Label inspection apparatus sensing reflectivity values

Claim 2

A label inspection apparatus for inspecting labels on containers such as, for example, containers of generally rectangular horizontal cross-section in the label areas and where the labels are applied to generally flat or slightly convex as opposed to round side surfaces of the container, and further where the containers with the labels to be inspected are moving by a conveyor past the inspection apparatus in an upright position, said label inspection apparatus comprising: means for sensing the reflectivity values of pixels located over substantially the entire label for each container in a sample having a predetermined number of containers, the pixel locations being the same for each label in the sample and each label to be inspected, the containers and labels in the sample being typical of those to be inspected, means for establishing MEANS reflectivity values from the reflectivity values of each pixel location for the containers in the sample, means for determining standard deviation values from the number of containers in the sample and the reflectivity values, means for establishing limits by which containers to be inspected are to be judged as pass or fail, said limits established as a function of said MEANS values and standard deviation values, means for inspecting labels on the containers to be inspected, including means for sensing the reflectivity value of each pixel in each label as with the containers in the sample, means for comparing values which are a function of the sensed values with the established limits, and means for passing or failing a label in response to said comparison.

Claim 3

The apparatus of claim 1 wherein said limits are MEANS plus and minus three standard deviations.

Claim 4

The apparatus of claim 2 wherein said means for passing or failing a label further comprises scoring the amount by which said compared values exceed said limits, and failing a label if its score exceeds a predetermined score.

Claim 5

The apparatus of claim 2 wherein said means for passing or failing a label further comprises scoring the amount by which said compared values exceed said limits and the number of said compared values for said label that exceed said limits, and failing said label if its score exceeds a predetermined score.

Claim 6

The apparatus of claim 1 further comprising means for automatically ejecting containers from the conveyor that fail inspection.

Claim 7

The apparatus of claim 1 wherein said sensing means further comprises photodetectors, and wherein said apparatus further comprises lamps for illuminating the labels as the containers move past the apparatus, said photodetectors sensing the reflectivity at each pixel location for each label as it moves past the apparatus.

Claim 8

The apparatus of claim 6 wherein said lamps are of the fluorescent type and are DC powered.

Claim 9

The apparatus of claim 1 further comprising an encoder for generating electrical pulses for each increment of movement of the conveyed containers past said apparatus, and means in response to selected said pulses for establishing the increments between pixels across the width of each label inspected.

Claim 10

The apparatus of claim 8 further comprising a detector for detecting a leading edge of each container as it enters said apparatus, means for counting encoder pulses in response to said detector detecting said leading edge, means for determining the pulse counts when said sensing means senses the leading and trailing edges of a container, and means for establishing the increments between pixels across the width of each label inspected from said pulse counts representing the leading and trailing container edges.

Claim 11

The apparatus of claim 1 wherein said pixels form a matrix over the label area, and said sensing means further comprises a plurality of sensors spaced vertically over substantially the entire height of the label area, each sensor sensing the reflectivity values of pixels spaced horizontally at substantially equal increments.

Claim 12

The apparatus of claim 1 wherein said apparatus is microprocessor based.

Claim 13

A label inspection apparatus for inspecting labels on containers such as, for example, containers of generally rectangular cross-section in the label areas and where the labels are applied to generally flat or slightly convex as opposed to round side surfaces of the containers, and further where the containers with the labels to be inspected are moving by a conveyor past the inspection apparatus in an upright position, said label inspection apparatus comprising: a housing supported relative to the conveyor such that the containers to be inspected move past the housing, a microprocessor unit, a detector for detecting the leading edge of each container as it moves past the apparatus and for sending a signal to said microprocessor in response to detecting said leading edge, a sensor array supported by said housing, said array including a plurality of sensors spaced vertically one from the other at equal intervals over substantially the entire height of the labels to be inspected, each sensor sensing the reflectivity values of a plurality of pixels spaced substantially at equal increments across substantially the entire widths of the labels, whereby the sensors sense the reflectivity values of the pixels spaced substantially over the entire label, said pixel locations being the same for each label of those to be inspected, said microprocessor unit receiving signals from said sensors representing said pixel reflectivity values, lamps for illuminating each label as it is sensed by said sensors, means in a LEARN cycle for sensing the reflectivity values of said pixels for each label in a sample of containers, said sample having a predetermined number of containers, said sample containers and their labels being typical of those to be inspected, said microprocessor unit in accordance with its operating program establishing MEANS reflectivity values from the reflectivity values of the pixels for the containers in the sample, and determining standard deviation values from the number of containers in the sample and the reflectivity values, means for establishing limits by which containers to be inspected are to be judged as pass or fail, said limits established as a function of said MEANS values and standard deviation values, means for sensing the reflectivity value for each pixel of each label to be inspected as with the sample, means associated with said microprocessor unit for comparing values which are a function of the sensed values with said established limits, and means associated with said microprocessor unit for determining the pass or fail of each label to be inspected in response to said comparison.

