US4952272A
Expired / Lapsed
US
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Method of manufacturing probing head for testing equipment of semi-conductor large scale integrated circuits
Assignee: Hitachi Ltd
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Filing: 1989-05-30
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Granted: 1990-08-28
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Expires: 2009-05-30
Abstract
Abstract A probe head for use with equipment for testing a semiconductor device such as a large scale integrated circuit (LSI) includes electrode pads are formed on a circuit substrate, and a pad protecting conductive layer formed on the pads. A probe pin forming material is grown which is worked into a pin-like configuration, thereby improving a pin assembling property of a probe head portion and this realizes highly accurate pinning with high reliability.
Inventors
- 👤 Hironobu Okino
- 👤 Akio Fujiwara
- 👤 Yutaka Akiba
- 👤 Susumu Kasukabe
- 👤 Tsuyoshi Fujita
- 👤 Masao Mitani
- 👤 Kazuo Hirota
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 09:27
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
248 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI), wherein the probing head comes into contact with an electrode pad of the semiconductor LSI to transmit an electric signal to a testing equipment body, the method comprising the steps of: preparing a multilayer circuit substrate accommodating therein a structure of multilayer circuit and in which electrode pad patterns are provided in a predetermined spaced relation on opposite surfaces thereof; coating and forming a pad protecting conductive layer on one surface of said multilayer circuit substrate; forming a probe pin conductive layer on said pad protecting conductive layer and flattening said surface; forming a first mask pattern having a center axis registered with said electrode pad on said probe pin conductive layer; forming a second mask pattern having a larger diameter of a hole than that of said first mask pattern on said first mask pattern, said second mask pattern being formed concentric with said first mask pattern; applying a first stage etching to said probe pin conductive layer using said second mask pattern as a mask to form a rough pin shape; removing said second mask pattern, applying a second stage etching and controlling a dimension of said pin tip and a peripheral edge of an electrode pad at a base; and removing said first mask pattern and etching and removing an exposed portion of said pad protective layer in a self-matching manner using said pin base as a mask.
Claim 2
Independent Claim
248 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI), wherein the probing head comes into contact with an electrode pad of the semiconductor LSI to transmit an electric signal to a testing equipment body, the method comprising the steps of: preparing a multilayer circuit substrate accommodating therein a structure of multilayer circuit and in which electrode pad patterns are provided in a predetermined spaced relation on opposite surfaces thereof; coating and forming a pad protecting conductive layer on one surface of said multilayer circuit substrate; forming a probe pin conductive layer on said pad protecting conductive layer and flattening said surface; forming a first mask pattern having a center axis registered with said electrode pad on said probe pin conductive layer; forming a second mask pattern having a larger diameter of a hole than that of said first mask pattern on said first mask pattern, said second mask pattern being formed concentric with said first mask pattern; applying a first stage etching to said probe pin conductive layer using said second mask pattern as a mask to form a rough pin shape; removing said second mask pattern, applying a second stage etching and controlling a dimension of said pin tip and a peripheral edge of an electrode pad at a base; and removing said first mask pattern and etching and removing an exposed portion of said pad protective layer in a self-matching manner using said pin base as a mask.
Claim 3
Dependent Claim
21 words
The method according to claim 1, further comprising, applying incorrosive metal plating to the pin surface after said step of removing.
Claim 4
Dependent Claim
34 words
The method according to claim 1, wherein said first mask pattern and said second mask pattern are formed by those having a selectivity with respect to an etching liquid for said probe conductive layer.
Claim 5
Independent Claim
214 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI), the method comprising the steps of: preparing a circuit substrate having one surface arrayed with electrode pads for forming a probe pin while the back thereof is arrayed with electrode pads for transmitting an electric signal between the electrode pads of the testing equipment and said LSI, said pads on both the surfaces being electrically connected with each other in a specific arraying relation; forming a pad protecting conductive layer on the electrode pads for forming at least said probe pin; laminating and forming a probe pin conductive layer having a thickness corresponding to a height required for the probe on said circuit substrate including said pad protecting conductive layer; forming a mask pattern with a center of the mask pattern registered in position with a center axis of the electrode pad for forming said probe pin; selectively etching said probe pin conductive layer using said mask pattern as a mask to thereby form a probe pin and expose a pad protecting conductive layer between said pads; removing the pad protecting conductive layer exposed by said of selectively etching; and removing a mask pattern on the probe pin formed by said step of forming a mask pattern.
