US4952525A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a semiconductor device in which a silicon wafer is locally provided with field oxide regions
Assignee: US Philips Corp
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Filing: 1989-12-11
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Granted: 1990-08-28
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Expires: 2009-12-11
Abstract
Abstract A method of manufacturing a semiconductor device, in which on a surface (1) of a silicon wafer (2) an oxidation mask (3) is locally provided, whereupon the wafer is subjected to an oxidation treatment, in which a layer of field oxide (8) is formed. In order to compensate for thickness losses during further processing steps, a layer of field oxide (8) has to be formed having a thickness exceeding a desired isolation thickness. This initial thickness is realized according to the invention in such a manner that a layer is formed having a thickness which is larger than the initial thickness, whereupon in a plasma with reactive ions this layer is etched back to the desired initial thickness. In the layer thus formed, having the desired initial thickness, the layer of field oxide is prevented from locally being etched in an etching solution (such as the hydrofluoride solution) at a higher rate during further processing steps.
Inventors
- 👤 Paulus A. van der Plas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 23:04
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0125; H10W10/0126; H10W10/0127; H10W10/10; H10W10/13
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
139 words
In a method of manufacturing a semiconductor device including the steps of locally providing an oxidation mask on a surface of a silicon wafer, and thereafter subjecting said silicon wafer to an oxidation treatment to form a layer of field oxide at parts of said surface free of said oxidation mask, said layer having a first thickness equal to a required isolation thickness plus an additional thickness, the improvement comprising the steps of initially forming said layer of field oxide to a second thickness at least 100 nm larger than said first thickness and at most 250 nm larger than said first thickness, and thereafter etching said silicon wafer with a reactive ion plasma to reduce said second thickness to said first thickness, wherein edges of said layer of field oxide are maintained to eliminate failure of isolation regions.
Claim 2
Dependent Claim
139 words
In a method of manufacturing a semiconductor device including the steps of locally providing an oxidation mask on a surface of a silicon wafer, and thereafter subjecting said silicon wafer to an oxidation treatment to form a layer of field oxide at parts of said surface free of said oxidation mask, said layer having a first thickness equal to a required isolation thickness plus an additional thickness, the improvement comprising the steps of initially forming said layer of field oxide to a second thickness at least 100 nm larger than said first thickness and at most 250 nm larger than said first thickness, and thereafter etching said silicon wafer with a reactive ion plasma to reduce said second thickness to said first thickness, wherein edges of said layer of field oxide are maintained to eliminate failure of isolation regions.
Claim 3
Dependent Claim
45 words
A method according to claim 1 wherein, before said step of etching, a planarizing auxiliary layer is formed over said silicon wafer including said layer of field oxide at said second thickness, and wherein said planarizing auxiliary layer is removed upon said step of etching.
Claim 4
Dependent Claim
27 words
A method according to claim 2, wherein said planarizing auxiliary layer is formed of silicon oxide by heating said silicon wafer in an atmosphere containing tetraethoxy silane.
Claim 5
Dependent Claim
77 words
A method according to claim 2, wherein said step of etching in a reactive ion plasma is carried out in a parallel plate reactor having one plate connected to ground and another plate connected to a supply source, wherein said silicon wafer is provided on said one plate connected to ground, and wherein said reactive ion plasma is produced between said plates in a gas mixture of tetrafluoromethane (CF 4 ) and argon passed between said plates.
Claim 6
Dependent Claim
77 words
A method according to claim 1, wherein said step of etching in a reactive ion plasma is carried out in a parallel plate reactor having one plate connected to ground and another plate connected to a supply source, wherein said silicon wafer is provided on said one plate connected to ground, and wherein said reactive ion plasma is produced between said plates in a gas mixture of tetrafluoromethane (CF 4 ) and argon passed between said plates.
Claim 7
Dependent Claim
30 words
A method according to claim 1, wherein said layer of field oxide is etched homogenously, said second thickness preventing accelerated etching of edge portions of said layer of field oxide.
Claim 8
Dependent Claim
31 words
A method according to claim 1, wherein stresses at edges of said layer of field oxide are superficial, said second thickness enabling removal of said stresses upon etching said second thickness.
Claim 9
Dependent Claim
30 words
A method according to claim 1, wherein superficial stresses at edges of said layer of field oxide are removed by reactive ion etching said second thickness to said first thickness.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-08-27 | 1994-02-26 | 1994-08-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-08-27 | 1998-02-26 | 1998-08-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-08-27 | 2002-02-26 | 2002-08-28 | $7700.00 | Window Closed / Lapsed |