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US4908275A Expired / Lapsed US ⏱️ 0.0 years remaining

Film carrier and method of manufacturing same

Assignee: JAPAN ENERGY DENSHI ZAIRYO KK
•
Filing: 1988-02-25
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Granted: 1990-03-13
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Expires: 2008-02-25
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Abstract

Abstract There is provided a film carrier comprising a resin base film and a rolled copper foil laminated thereon, said rolled copper foil forming leads for mounting semiconductor chips or other electronic components in place, characterized in that said rolled copper foil is made of a copper alloy composition consisting essentially of a total of 0.005 to 1.5% by weight of one or two or more selected from a group consisting of ______________________________________ P 0.005-0.05 wt %, B 0.005-0.05 wt %, Al 0.01-0.5 wt %, As 0.01-0.5 wt %, Cd 0.01-0.5 wt %, Co 0.01-0.5 wt %, Fe 0.01-0.5 wt %, In 0.01-0.5 wt %, Mg 0.01-0.5 wt %, Mn 0.01-0.5 wt %, Ni 0.01-0.5 wt %, Si 0.01-0.5 wt %, Sn 0.01-0.5 wt %, Te 0.01-0.5 wt %, Ag 0.01-1 wt %, Cr 0.01-1 wt %, Hf 0.01-1 wt %, Zn 0.01-1 wt % and Zn 0.01-1 wt % ______________________________________ and the remainder Cu with inevitable impurities, preferably with oxygen content of not more than 50 ppm. There is also provided a method for manufacturing a film carrier characterized in that the leads of the film carrier for mounting semiconductor chips or other electronic components in place are formed by the steps of providing a rolled copper alloy foil having the composition defined above, preferably strain relief annealing it after its final cold rolling and then laminating the annealed foil onto a resin base film followed by etching.

Inventors

  • 👤 Masahiro Tsuji
  • 👤 Susumu Kawauchi
  • 👤 Hiroshi Nakayama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 23:11
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/66; H05; H05K; H05K1/00; H05K1/02; H05K1/09; H10W70/67; H10W70/688; H10W72/00; H10W72/01; H10W72/019; H05K1/03; H05K1/0393; H05K2201/00; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0355; Y; Y10; Y10S; Y10S428/00; Y10S428/901; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121; Y10T428/00; Y10T428/31504; Y10T428/31678; Y10T428/31681; Y10T428/31692