Claim 6
Independent Claim
214 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI), the method comprising the steps of: preparing a circuit substrate having one surface arrayed with electrode pads for forming a probe pin while the back thereof is arrayed with electrode pads for transmitting an electric signal between the electrode pads of the testing equipment and said LSI, said pads on both the surfaces being electrically connected with each other in a specific arraying relation; forming a pad protecting conductive layer on the electrode pads for forming at least said probe pin; laminating and forming a probe pin conductive layer having a thickness corresponding to a height required for the probe on said circuit substrate including said pad protecting conductive layer; forming a mask pattern with a center of the mask pattern registered in position with a center axis of the electrode pad for forming said probe pin; selectively etching said probe pin conductive layer using said mask pattern as a mask to thereby form a probe pin and expose a pad protecting conductive layer between said pads; removing the pad protecting conductive layer exposed by said of selectively etching; and removing a mask pattern on the probe pin formed by said step of forming a mask pattern.
Claim 7
Dependent Claim
45 words
The method according to claim 4, wherein in the selective etching of said probe pin conductive layer, said pad protecting conductive layer comprises a good conductor having an etching resistance and is formed by a film forming method such as deposition, plating, CVD or sputtering.
Claim 8
Dependent Claim
52 words
The method according to claim 4, wherein said probe pin conductive layer comprises any one kind of metal selected from the group consisting of W, Mo, Ti, Cr, Ta, Nb, Cu-Ni group alloy, Ba-Cu alloy and copper, and is formed by a film forming method such as deposition, plating, CVD or sputtering.
Claim 9
Dependent Claim
57 words
The method according to claim 4, wherein said pad protecting conductive layer and said probe pin conductive layer are laminated so that an equation h=0.5 to 2d is fulfilled, wherein h represents a height from the circuit substrate of said probe pin, and d represents a pitch between the base electrode pads of the adjacent probe pins.
Claim 10
Dependent Claim
78 words
The method according to claim 4, wherein using said mask pattern as a mask, said probe pin conductive layer is subjected to selective etching for etching process and is subjected to etching while effecting side etching by a wet etching method, or subjected to etching halfway by dry etching after which is subjected to etching while effecting side etching by a wet etching method to form a polygonal conical acute probe pin including a circle and an ellipse.
Claim 11
Dependent Claim
39 words
The method according to claim 1, wherein said circuit substrate comprises a multi-layer circuit substrate having at least three circuit layers comprising a conduction circuit layer for power supply, a signal input and output layer and a ground layer.
Claim 12
Dependent Claim
17 words
The method according to claim 9, wherein said multi-layer circuit substrate comprises a ceramics multi-layer laminated substrate.
Claim 13
Dependent Claim
28 words
The method according to claim 4, further comprising smoothing the surface of said probe pin forming conductive layer after lamination and forming said probe pin forming conductive layer.
Claim 14
Independent Claim
233 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI) comprising the steps of: preparing a circuit substrate having one surface formed with a row of electrode pads for fixing by inserting a probe pin and the back formed with a row of electrode pads connected to the testing equipment, said electrode pads on both the surfaces being electrically connected with each other in a specific arraying relation; forming a row of electrode pads having patterns corresponding to that of a row of electrode pads for fixing by inserting the probe pin of said circuit substrate on one surface of a conductive sheet; placing said both rows of pads in opposed relation to secure said conductive sheet to said circuit substrate; filling and solidifying an insulative retainer in a gap between said circuit substrate and said conductive sheet secured by said step; polishing smoothly the other surface of said conductive sheet as desired and thereafter forming a polygonal mask pattern including a circle, the center position of which is the same as each pad of said both rows of electrode pads on the surface of said conductive sheet; subjecting said conductive sheet to selective etching using said mask pattern as a mask to thereby form a row of polygonal conical acute pins including a circle corresponding to said row of electrode pads; and removing said mask.
