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US4667512A Expired / Lapsed US ⏱️ 0.0 years remaining

Normal force transducer for receptacle contact

Assignee: TE Connectivity Corp
•
Filing: 1986-03-17
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Granted: 1987-05-26
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Expires: 2006-03-17
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Abstract

Abstract Apparatus for measuring the normal force exerted on a pin by a receptacle contact comprises a pair of beams profiled as the pin and having inward facing deflecting surfaces defining a central space. A thin film integrated circuit bonded to one of the beams includes a pair of strain gages at each end of the deflecting surface and leads extending to solder pads remote from the probe.

Inventors

  • 👤 John A. Buddwalk

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 21:09
CPC Classifications
G; G01; G01L; G01L1/00; G01L1/20; G01L1/22; G01L1/2206; G01L5/00; G01L5/0057

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 223 words
A device for measuring the contact force of a receptacle contact which receives a pin or the like, said device comprising: a metal probe having a base and a distal end, each probe comprising a plurality of beams collectively profiled as said pin or the like, each beam having a first support surface toward said base, a second support surface toward said distal end, and a deflecting surface lying therebetween, said first surfaces being juxtaposed against each other, said second surfaces being juxtaposed against each other, said beams being separated between said ends, said deflecting surfaces defining a central space, an elongate thin film integrated circuit bonded to the deflecting surface of one of said beams, said circuit comprising a first pair of strain gages bonded to said deflecting surface toward said first support surface and a second pair of strain gages bonded to said recessed surface toward said second support surface, said circuit further comprising lead means connected to said strain gages and extending beyond said first pair oppositely from said second pair for remote connection to current supply means and galvanometer means remote from said probe, said circuit forming a balanced bridge when said one of said beams is not loaded, whereby an unbalanced bridge condition results from loading said one of said beams and the deflecting force may be determined.
Claim 2
Independent Claim 223 words
A device for measuring the contact force of a receptacle contact which receives a pin or the like, said device comprising: a metal probe having a base and a distal end, each probe comprising a plurality of beams collectively profiled as said pin or the like, each beam having a first support surface toward said base, a second support surface toward said distal end, and a deflecting surface lying therebetween, said first surfaces being juxtaposed against each other, said second surfaces being juxtaposed against each other, said beams being separated between said ends, said deflecting surfaces defining a central space, an elongate thin film integrated circuit bonded to the deflecting surface of one of said beams, said circuit comprising a first pair of strain gages bonded to said deflecting surface toward said first support surface and a second pair of strain gages bonded to said recessed surface toward said second support surface, said circuit further comprising lead means connected to said strain gages and extending beyond said first pair oppositely from said second pair for remote connection to current supply means and galvanometer means remote from said probe, said circuit forming a balanced bridge when said one of said beams is not loaded, whereby an unbalanced bridge condition results from loading said one of said beams and the deflecting force may be determined.
Claim 3
Dependent Claim 47 words
A device as in claim 1 wherein one of said first support surfaces has a channel therethrough which substantially parallels the axis of said probe, said leads means being laterally spaced for reception in said channel where said lead means extends beyond said first pair of gages.
Claim 4
Dependent Claim 30 words
A device as in claim 1 wherein said integrated circuit further comprises solder pads opposite said first support surface, said lead means comprising individual leads extending to respective solder pads.
Claim 5
Dependent Claim 19 words
A device as in claim 3 wherein said solder pads are serially aligned with the axis of the probe.
Claim 6
Dependent Claim 19 words
A device as in claim 1 characterized by two beams collectively profiled to simulate a 0.025 inch square post.
Claim 7
Dependent Claim 47 words
A device as in claim 5 wherein a thin film integrated circuit is bonded to only one of said beams, the other beam having a deflection surface which is recessed to accommodate deflection of said one of said beams and is arched to limit its own deflection.
Claim 8
Dependent Claim 35 words
A device as in claim 5 wherein the dimension across the outside of the beams is slightly over 0.025 inch in the unloaded state, whereby the beams approximate a 0.025 inch square post when loaded.

References Cited (Backward Citations)

US2483867A Cited
US4380171A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-05-25 1990-11-24 1991-05-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-05-25 1994-11-24 1995-05-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-05-25 1998-11-24 1999-05-26 $7700.00 Window Closed / Lapsed

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