US4682928A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Wafer transfer apparatus
Assignee: Proconics International Inc
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Filing: 1984-11-02
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Granted: 1987-07-28
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Expires: 2004-11-02
Abstract
Abstract Wafer transfer apparatus including a wafer-pickup element having suction openings closer to the edge of wafer than the wafer's center so that the wafer can be picked up with greater certainty as to the locations of the wafer edges, the pickup element being thin and made of a structural layer of rigid structural material having grooves and a TEFLON layer laminated to the structural layer and having suction openings, the grooves and covering portions of TEFLON defining vacuum passages.
Inventors
- 👤 Richard F. Foulke
- 👤 Steven M. Lord
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 15:53
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/30; H10P72/34; H10P72/3411; H10P72/3412; B; B65; B65G; B65G47/00; B65G47/74; B65G47/90; B65G47/91; B65G47/912; H10P72/50; H10P72/53; H10P72/70; H10P72/78; H10P72/06; H10P72/0606; Y; Y10; Y10S; Y10S294/00; Y10S294/907; Y10S414/00; Y10S414/135; Y10S414/137; Y10S414/138; Y10S414/141
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
109 words
Apparatus for transferring semiconductor wafers, comprising a wafer-pickup element with at least two openings each located closer to the edge of a wafer than to the wafer's center, means for providing a below-atmospheric pressure or vacuum at said openings for the purpose of adhering a wafer to said wafer-pickup surface, and individual pressure sensors connected to vacuum lines extending to each said opening, whereby wafers may be picked up with greater certainty as to the locations of their edges with respect to said pickup element, and initial contact of any one opening with a wafer can be sensed by a change in the output of that opening's pressure sensor.
Claim 2
Dependent Claim
109 words
Apparatus for transferring semiconductor wafers, comprising a wafer-pickup element with at least two openings each located closer to the edge of a wafer than to the wafer's center, means for providing a below-atmospheric pressure or vacuum at said openings for the purpose of adhering a wafer to said wafer-pickup surface, and individual pressure sensors connected to vacuum lines extending to each said opening, whereby wafers may be picked up with greater certainty as to the locations of their edges with respect to said pickup element, and initial contact of any one opening with a wafer can be sensed by a change in the output of that opening's pressure sensor.
Claim 3
Dependent Claim
89 words
Apparatus for transferring semiconductor wafers, comprising a wafer pickup element thin enough to place wafers into a loaded quartz wafer boat which has a capacity of 50 or more wafers, said wafer element comprising a structural layer of rigid structural material laminated to a layer of TEFLON having vacuum engagement openings therethrough, the rigid structural material providing stiffness and the TEFLON providing an inert contact surface for the wafers, said structural layer having grooves defining, with covering portions of said TEFLON, vacuum passages leading to said vacuum engagement openings.
Claim 4
Dependent Claim
89 words
Apparatus for transferring semiconductor wafers, comprising a wafer pickup element thin enough to place wafers into a loaded quartz wafer boat which has a capacity of 50 or more wafers, said wafer element comprising a structural layer of rigid structural material laminated to a layer of TEFLON having vacuum engagement openings therethrough, the rigid structural material providing stiffness and the TEFLON providing an inert contact surface for the wafers, said structural layer having grooves defining, with covering portions of said TEFLON, vacuum passages leading to said vacuum engagement openings.
Claim 5
Dependent Claim
41 words
The apparatus of claim 2 wherein said structural material is aluminum, and said grooves are filled with tubes for routing vacuum to said vacuum openings in the wafer contact surface, said tubes being laid into said grooves prior to said lamination.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-07-27 | 1991-01-26 | 1991-07-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-07-27 | 1995-01-26 | 1995-07-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-07-27 | 1999-01-26 | 1999-07-28 | $7700.00 | Window Closed / Lapsed |