US4766473A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Single transistor cell for electrically-erasable programmable read-only memory and array thereof
Assignee: NXP USA Inc
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Filing: 1986-12-29
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Granted: 1988-08-23
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Expires: 2006-12-29
Abstract
Abstract A single transistor EEPROM cell comprises a source, a channel, a drain, a floating gate and a control gate. The control gate and the floating gate are co-extensive over the channel. Programming is achieved by charge injection from the channel and erasing is achieved by tunneling to the source. An array organization is disclosed which features a source/erase control line shared between two adjacent rows of the array, providing efficient byte-at-a-time erasing. An erasure scheme is disclosed which involves repetitive erase pulse-read-erase pulse cycles together with means for assuring complete erasure while preventing over-erasure from driving any cell in the array into depletion mode.
Inventors
- 👤 Clinton C. K. Kuo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 04:35
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
187 words
An EEPROM cell comprising: a semiconductor body predominantly of a first conductivity type; source and drain regions in said body at a first face thereof, said source and drain regions being of a second conductivity type, said source region being disposed generally along a first line and said drain region being spaced from said source region along a second line approximately perpendicular to said first line; a channel region in said body at said first face thereof separating said source and drain regions, said channel region being of said first conductivity type; a floating gate formed of patterned conductive material overlying and isolated from said body, said floating gate overlying said channel region and a portion of said source region; tunnel oxide means for selectively providing a tunneling path between said floating gate and said source, said tunnel oxide means being in a position removed from said second line; and a control gate formed of patterned conductive material overlying and isolated from said floating gate and said body, said control gate and said floating gate being co-extensive over said channel region and over said tunnel oxide means.
Claim 2
Dependent Claim
187 words
An EEPROM cell comprising: a semiconductor body predominantly of a first conductivity type; source and drain regions in said body at a first face thereof, said source and drain regions being of a second conductivity type, said source region being disposed generally along a first line and said drain region being spaced from said source region along a second line approximately perpendicular to said first line; a channel region in said body at said first face thereof separating said source and drain regions, said channel region being of said first conductivity type; a floating gate formed of patterned conductive material overlying and isolated from said body, said floating gate overlying said channel region and a portion of said source region; tunnel oxide means for selectively providing a tunneling path between said floating gate and said source, said tunnel oxide means being in a position removed from said second line; and a control gate formed of patterned conductive material overlying and isolated from said floating gate and said body, said control gate and said floating gate being co-extensive over said channel region and over said tunnel oxide means.
Claim 3
Dependent Claim
153 words
An EEPROM cell according to claim 1 further comprising: a second drain region of said second conductivity type in said body at said first face thereof, said second drain region being disposed opposite said first drain region across said source region; a second channel region in said body at said first face thereof separating said second drain region from said source region, said second channel region being of said first conductivity type; a second floating gate formed of patterned conductive material overlying and isolated from said body, said second floating gate overlying said second channel region and a portion of said source region, said tunnel means also selectively providing a tunneling path between said second floating gate and said source region; and second control gate means formed of patterned conductive material overlying and isolated from said body, said second control gate and said second floating gate being coextensive over said second channel region.
Claim 4
Dependent Claim
26 words
An EEPROM cell according to claim 1 wherein said tunnel means further comprises: a first layer of oxide separating said source region and said floating gate.
Claim 5
Dependent Claim
26 words
An EEPROM cell according to claim 2 wherein said tunnel means further comprises: a first layer of oxide separating said source region and said floating gate.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-08-23 | 1992-02-22 | 1992-08-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-08-23 | 1996-02-22 | 1996-08-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-08-23 | 2000-02-22 | 2000-08-23 | $7700.00 | Window Closed / Lapsed |