Claim 15
Independent Claim
233 words
A method of manufacturing a probing head for testing equipment of semiconductor large scale integrated circuits (LSI) comprising the steps of: preparing a circuit substrate having one surface formed with a row of electrode pads for fixing by inserting a probe pin and the back formed with a row of electrode pads connected to the testing equipment, said electrode pads on both the surfaces being electrically connected with each other in a specific arraying relation; forming a row of electrode pads having patterns corresponding to that of a row of electrode pads for fixing by inserting the probe pin of said circuit substrate on one surface of a conductive sheet; placing said both rows of pads in opposed relation to secure said conductive sheet to said circuit substrate; filling and solidifying an insulative retainer in a gap between said circuit substrate and said conductive sheet secured by said step; polishing smoothly the other surface of said conductive sheet as desired and thereafter forming a polygonal mask pattern including a circle, the center position of which is the same as each pad of said both rows of electrode pads on the surface of said conductive sheet; subjecting said conductive sheet to selective etching using said mask pattern as a mask to thereby form a row of polygonal conical acute pins including a circle corresponding to said row of electrode pads; and removing said mask.
Claim 16
Dependent Claim
52 words
The method according to claim 12, wherein said conductive sheet comprises any one kind of metal selected from the group consisting of W, Mo, Ti, Cr, Ta, Nb, Ni-Cu alloy, Be-Cu alloy and Cu, and said mask comprises a metal or photo resist capable of withstanding selective etching of said conductive sheet.
Claim 17
Dependent Claim
55 words
The method according to claim 12, wherein in the step of placing both the rows of pads in opposed relation to secure said conductive sheet to said circuit substrate through a conductive layer, both the pads are coated in advance with metal brazing material, and both the rows of pads are fixed by the brazing.
Claim 18
Dependent Claim
15 words
The method according to claim 14, wherein gold (Au) is used as said brazing material.
Claim 19
Dependent Claim
104 words
The method according to claim 12, wherein the etching process in the step of selective etching said conductive sheet using said mask pattern as a mask comprises using a wet etching method to effect etching while carrying out side etching or using dry etching to effect etching halfway widthwise direction, and thereafter using a wet etching method to effect etching while carrying out side etching or using wet etching to effect side etching, after which effecting etching in a widthwise direction by dry etching to form a row of polygonal conical acute pins including a circle of a height of the desired probe pin.
Claim 20
Dependent Claim
67 words
The method according to claim 12, wherein in the step of forming a row of electrode pads of said conductive sheet, a mask having a predetermined pattern is formed on one surface of said conductive sheet, said conductive sheet being subjected to selective etching to the desired depth to form in advance a convex surface on one surface of said conductive sheet to provide an electrode pad.
Claim 21
Dependent Claim
46 words
The method according to claim 17, wherein in the step of filling and solidifying an insulative retainer in a gap between said circuit substrate and said conductive sheet, said insulative retainer to be filled and solidified comprises a plastic organic high polymer resin or inorganic insulator.
Claim 22
Dependent Claim
36 words
The method according to claim 18, wherein as said organic high polymer resin, one of the group of polyimide resin, polyamide resin, epoxy resin and silicone resin is filled in said gap and heated and solidified.
Claim 23
Dependent Claim
41 words
The method according to claim 18, wherein as said inorganic insulator, a low melting point glass is molten and filled in said gap, and heated and solidified whereby an insulator containing silica (SIO 2 ) as a main component is filled.
References Cited (Backward Citations)
US4585991A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-08-27 | 1994-02-26 | 1994-08-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-08-27 | 1998-02-26 | 1998-08-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-08-27 | 2002-02-26 | 2002-08-28 | $7700.00 | Window Closed / Lapsed |