US4715937A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Low-temperature direct nitridation of silicon in nitrogen plasma generated by microwave discharge
Assignee: Leland Stanford Junior University
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Filing: 1986-05-05
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Granted: 1987-12-29
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Expires: 2006-05-05
Abstract
Abstract A process utilizing a microwave discharge technique for performing direct nitridation of silicon at a relatively low growth temperature of no more than about 500 DEG C. in a nitrogen plasma ambient without the presence of hydrogen or a fluorine-containing species. Nitrogen is introduced through a quartz tube. A silicon rod connected to a voltage source is placed in the quartz tube and functions as an anodization electrode. The silicon wafer to be treated is connected to a second voltage source and functions as the second electrode of the anodizing circuit. A small DC voltage is applied to the silicon wafer to make the plasma current at the wafer and the silicon rod equal and minimize contamination of the film.
Inventors
- 👤 Mehrdad M. Moslehi
- 👤 Chi Y. Fu
- 👤 Krishna Saraswat
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 17:57
CPC Classifications
C; C23; C23C; C23C8/00; C23C8/06; C23C8/36
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
165 words
A low-temperature process for forming an ultra-thin silicon nitride film on a silicon substrate by direct plasma nitridation of silicon comprising the steps of supporting a wafer comprising said silicon substrate on a wafer support in a stainless steel nitridation chamber, leading a quartz tube from a nitrogen gas source into said plasma nitridation chamber through a resonant cavity, establishing a fluorine and hydrogen-free nitrogen atmosphere in said quartz tube, generating nitrogen plasma inside the resonant cavity of said quartz tube, said plasma extending through the quartz tube into said nitridation chamber to the surface of said wafer, inserting a silicon rod into an end of said quartz tube distant from said wafer support, and providing an electrical connection between said silicon rod and a first voltage source to produce an anodization current and an electrical connection between said wafer and a second voltage source to equalize the plasma currents at the wafer and the silicon rod to minimize contamination of said silicon nitride film.
Claim 2
Dependent Claim
165 words
A low-temperature process for forming an ultra-thin silicon nitride film on a silicon substrate by direct plasma nitridation of silicon comprising the steps of supporting a wafer comprising said silicon substrate on a wafer support in a stainless steel nitridation chamber, leading a quartz tube from a nitrogen gas source into said plasma nitridation chamber through a resonant cavity, establishing a fluorine and hydrogen-free nitrogen atmosphere in said quartz tube, generating nitrogen plasma inside the resonant cavity of said quartz tube, said plasma extending through the quartz tube into said nitridation chamber to the surface of said wafer, inserting a silicon rod into an end of said quartz tube distant from said wafer support, and providing an electrical connection between said silicon rod and a first voltage source to produce an anodization current and an electrical connection between said wafer and a second voltage source to equalize the plasma currents at the wafer and the silicon rod to minimize contamination of said silicon nitride film.
Claim 3
Dependent Claim
17 words
A process as in claim 1 wherein the temperature of the wafer is 500° C. or less.
Claim 4
Dependent Claim
24 words
A process as in claim 1 wherein the wafer is heated to about 500° C. to improve the thickness uniformity of the wafer film.
Claim 5
Dependent Claim
12 words
A process as in claim 3 wherein said atmosphere consists of nitrogen.
Claim 6
Dependent Claim
20 words
A process as in claim 4 wherein the nitrogen plasma is generated by a microwave discharge at about 2.45 GHz.
Claim 7
Dependent Claim
23 words
A process as in claim 3 wherein the film is grown during application of reverse anodization current to said rod and said wafer.
Claim 8
Dependent Claim
17 words
A process as in claim 6 wherein the anodization current is maintained at a relatively low level.
References Cited (Backward Citations)
US4298629A
Cited
US4277320A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1990-12-28 | 1991-06-29 | 1991-12-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1994-12-28 | 1995-06-29 | 1995-12-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1998-12-28 | 1999-06-29 | 1999-12-29 | $7700.00 | Window Closed / Lapsed |