← Back to Patent Explorer
US4876588A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device having ceramic package incorporated with a heat-radiator

Assignee: NEC Corp
•
Filing: 1988-09-15
•
Granted: 1989-10-24
•
Expires: 2008-09-15
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A semiconductor device in which a heat-radiator is bonded by a resin film to a metal plate constituting a part of a package is disclosed. Gold plating layers are employed in bonding pads, outer leads and the die bonding portion of the package. However, from the surface of the metal plate to which the resin film is adhered, the gold plating layer is removed or excluded, and the resin film is adhered to an underlying nickel plating layer.

Inventors

  • 👤 Takashi Miyamoto

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 22:45
CPC Classifications
H; H10; H10W; H10W40/00; H10W40/10; H10W76/00; H10W76/10; H10W76/12; H10W76/15; H10W76/157; H10W76/60; H10W72/00; H10W72/071; H10W72/075; H10W72/07551; H10W72/07554; H10W72/50; H10W72/541; H10W72/547; H10W90/00; H10W90/701; H10W90/731; H10W90/737

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 386 words
A semiconductor device comprising; a ceramic substrate having a through-hole, a plurality of terminals each including a first metallized layer of high melting point material formed on the surface of said ceramic substrate at a portion outside said through-hole and a first nickel-plated layer covering said first metallized layer of said terminal, a plurality of bonding pads each including a second metallized layer of said high melting point material formed on the surface of said ceramic substrate at a portion inside said through-hole, a second nickel-plated layer covering said second metallized layer of said bonding pad and a first gold-plated layer covering said second nickel-plated layer of said bonding pad, and a sealing film including a third metallized layer of said high melting point material formed on the surface of said ceramic substrate surrounding said through-hole and a third nickel-plated layer covering said third metallized layer of said sealing film; a plurality of leads connected to respective said terminals, each lead including a lead body bonded to said first nickel-plated layer of said terminal by solder, a fourth nickel-plated layer covering said lead body and a second gold-plated layer covering said fourth-nickel plated layer of said lead, a metal plate including a metal plate substrate having first and second flat surfaces, said first surface being covered by a fifth nickel-plated layer and a third goldplated layer on said fifth nickel-plated layer, said second surface being covered by a sixth nickel-plated layer so that any gold plating layer is free from on said sixth nickel-plated layer, said metal plate being bonded to said sealing film by solder in such a manner that said metal plate closes one side opening of said through-hole to form a recess defined by said metal plate and said throughhole and that said first flat surface of said metal plate substrate is located inside said recess and said second flat surface of said metal plate substrate is located outside said recess; a semiconductor chip provided within said recess and fixed to said metal plate on said first flat surface; a heat-radiator; and a silicone resin film provided between said radiator and said metal plate and adhered to said radiator and to said sixth nickel-plated layer on said second flat surface of said metal plate substrate to bond said radiator to said metal plate.
Claim 2
Dependent Claim 386 words
A semiconductor device comprising; a ceramic substrate having a through-hole, a plurality of terminals each including a first metallized layer of high melting point material formed on the surface of said ceramic substrate at a portion outside said through-hole and a first nickel-plated layer covering said first metallized layer of said terminal, a plurality of bonding pads each including a second metallized layer of said high melting point material formed on the surface of said ceramic substrate at a portion inside said through-hole, a second nickel-plated layer covering said second metallized layer of said bonding pad and a first gold-plated layer covering said second nickel-plated layer of said bonding pad, and a sealing film including a third metallized layer of said high melting point material formed on the surface of said ceramic substrate surrounding said through-hole and a third nickel-plated layer covering said third metallized layer of said sealing film; a plurality of leads connected to respective said terminals, each lead including a lead body bonded to said first nickel-plated layer of said terminal by solder, a fourth nickel-plated layer covering said lead body and a second gold-plated layer covering said fourth-nickel plated layer of said lead, a metal plate including a metal plate substrate having first and second flat surfaces, said first surface being covered by a fifth nickel-plated layer and a third goldplated layer on said fifth nickel-plated layer, said second surface being covered by a sixth nickel-plated layer so that any gold plating layer is free from on said sixth nickel-plated layer, said metal plate being bonded to said sealing film by solder in such a manner that said metal plate closes one side opening of said through-hole to form a recess defined by said metal plate and said throughhole and that said first flat surface of said metal plate substrate is located inside said recess and said second flat surface of said metal plate substrate is located outside said recess; a semiconductor chip provided within said recess and fixed to said metal plate on said first flat surface; a heat-radiator; and a silicone resin film provided between said radiator and said metal plate and adhered to said radiator and to said sixth nickel-plated layer on said second flat surface of said metal plate substrate to bond said radiator to said metal plate.
Claim 3
Dependent Claim 22 words
A semiconductor device of claim 1, in which said silicone resin film has the thickness ranging from 20 μm to 100 μm.
Claim 4
Dependent Claim 23 words
A semiconductor device of claim 1, in which the surface of said sixth nickel-plated layer is converted to a thin nickel oxide film.
Claim 5
Dependent Claim 23 words
A semiconductor device of claim 3, in which said thin nickel oxide film has the thickness ranging from 1000 Å to 8000 Å.
Claim 6
Dependent Claim 27 words
A semiconductor device of claim 1, in which said sixth nickel-plated layer extends above the side of said metal plate substrate and reaches to said sealing film.
Claim 7
Dependent Claim 27 words
A semiconductor device of claim 1, in which said silicone resin film extends above the side of said metal plate substrate and reaches to said ceramic substrate.
Claim 8
Dependent Claim 27 words
A semiconductor device of claim 1, in which said metal plate further including a seventh nickel-plated layer provided on the entire surfaces of said metal plate substrate.
Claim 9
Dependent Claim 38 words
A semiconductor device of claim 7, in which a portion of said seventh nickel-plated layer on said second flat surface of said metal plate substrate is employed as said sixth nickel-plated layer for adhering said silicone resin film.
Claim 10
Dependent Claim 20 words
A semiconductor device of claim 1, in which said second flat surface of said metal plate has a circular shape.

References Cited (Backward Citations)

US3686539A Cited
US4172261A Cited
US4319264A Cited
US4611238A Cited
US4829403A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-10-23 1993-04-24 1993-10-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-10-23 1997-04-24 1997-10-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-10-23 2001-04-24 2001-10-24 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag