US4648939A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Formation of submicrometer lines
Assignee: RCA Corp
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Filing: 1986-03-28
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Granted: 1987-03-10
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Expires: 2006-03-28
Abstract
Abstract The formation of elongated structures, such as lines, having a linewidth substantially less than one micrometer is described. An elongated structure of a first material having opposed sides, a rounded surface between the sides and a width typically of about one micrometer or greater is formed on a substrate. The sides of the structure are at least partially coated with a layer of a second material which will etch at a slower rate than the first material. The coating may completely cover the structure. The structure is anisotropically etched. Since the coating protects the sides of the structure, etching proceeds in the center to form two parallel lines, each significantly below one micrometer in width. In one embodiment, formation of the protective coating and etching of the structure are carried out simultaneously.
Inventors
- 👤 Jer-shen Maa
- 👤 Sheng M. Huang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 10:10
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/71; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/28; H10P50/282; H10P50/283; H10P50/73; H10P76/00; H10P76/40; Y; Y10; Y10S; Y10S438/00; Y10S438/942; Y10S438/947; Y10S438/948; Y10S438/951; Y10S438/964
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
136 words
A process of forming a submicrometer structure of a first material on a substrate comprising: forming an elongated structure of the first material on the substrate, said structure having a width of about one micrometer or greater, opposed sides and a rounded surface between said sides, wherein the radius of curvature of the surface of the structure is from about 100 to 500 nanometers, and the angle of taper of the sides of the structure to the substrate is from about 70° to about 90°; forming on said structure a layer of a second material which etches at a slower rate than said first material, said layer at least partially covering the sides of said structure; and anisotropically etching said structure for a time sufficient to form two parallel elongated structures having exposed substrate between them.
Claim 2
Dependent Claim
136 words
A process of forming a submicrometer structure of a first material on a substrate comprising: forming an elongated structure of the first material on the substrate, said structure having a width of about one micrometer or greater, opposed sides and a rounded surface between said sides, wherein the radius of curvature of the surface of the structure is from about 100 to 500 nanometers, and the angle of taper of the sides of the structure to the substrate is from about 70° to about 90°; forming on said structure a layer of a second material which etches at a slower rate than said first material, said layer at least partially covering the sides of said structure; and anisotropically etching said structure for a time sufficient to form two parallel elongated structures having exposed substrate between them.
Claim 3
Dependent Claim
17 words
A process in accordance with claim 1, wherein said layer of second material completely covers said structure.
Claim 4
Dependent Claim
19 words
A process in accordance with claim 2, wherein said layer of second material is formed by oxidizing said structure.
Claim 5
Dependent Claim
21 words
A process in accordance with claim 1, wherein said layer of second material is formed simultaneously with etching of the structure.
Claim 6
Dependent Claim
36 words
A process in accordance with claim 1, wherein said structure is formed on the substrate by providing a lift-off structure on the substrate, depositing a layer of the first material thereover and removing the lift-off structure.
Claim 7
Dependent Claim
31 words
A process in accordance with claim 1, additionally including the step of masking one of said parallel elongated structures and contacting the substrate with a suitable etchant to remove the other.
References Cited (Backward Citations)
US4547261A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-03-09 | 1990-09-08 | 1991-03-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-03-09 | 1994-09-08 | 1995-03-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-03-09 | 1998-09-08 | 1999-03-10 | $7700.00 | Window Closed / Lapsed |