Method for altering characteristics of junction semiconductor devices

Claim 1

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the step of applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor.

Claim 2

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the step of applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor.

Claim 11

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor; (2) measuring the value of the electrical characteristic of the circuit; (3) comparing the measured value with a predetermined value; and (4) repeating steps 1-3 until the difference between the measured value and the predetermined value is smaller than a predetermined amount.

Claim 12

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor; (2) measuring the value of the electrical characteristic of the circuit; (3) comparing the measured value with a predetermined value; and (4) repeating steps 1-3 until the difference between the measured value and the predetermined value is smaller than a predetermined amount.

Claim 13

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) measuring the value of the electrical characteristic of the circuit; (2) comparing the measured value with a predetermined value and terminating the method if the difference between the measured value and the predetermined value is smaller than a predetermined amount, otherwise, continuing on to step 3; (3) applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, and (4) returning to step 1.

Claim 14

A method for altering an electrical characteristic of a circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) measuring the value of the electrical characteristic of the circuit; (2) comparing the measured value with a predetermined value and terminating the method if the difference between the measured value and the predetermined value is smaller than a predetermined amount, otherwise, continuing on to step 3; (3) applying at least one electrical pulse across the junction, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, and (4) returning to step 1.

Claim 15

A method for matching an electrical characteristic of a circuit with that of another like circuit, each circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) measuring the electrical characteristic of both circuits, (2) applying at least one electrical pulse across the junction of one of the circuits, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, (3) measuring the electrical characteristic of the altered circuit, (4) comparing the measured values of the electrical characteristic, and (5) repeating steps 2-4 until the difference between the electrical characteristics of both circuits is smaller than a predetermined amount.

Claim 16

A method for matching an electrical characteristic of a circuit with that of another like circuit, each circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) measuring the electrical characteristic of both circuits, (2) applying at least one electrical pulse across the junction of one of the circuits, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, (3) measuring the electrical characteristic of the altered circuit, (4) comparing the measured values of the electrical characteristic, and (5) repeating steps 2-4 until the difference between the electrical characteristics of both circuits is smaller than a predetermined amount.

Claim 17

A method for matching an electrical characteristic of a circuit with that of another like circuit, each circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) applying at least one electrical pulse across the junction of one of the circuits, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, (2) measuring the electrical characteristic of both circuits, (3) comparing the measured values of the electrical characteristic, and (4) repeating steps 1-3, where step 2 hereafter only requires measurement of the electric characteristic of the circuit which is being altered, until the difference between the electrical characteristic of both circuits is smaller than a predetermined amount.

Claim 18

A method for matching an electrical characteristic of a circuit with that of another like circuit, each circuit having at least one junction formed from a first and a second semiconductor and having an electrode contacted to the first semiconductor and an electrode contacted to the second semiconductor, the method comprising the steps of: (1) applying at least one electrical pulse across the junction of one of the circuits, including applying the pulse to the electrodes, the pulse having sufficient amplitude of one or more of its electrical parameters and time duration to degrade the electrical transport characteristics of the junction, and, thereby, alter the electrical characteristic of the circuit, the amplitudes of the electrical parameters and the time duration of the at least one pulse being low enough so that dendrites or filaments of material from the electrodes are not formed in the first or second semiconductor, (2) measuring the electrical characteristic of both circuits, (3) comparing the measured values of the electrical characteristic, and (4) repeating steps 1-3, where step 2 hereafter only requires measurement of the electric characteristic of the circuit which is being altered, until the difference between the electrical characteristic of both circuits is smaller than a predetermined amount.