Detector buffer board

Claim 2

An infrared detection system comprising: an planar array segment of infrared detector elements; a multi-layer module for communicating signals from said detector array segment to external electronics, each of said layers being disposed in a plane transverse to said planar array segment and having a plurality of conductors formed thereon; and a buffer board disposed intermediate said detector array segment and said multi-layer module, said buffer board being disposed parallel to said planar array segment, said buffer board being in abutting electrical connection with said detector elements and said conductive patterns formed on said multi-layer module.

Claim 3

The system as recited in claim 1 wherein said buffer board comprises an insulating substrate having a plurality of conductive regions extending therethrough, said conductive regions including first conductive portions in electrical communication with a dedicated detector element and second conductive portions in electrical communication with a dedicated conductor formed on one of said layers.

Claim 4

An infrared detection system as recited in claim 1 wherein said buffer board is formed of alumina.

Claim 5

An infrared detection system as recited in claim 3 wherein said buffer board is formed of single crystaline alumina.

Claim 6

An infrared detection system as recited in claim 3 wherein said buffer board is formed of polycrystaline alumina.

Claim 7

An infrared detection system as recited in claim 1 wherein said buffer board is formed of ceramic material.

Claim 8

An infrared detection system as recited in claim 1 wherein said buffer board is formed of silicon.

Claim 9

An infrared detection system as recited in claim 1 wherein said buffer board is formed of galium arsenide.

Claim 10

An infrared detection system as recited in claim 2 wherein said conductive regions are disposed to have a center line spacing of between 0.002 and 0.020 inches.

Claim 11

An infrared detection system as recited in claim 2 wherein said conductive regions are disposed to have a center line spacing of between 0.002 and 0.004 inches.

Claim 12

The infrared detection system as recited in claim 2 wherein said buffer board is between 0.002 and 0.010 inches thick.

Claim 13

A process of forming an infrared detection system comprising: forming a first planar detection array segment having a plurality of detector elements; forming a multi-layer conductive module each of said layers extending transverse to said array segment and having electrical conductors formed thereon; forming a buffer board, said buffer board having first conductive portions connectable to said detector elements, and second conductive portions connectable to said module conductors; connecting said buffer board to said detector elements such that said first conductive portions are in electrical communication with said detector array segments; illuminating said infrared detector array segment with a source of infrared frequency light; monitoring signals appearing at said buffer board second conductive regions to determine the operating characteristics of said detector elements; and connecting said buffer board second conductive portions to said module conductors.

Claim 14

A process of forming an infrared detection system comprising: forming a first planar detection array segment having a plurality of detector elements; forming a multi-layer conductive module each of said layers extending transverse to said array segment and having electrical conductors formed thereon; forming a buffer board, said buffer board having first conductive portions connectable to said detector elements, and second conductive portions connectable to said module conductors; connecting said buffer board to said detector elements such that said first conductive portions are in electrical communication with said detector array segments; illuminating said infrared detector array segment with a source of infrared frequency light; monitoring signals appearing at said buffer board second conductive regions to determine the operating characteristics of said detector elements; and connecting said buffer board second conductive portions to said module conductors.

Claim 15

A detector buffer board for use in an infrared detection system comprising: a non-conductive substrate having a plurality of conductive regions extending therethrough, said conductive regions having first portions connectable to individual elements of a detector array segment, and second portions, disposed opposite said first portions and connectable to conductors formed on a multi-layer module, said layers being disposed transverse the plane of said substrate.

Claim 16

A detector buffer board for use in an infrared detection system comprising: a non-conductive substrate having a plurality of conductive regions extending therethrough, said conductive regions having first portions connectable to individual elements of a detector array segment, and second portions, disposed opposite said first portions and connectable to conductors formed on a multi-layer module, said layers being disposed transverse the plane of said substrate.

Claim 17

The buffer board as recited in claim 13 wherein said conductive regions are disposed to have center line spacing of between 0.002 inches and 0.020 inches.

Claim 18

The buffer board as recited in claim 13 wherein said conductive regions are disposed to have a center line spacing of between 0.002 and 0.004 inches.

Claim 19

The buffer board as recited in claim 13 wherein said substrate is formed of alumina.

Claim 20

The buffer board as recited in claim 13 wherein said substrate is formed of single crystaline alumina.

Claim 21

The buffer board as recited in claim 13 wherein said substrate is formed of polycrystaline alumina.

Claim 22

The buffer board as recited in claim 13 wherein said substrate is formed of a ceramic material.

Claim 23

The buffer board as recited in claim 13 wherein said substrate is formed of silicon.

Claim 24

The buffer board as recited in claim 13 wherein said substrate is formed of galium arsenide.

Claim 25

The buffer board as recited in claim 13 wherein said substrate is formed to be between 0.002 and 0.010 inches thick.

Claim 26

The buffer board as recited in claim 13 wherein said substrate is formed to be between 0.002 and 0.004 inches thick.

Claim 27

A process of relieving mechanical strain on a detector array segment connected to a multi-layer module, said process comprising: forming a buffer board having an array of conductive regions extending therethrough, transverse to the plane of said buffer board; connecting a first surface of said buffer board to said detector array segment such that each of said conductive regions is in electrical communication with an individual detector element of said array segment; and connecting a second surface of said buffer board to said module such that each of said conductive regions is in electrical communication with a dedicated conductor formed on one of said layers.

Claim 28

A process of relieving mechanical strain on a detector array segment connected to a multi-layer module, said process comprising: forming a buffer board having an array of conductive regions extending therethrough, transverse to the plane of said buffer board; connecting a first surface of said buffer board to said detector array segment such that each of said conductive regions is in electrical communication with an individual detector element of said array segment; and connecting a second surface of said buffer board to said module such that each of said conductive regions is in electrical communication with a dedicated conductor formed on one of said layers.