Claim 14

A label inspection apparatus for inspecting labels on containers such as, for example, containers of generally rectangular cross-section in the label areas and where the labels are applied to generally flat or slightly convex as opposed to round side surfaces of the containers, and further where the containers with the labels to be inspected are moving by a conveyor past the inspection apparatus in an upright position, said label inspection apparatus comprising: a housing supported relative to the conveyor such that the containers to be inspected move past the housing, a microprocessor unit, a detector for detecting the leading edge of each container as it moves past the apparatus and for sending a signal to said microprocessor in response to detecting said leading edge, a sensor array supported by said housing, said array including a plurality of sensors spaced vertically one from the other at equal intervals over substantially the entire height of the labels to be inspected, each sensor sensing the reflectivity values of a plurality of pixels spaced substantially at equal increments across substantially the entire widths of the labels, whereby the sensors sense the reflectivity values of the pixels spaced substantially over the entire label, said pixel locations being the same for each label of those to be inspected, said microprocessor unit receiving signals from said sensors representing said pixel reflectivity values, lamps for illuminating each label as it is sensed by said sensors, means in a LEARN cycle for sensing the reflectivity values of said pixels for each label in a sample of containers, said sample having a predetermined number of containers, said sample containers and their labels being typical of those to be inspected, said microprocessor unit in accordance with its operating program establishing MEANS reflectivity values from the reflectivity values of the pixels for the containers in the sample, and determining standard deviation values from the number of containers in the sample and the reflectivity values, means for establishing limits by which containers to be inspected are to be judged as pass or fail, said limits established as a function of said MEANS values and standard deviation values, means for sensing the reflectivity value for each pixel of each label to be inspected as with the sample, means associated with said microprocessor unit for comparing values which are a function of the sensed values with said established limits, and means associated with said microprocessor unit for determining the pass or fail of each label to be inspected in response to said comparison.

Claim 15

The apparatus of claim 12 further comprising an encoder for generating electrical pulses for each increment of movement of the conveyed containers past said apparatus, said pulses being transmitted to said microprocessor unit, and means associated with said microprocessor unit for establishing increments between pixels across the width of the labels in response to selected ones of said pulses.

Claim 16

The apparatus of claim 13 further comprising an ejector for ejecting containers from the conveyor, and means responsive to said microprocessor unit determining a label as failed to actuate said ejector to eject the container with said failed label from the conveyor.

Claim 17

The apparatus of claim 14 wherein said ejector emits a blast of air against a failed container in response to signals from the microprocessor unit to eject a container with a failed label.

Claim 18

The apparatus of claim 12 wherein said limits are MEANS plus and minus three standard deviations.

Claim 19

The apparatus of claim 16 wherein said means for passing or failing a label further comprises scoring the amount by which said compared values exceed said limits, and failing a label if its score exceeds a predetermined score.

Claim 20

The apparatus of claim 16 wherein said means for passing or failing a label further comprises scoring the amount by which said compared values exceed said limits and the number of said compared values for said label that exceed said limits, and failing said label if its score exceeds a predetermined score.

Claim 21

The apparatus of claim 12 wherein said sensing means further comprises photodetectors, and wherein said apparatus further comprises lamps for illuminating the labels as the containers move past the apparatus, said photodetectors sensing the reflectivity of said pixel locations for each label as it moves past the apparatus.

Claim 22

The apparatus of claim 19 wherein said lamps are of the fluorescent type and are DC powered.

Claim 23

The apparatus of claim 13 further comprising means associated with said microprocessor unit for counting encoder pulses in response to said detector detecting said leading edge, means for determining the pulse counts when said sensing array senses the leading and trailing edges of a container, and means associated with said microprocessor unit for establishing the increments between pixels across the width of each label inspected from said pulse counts representing the leading and trailing container edges.

Claim 24

The apparatus of claim 12 wherein said pixels form a matrix over the label area.