Process for the production of electrical isolation zones in a CMOS integrated circuit

Claim 2

A process for the production of electrical isolation zones serving to isolate the n regions from the p regions of a CMOS integrated circuit formed in a silicon substrate comprising the steps of: (a) producing a first mask on the substrate having first patterns masking at least partly the p regions and whose sides have in their upper part an inclined profile, (b) producing a second mask on the substrate having second patterns masking at least partly the n regions, the first mask, being selectively etchable with respect to the second mask, the first and second patterns being spaced and defining between them the location of electrical isolation trenches to be produced, (c) etching the unmasked substrate regions for forming said trenches, (d) transferring the inclined profile of the first patterns in the substrate by etching the first mask for forming, in the upper part of the trenches, inclined sides in contact with the p regions, the section of the trenches widening towards the upper surface of the substrate.

Claim 3

Process according to claim 1, characterized in that the second mask is of metal or silicide.

Claim 4

Process according to claim 1, characterized in that the isolation trenches are filled with an isolating material,

Claim 5

Process according to claim 1, characterized in that it comprises the following stages: (a') producing the first mask on the upper surface of the substrate, whose patterns mask the substrate regions which will serve as the p regions, (b') etching the patterns of the first mask so that their sides have an inclined profile in their upper part, (c') forming spacers on each inclined side of the first mask patterns, (d') depositing a silicide solely above the regions of the substrate not covered by the first mask and the spacers, (e') eliminating the spacers, (f') etching the regions of the substrate exposed during the preceding stage in order to form trenches, (g') transferring the inclined profile of the first patterns in the substrate by etching the first mask for forming, in the upper part of the trenches, inclined sides in contact with the p regions, the section of the trenches widening towards the upper surface of the substrate, (h') filling the trenches with an isolating material.

Claim 6

Process according to claim 4, characterized in that the silicide is formed above the unmasked substrate regions by depositing on the structure obtained in step e' a metal layer (22) able to form a silicide (22a), forming a silicide (22a) from said metal solely above the unmasked substrate regions and eliminating the metal (22) which has not formed silicide (22a).

Claim 7

Process according to claim 1, comprising the following stages: (1) depositing a protective layer on the upper surface of the substrate, (2) depositing a polycrystalline silicon layer on the protective layer, (3) producing the first mask on the silicon layer whose patterns mask the substrate regions which will serve as the p regions, (4) etching the patterns of the first mask so that their sides have an inclined profile in their upper part, (5) forming spacers on each inclined side of the first mask patterns, (6) depositing a silicide solely above the regions of the substrate not covered by the first mask and the spacers, (7) eliminating the spacers, (8) etching the regions of the silicon layer exposed during the preceding stage, (9) etching the regions of the protective layer exposed during the preceding stage, (10) etching the regions of the substrate exposed during the preceding stage in order to form trenches, (11) transferring the inclined profile of the first patterns in the substrate by etching the first mask for forming, in the upper part of the trenches, inclined sides in contact with the p regions, the section of the trenches widening towards the upper surface of the substrate, (12) filling the trenches with an isolating material.

Claim 8

Process according to claim 1, characterized in that a p type doping takes place in the inclined sides of the trenches.

Claim 9

Process according to claim 4, characterized in that n ion implantation takes place between stages c' and d' for forming the n regions.

Claim 10

Process according to claim 4, characterized in that between stages g' and h' p ion implantation takes place for forming the p regions.

Claim 11

Process according to claim 8 or 9, characterized in that, after implantation, an annealing takes place for diffusing the implanted ions into the substrate.

Claim 12

Process according to claim 4, characterized in that the remainder of the first mask and the silicide is eliminated by etching between stages g' and h'.

Claim 13

Process according to claim 6, characterized in that said silicide is formed by depositing on the structure obtained in step (5) a metal layer able to form a silicide, forming a silicide by the reaction of said metal and the polycrystalline silicon at high temperature in the unmasked polycrystalline silicon layer regions, and eliminating the metal which has not formed silicide.

Claim 14

Process according to claim 5 or 6, characterized in that the metal is chosen from among platinum and palladium.

Claim 15

Process according to claim 1, characterized in that the first mask and the substrate are etched anisotropically at identical etching speeds for the first mask and the substrate.

Claim 16

Process according to claim 4, characterized in that a thermal oxidation of the substrate takes place leading to the formation of an oxide film on the sides and bottom of the trenches.

Claim 17

Process according to claim 4, characterized in that, after stage h', a local field oxide is produced above each trench.

Claim 18

Process according to claim 1, comprising the following stages: (a') producing the first mask on the upper surface of the substrate, whose patterns mask the substrate regions which will serve as the p regions, (b') etching the patterns of the first mask so that their sides have an inclined profile in their upper part, (c') forming spacers on each side of the first mask patterns, (d') depositing a metal solely above the regions of the substrate not covered by the first mask and the spacers, (e') eliminating the spacers, (f') etching the regions of the substrate exposed during the preceding stage in order to form trenches, (g') transferring the inclined profile of the first patterns in the substrate by etching the first mask for forming, in the upper part of the trenches, inclined sides in contact with the p regions, the section of the trenches widening towards the upper surface of the substrate, (h') filling the trenches with an isolating material.

Claim 19

Process according to claim 17, characterized in that the spacers and first mask are respectively made from silicon nitride and silicon oxide and in that the metal is tungsten deposited selectively by chemical vapor phase deposition.

Claim 20

Process according to claim 17, characterized in that the spacers and the first mask are made respectively from silicon oxide and silicon nitride and in that the metal is tungsten deposited selectively by chemical vapor phase deposition.

Claim 21

Process according to claim 17, characterized in that n ion implantation takes place between stages c' and d' for forming the n regions.

Claim 22

Process according to claim 17, characterized in that between stages g' and h' p ion implantation takes place for forming the p regions.

Claim 23

Process according to claim 20 or 21, characterized in that after implantation, an annealing takes place for diffusing the implanted ions into the substrate.

Claim 24

Process according to claim 17, characterized in that, a protective layer and then a polycrystalline silicon layer is deposited on the substrate before stage a', in that regions of said protective layer and then of the silicon layer are exposed during stage e' and then eliminated.

Claim 25

Process according to claim 17, characterized in that a thermal oxidation of the substrate takes place leading to the formation of an oxide film on the sides and bottom of the trenches.

Claim 26

Process according to claim 17, characterized in that, after stage h', a local field oxide is produced above each trench.

Claim 27

Process according to claim 17, characterized in that the remainder of the first mask and the metal is eliminated by etching between stages g' and h'.