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US5015100A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus and method for normal incidence reflectance spectroscopy

Assignee: Hellma Axiom Inc
•
Filing: 1990-03-02
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Granted: 1991-05-14
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Expires: 2010-03-02
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Abstract

Abstract An external reflectance spectroscopy apparatus and method are disclosed in which maximum radiation througput is obtained by using a beamsplitter which reflects half of a collimated beam and transmits the other half. In order to obtain reliable results, the condition of perpendicular incidence on the sample is approximated (without limiting throughput) by providing a beamsplitter having an uneven number of reflecting blades and the same number of transmitting openings. Each reflecting blade is opposite to an open area having the same size and shape. The result is a substantial equalizing of contributions from rays polarized parallel to the plane of incidence and from rays polarized perpendicular to the plane of incidence.

Inventors

  • 👤 Walter M. Doyle

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 00:40
CPC Classifications
G; G02; G02B; G02B27/00; G02B27/10; G02B27/14; G02B27/143; G01; G01N; G01N21/00; G01N21/17; G01N21/55; G01N21/25; G01N21/31; G01N21/35; G01N2021/3595

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 117 words
A spectroscopy system for analysis of a sample, using external reflectance spectroscopy, which comprises: means for providing a pre-sample analytical radiation beam; means for detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; means for positioning a sample which will provide a significant amount of specular reflection; and a beamsplitter which (a) causes approximately half of the pre-sample radiation beam to reach the sample, (b) causes substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensures a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 2
Dependent Claim 117 words
A spectroscopy system for analysis of a sample, using external reflectance spectroscopy, which comprises: means for providing a pre-sample analytical radiation beam; means for detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; means for positioning a sample which will provide a significant amount of specular reflection; and a beamsplitter which (a) causes approximately half of the pre-sample radiation beam to reach the sample, (b) causes substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensures a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 3
Dependent Claim 64 words
The spectroscopy system of claim 1 wherein: the beamsplitter has a projection in a plane perpendicular to the axis of symmetry of the radiation beam, which projection comprises a plurality of reflecting blades, and an equal number of spaced open areas; each beamsplitter blade being opposite one of the beamsplitter open areas, and having a radiation-facing shape and area matching the opposite open area.
Claim 4
Dependent Claim 14 words
The spectroscopy system of claim 2 in which the beamsplitter projection is generally circular.
Claim 5
Dependent Claim 34 words
The spectroscopy system of claim 3 in which the beamsplitter has a generally elliptical periphery, and is located in a plane which is not perpendicular to the axis of symmetry of the radiation beam.
Claim 6
Dependent Claim 32 words
The spectroscopy system of claim 4 in which the beamsplitter is located in a plane which is at an angle of approximately 45° to the axis of symmetry of the radiation beam.
Claim 7
Dependent Claim 17 words
The spectroscopy system of claim 3 in which the radiation beam at the beamsplitter is substantially collimated.
Claim 8
Dependent Claim 29 words
The spectroscopy system of claim 2 which also comprises: a focusing mirror which reflects post-beamsplitter radiation to a focus at the sample, and returns post-sample radiation to the beamsplitter.
Claim 9
Dependent Claim 18 words
The spectroscopy system of claim 7 in which the beamsplitter is located in or near its self-conjugate plane.
Claim 10
Dependent Claim 24 words
The spectroscopy system of claim 2 in which the number of beamsplitter blades is three, and the number of opposite open area is three.
Claim 11
Dependent Claim 36 words
The spectroscopy system of claim 2 in which the number of beamsplitter blades is an uneven number of at least three, and the number of opposite open areas is the same as the number of blades.
Claim 12
Dependent Claim 29 words
The spectroscopy system of claim 1 which also comprises: a focusing mirror which reflects post-beamsplitter radiation to a focus at the sample, and returns post-angle radiation to the beamsplitter.
Claim 13
Dependent Claim 17 words
The spectroscopy system of claim 11 in which the radiation beam at the beamsplitter is substantially collimated.
Claim 14
Dependent Claim 112 words
A spectroscopy method for analysis of a sample, using external reflections spectroscopy, which comprises: providing a pre-sample analytical radiation beam; detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; positioning a sample which will provide a significant amount of specular reflection; and using a beamsplitter to (a) cause approximately half of the pre-sample radiation beam to reach the sample, (b) cause substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensure a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 15
Dependent Claim 112 words
A spectroscopy method for analysis of a sample, using external reflections spectroscopy, which comprises: providing a pre-sample analytical radiation beam; detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; positioning a sample which will provide a significant amount of specular reflection; and using a beamsplitter to (a) cause approximately half of the pre-sample radiation beam to reach the sample, (b) cause substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensure a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 16
Dependent Claim 109 words
A spectroscopy method for analysis of a sample, using external reflectance spectroscopy, which comprises: providing a pre-sample analytical radiation beam whose rays have "p" state; and "s" state polarization vectors; detecting a post-sample analytical radiation beam; directing the beam to the sample to provide a significant amount of specular reflection; splitting the beam to cause approximately half of the pre-sample radiation to reach the sample and substantially all of the specularly reflected radiation to reach the detecting means; and providing opposite matched beam reflecting and beam transmitting areas at the beam splitting location, in order to substantially equalize the total "p" state polarization and the total "s" state polarization.
Claim 17
Dependent Claim 109 words
A spectroscopy method for analysis of a sample, using external reflectance spectroscopy, which comprises: providing a pre-sample analytical radiation beam whose rays have "p" state; and "s" state polarization vectors; detecting a post-sample analytical radiation beam; directing the beam to the sample to provide a significant amount of specular reflection; splitting the beam to cause approximately half of the pre-sample radiation to reach the sample and substantially all of the specularly reflected radiation to reach the detecting means; and providing opposite matched beam reflecting and beam transmitting areas at the beam splitting location, in order to substantially equalize the total "p" state polarization and the total "s" state polarization.
Claim 18
Dependent Claim 20 words
The spectroscopy method of claim 14 in which the pre-sample analytical beam is a collimated beam when beam splitting occurs.

References Cited (Backward Citations)

US4479700A Cited
US4712912A Cited
US4852955A Cited
US4758088A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-05-13 1994-11-12 1995-05-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-05-13 1998-11-12 1999-05-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-05-13 2002-11-12 2003-05-14 $7700.00 Window Closed / Lapsed

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