flow between the anode and cathode regions.

Claim 3

A plurality of switching elements in accordance with claim 1 with each included in a common semiconductor support member and dielectrically isolated from one another.

Claim 4

A pair of switching elements each in accordance with claim 1 or claim 2 with the gate electrodes of the pair connected to one another and the anode electrode of each connected to the cathode electrode of the other to provide a bilateral switch.

Claim 5

A switching element comprising a semiconductor body whose bulk is of one conductivity type and relatively high resistivity and which includes anode, gate, and cathode regions spaced apart and localized along a common planar surface of the body, each being of relatively low resistivity, a shield region being of intermediate resistivity between the anode region and the bulk portion of the semiconductor body and surrounding the cathode region so as to separate it from the bulk portion of the semiconductor body, the cathode and gate regions being of the same conductivity type as the bulk and the anode and shield regions, being of the opposite conductivity type as the bulk, and separate cathode, anode, and gate electrodes, the gate region being located essentially directly between the first and fourth regions, the semiconductor body being separated from a semiconductor support member by a dielectric layer, the semiconductor support member having a separate electrode coupled thereto which is adapted to be held at the most positive potential used with the switching element if the gate region is of n type conductivity, and at the most negative potential used with the switching element if the gate region is of p type conductivity, the parameters of the various portions of the structure being such that with the potential of the anode region being forward biased with respect to the cathode region and the potential of the gate region being insufficient to deplete a cross-sectional portion of the bulk of the semiconductor body between the anode and cathode regions there is facilitated a substantial current flow between the anode and cathode regions via the bulk, and with the potential of the anode region being forward biasad with respect to the cathode region and the potential of the gate region being of a sufficient magnitu1e relative to the anode region to deplete the portion of the bulk of the semiconductor body between the anode and cathode regions and to cause this portion of the bulk of the semiconductor body to be at a potential which is greater in magnitude than exists at the anode, cathode and shield regions, there is facilitated an inhibiting or interrupting (cutting off) of current flow between the anode and cathode regions.

Claim 6

A switching element comprising a semiconductor body whose bulk is of one conductivity type and relatively high resistivity and which includes anode, gate, and cathode regions spaced apart and localized along a common planar surface of the body, each being of relatively low resistivity, a shield region being of intermediate resistivity between the anode region and the bulk portion of the semiconductor body and surrounding the cathode region so as to separate it from the bulk portion of the semiconductor body, the cathode and gate regions being of the same conductivity type as the bulk and the anode and shield regions, being of the opposite conductivity type as the bulk, and separate cathode, anode, and gate electrodes, the gate region being located essentially directly between the first and fourth regions, the semiconductor body being separated from a semiconductor support member by a dielectric layer, the semiconductor support member having a separate electrode coupled thereto which is adapted to be held at the most positive potential used with the switching element if the gate region is of n type conductivity, and at the most negative potential used with the switching element if the gate region is of p type conductivity, the parameters of the various portions of the structure being such that with the potential of the anode region being forward biased with respect to the cathode region and the potential of the gate region being insufficient to deplete a cross-sectional portion of the bulk of the semiconductor body between the anode and cathode regions there is facilitated a substantial current flow between the anode and cathode regions via the bulk, and with the potential of the anode region being forward biasad with respect to the cathode region and the potential of the gate region being of a sufficient magnitu1e relative to the anode region to deplete the portion of the bulk of the semiconductor body between the anode and cathode regions and to cause this portion of the bulk of the semiconductor body to be at a potential which is greater in magnitude than exists at the anode, cathode and shield regions, there is facilitated an inhibiting or interrupting (cutting off) of current flow between the anode and cathode regions.