Invalidation arrangement for information stored in a memory during a certain period of time and radar comprising such an arrangement

Claim 1

In an apparatus for sequentially storing digital information including invalid information received during cyclically-occurring periods of predetermined duration, said apparatus including an addressable main memory, a read/write control circuit coupled to the main memory for alternately producing read and write control signals, a main memory input for sequentially applying digital information to the main memory, a write addressing circuit coupled to the main memory for sequentially specifying addresses into which the digital information sequentially applied to the input is to be stored during the occurrence of respective ones of the write control signals, a main memory output for sequentially receiving digital information from the main memory, and a read addressing circuit coupled to the main memory for sequentially specifying addresses from which the stored digital information is to be sequentially read during the occurrence of respective ones of the read control signals, the improvement comprising an invalidation arrangement including: (a) an invalidation rate generator means for producing signals simultaneously with said cyclically-occurring periods of predetermined duration; (b) first and second invalidation memories, each having storage addresses corresponding to those in the main memory, and each coupled to the read and write addressing circuits; (c) a write circuit coupled to respective inputs of the first and second invalidation memories and to the read/write control circuit, for alternately selecting the first and second invalidation memories during successive ones of the signals produced by the invalidation rate generator, and for effecting writing of a predefined updating value into addresses of the selected invalidation memory simultaneously with the writing of digital information into corresponding addresses of the main memory; (d) an erase circuit coupled to the read addressing circuit, to the invalidation rate generator and to the write circuit for writing a predefined erase value into all of the addresses of the non-selected invalidation memory during each of said cyclically-occurring periods; (e) an invalidation circuit coupled to the main memory output; and (f) an erase value coincidence circuit coupled to respective outputs of the first and second invalidation memories and to the invalidation circuit for effecting invalidation of information read from main memory addresses corresponding to respective addresses in the first and second invalidation memories from which said coincidence circuit simultaneously receives said erase value.