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 154 words
A film carrier comprising a resin base film and a rolled copper foil laminated thereon, said rolled copper foil forming leads for mounting semiconductor chips or other electronic components in place, characterized in that said rolled copper foil is made of a copper alloy composition consisting essentially of a total of 0.005 to 1.5% by weight of one or more selected from the group consisting of ______________________________________ P 0.005-0.05 wt %, B 0.005-0.05 wt %, Al 0.01-0.5 wt %, As 0.01-0.5 wt % Cd 0.01-0.5 wt %, Co 0.01-0.5 wt %, Fe 0.01-0.5 wt %, In 0.01-0.5 wt %, Mg 0.01 = 0.5 wt %, Mn 0.05-0.2 wt %, Ni 0.01-0.5 wt %, Si 0.01-0.5 wt %, Sn 0.01-0.5 wt %, Te 0.01-0.5 wt %, Ag 0.01-1 wt %, Cr 0.01-1 wt %, Hf 0.01-1 wt %, Zn 0.01-1 wt % and Zr 0.01-1 wt %, ______________________________________ and the remainder Cu with inevitable impurities.
Claim 2
Dependent Claim 154 words
A film carrier comprising a resin base film and a rolled copper foil laminated thereon, said rolled copper foil forming leads for mounting semiconductor chips or other electronic components in place, characterized in that said rolled copper foil is made of a copper alloy composition consisting essentially of a total of 0.005 to 1.5% by weight of one or more selected from the group consisting of ______________________________________ P 0.005-0.05 wt %, B 0.005-0.05 wt %, Al 0.01-0.5 wt %, As 0.01-0.5 wt % Cd 0.01-0.5 wt %, Co 0.01-0.5 wt %, Fe 0.01-0.5 wt %, In 0.01-0.5 wt %, Mg 0.01 = 0.5 wt %, Mn 0.05-0.2 wt %, Ni 0.01-0.5 wt %, Si 0.01-0.5 wt %, Sn 0.01-0.5 wt %, Te 0.01-0.5 wt %, Ag 0.01-1 wt %, Cr 0.01-1 wt %, Hf 0.01-1 wt %, Zn 0.01-1 wt % and Zr 0.01-1 wt %, ______________________________________ and the remainder Cu with inevitable impurities.
Claim 3
Dependent Claim 19 words
The film carrier according to the claim 1 wherein the content of oxygen is not more than 50 ppm.
Claim 4
Dependent Claim 41 words
The film carrier according to claim 1 wherein said rolled copper foil comprises a copper alloy composition consisting essentially of one or more elements selected from the group consisting of In, Sn and Ag and the remainder Cu with inevitable impurities.
Claim 5
Dependent Claim 18 words
The film carrier according to claim 3 wherein the content of oxygen is not more than 50 ppm.
Claim 6
Dependent Claim 17 words
The film carrier according to claim 4 wherein the content of oxygen is less than 20 ppm.
Claim 7
Dependent Claim 152 words
A film carrier comprising a resin base film and a rolled copper foil laminated thereon, said rolled copper foil forming leads for mounting semiconductor chips or other electronic components in place, characterized in that said rolled copper foil is made of a copper alloy composition consisting essentially of a total of 0.005 to 1.5% by weight of one or more selected from the group consisting of ______________________________________ P 0.007-0.02 wt %, B 0.007-0.02 wt %, Al 0.05-0.2 wt %, As 0.05-0.2 wt % Cd 0.05-0.2 wt %, Co 0.05-0.2 wt %, Fe 0.05-0.2 wt %, In 0.02-0.2 wt %, Mg 0.05-0.2 wt %, Mn 0.05-0.2 wt %, Ni 0.05-0.2 wt %, Si 0.05-0.2 wt %, Sn 0.05-0.2 wt %, Te 0.05-0.2 wt %, Ag 0.05-0.5 wt %, Cr 0.05-0.5 wt %, Hf 0.05-0.5 wt %, Zn 0.1-0.8 wt %, and Zr 0.05-0.5 wt %, ______________________________________ and the remainder Cu with inevitable impurities.
Claim 8
Dependent Claim 152 words
A film carrier comprising a resin base film and a rolled copper foil laminated thereon, said rolled copper foil forming leads for mounting semiconductor chips or other electronic components in place, characterized in that said rolled copper foil is made of a copper alloy composition consisting essentially of a total of 0.005 to 1.5% by weight of one or more selected from the group consisting of ______________________________________ P 0.007-0.02 wt %, B 0.007-0.02 wt %, Al 0.05-0.2 wt %, As 0.05-0.2 wt % Cd 0.05-0.2 wt %, Co 0.05-0.2 wt %, Fe 0.05-0.2 wt %, In 0.02-0.2 wt %, Mg 0.05-0.2 wt %, Mn 0.05-0.2 wt %, Ni 0.05-0.2 wt %, Si 0.05-0.2 wt %, Sn 0.05-0.2 wt %, Te 0.05-0.2 wt %, Ag 0.05-0.5 wt %, Cr 0.05-0.5 wt %, Hf 0.05-0.5 wt %, Zn 0.1-0.8 wt %, and Zr 0.05-0.5 wt %, ______________________________________ and the remainder Cu with inevitable impurities.
Claim 9
Dependent Claim 38 words
A film carrier according to claim 6 wherein said copper alloy composition consists essentially of a total of 0.005 to 1.5% by weight of at least one element selected from the group consisting of In, Sn and Ag.
Claim 10
Dependent Claim 18 words
A film carrier according to claim 6 wherein the content of oxygen is not more than 50 ppm.
Claim 11
Dependent Claim 18 words
A film carrier according to claim 6 wherein the content of oxygen is not more than 20 ppm.

References Cited (Backward Citations)

US4731287A Cited
US4719134A Cited
US4764413A Cited
US4762747A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-03-12 1993-09-11 1994-03-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-03-12 1997-09-11 1998-03-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-03-12 2001-09-11 2002-03-13 $7700.00 Window Closed / Lapsed

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