Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
148 words
A logic cell array comprising a plurality of configurable logic blocks arranged in rows and columns, each logic block including an electrically erasable programmable memory cell (E 2 PROM), said cell having a series connected CMOS transistor pair including a p-channel transistor having a source terminal connected to a positive voltage source and an n-channel transistor having a drain terminal connected a circuit ground potential, an output connected to a common terminal of said CMOS transistor pair, said CMOS transistor pair having a common floating gate, and means for selectively charging said common floating gate including capacitive means coupled to said floating gate, a programming electrode, a tunnelling oxide separating said programming electrode and said floating gate, and a programming transistor connected to said programming electrode for applying a programming voltage to said programming electrode for cold electron injection through said tunnelling oxide to said common floating gate.
Claim 2
Dependent Claim
148 words
A logic cell array comprising a plurality of configurable logic blocks arranged in rows and columns, each logic block including an electrically erasable programmable memory cell (E 2 PROM), said cell having a series connected CMOS transistor pair including a p-channel transistor having a source terminal connected to a positive voltage source and an n-channel transistor having a drain terminal connected a circuit ground potential, an output connected to a common terminal of said CMOS transistor pair, said CMOS transistor pair having a common floating gate, and means for selectively charging said common floating gate including capacitive means coupled to said floating gate, a programming electrode, a tunnelling oxide separating said programming electrode and said floating gate, and a programming transistor connected to said programming electrode for applying a programming voltage to said programming electrode for cold electron injection through said tunnelling oxide to said common floating gate.
Claim 3
Dependent Claim
41 words
The logic cell array as defined by claim 1 wherein said common floating gates comprises a first polycrystalline silicon layer and said capacitive means includes a second polycrystalline silicon layer spaced from, and capacitively coupled with, said first polycrystalline silicon layer.
Claim 4
Dependent Claim
127 words
An electrically erasable programmable memory cell (E 2 PROM) comprising a series connected CMOS transistor pair including a p-channel transistor having a source terminal connected to a positive voltage source and an n-channel transistor having a drain terminal connected to a circuit ground potential, an output connected to a common terminal of said CMOS transistor pair, said CMOS transistor pair having a common floating gate, and means for selectively charging said common floating gate including capacitive means coupled to said floating gate, a programming electrode, a tunnelling oxide separating said programming electrode and said floating gate, and a programming transistor connected to said programming electrode for applying a programming voltage to said programming electode for cold electron injection through said tunnelling oxide to said common floating gate.
Claim 5
Dependent Claim
127 words
An electrically erasable programmable memory cell (E 2 PROM) comprising a series connected CMOS transistor pair including a p-channel transistor having a source terminal connected to a positive voltage source and an n-channel transistor having a drain terminal connected to a circuit ground potential, an output connected to a common terminal of said CMOS transistor pair, said CMOS transistor pair having a common floating gate, and means for selectively charging said common floating gate including capacitive means coupled to said floating gate, a programming electrode, a tunnelling oxide separating said programming electrode and said floating gate, and a programming transistor connected to said programming electrode for applying a programming voltage to said programming electode for cold electron injection through said tunnelling oxide to said common floating gate.
Claim 6
Dependent Claim
45 words
The program memory cell as defined by claim 3 wherein said common floating gate comprises a first layer of polycrystalline silicon material and said capacitive means comprises a second layer of polycrystalline silicon material spaced from, and capacitively coupled with, said first polycrystalline silicon material.