Probe for testing electronic components

Claim 1

A hand-held probe for electrically contacting the lead of a mounted electronic component with a plurality of contact tip portions spaced from each other along said lead so as to provide a segment of desired length between said tip portions, said probe comprising a probe guide member made of insulating material and having a probe surface adapted to be brought into close proximity to said lead and a plurality of holes extending through said member from said probe surface to another surface, electrical wires positioned in said holes and having tip portions extending from said probe surface, said holes being located at said probe surface so as to cause said tip portions to be spaced from each other by said desired length, and a support attached to said guide member, said wires being sandwiched between said support and said guide member, said guide member covering said wires, said wires bending where said holes end at said another surface to provide said contact tip portions along contact axes that are transverse to said probe surface, said guide member and support having respective base ends, being secured to each other at said base ends, and extending separately in cantilever fashion from said base ends along longitudinal axes that are transverse to said contact axes, said guide member and support having a dimension in a direction parallel to said contact axes that is less than the dimensions along said longitudinal axes and axes transverse to said longitudinal axes and contact axes, thereby providing low profile to said probe when said probe surface is in close proximity to said lead.