Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
117 words
A spectroscopy system for analysis of a sample, using external reflectance spectroscopy, which comprises: means for providing a pre-sample analytical radiation beam; means for detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; means for positioning a sample which will provide a significant amount of specular reflection; and a beamsplitter which (a) causes approximately half of the pre-sample radiation beam to reach the sample, (b) causes substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensures a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 2
Dependent Claim
117 words
A spectroscopy system for analysis of a sample, using external reflectance spectroscopy, which comprises: means for providing a pre-sample analytical radiation beam; means for detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; means for positioning a sample which will provide a significant amount of specular reflection; and a beamsplitter which (a) causes approximately half of the pre-sample radiation beam to reach the sample, (b) causes substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensures a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 3
Dependent Claim
64 words
The spectroscopy system of claim 1 wherein: the beamsplitter has a projection in a plane perpendicular to the axis of symmetry of the radiation beam, which projection comprises a plurality of reflecting blades, and an equal number of spaced open areas; each beamsplitter blade being opposite one of the beamsplitter open areas, and having a radiation-facing shape and area matching the opposite open area.
Claim 4
Dependent Claim
14 words
The spectroscopy system of claim 2 in which the beamsplitter projection is generally circular.
Claim 5
Dependent Claim
34 words
The spectroscopy system of claim 3 in which the beamsplitter has a generally elliptical periphery, and is located in a plane which is not perpendicular to the axis of symmetry of the radiation beam.
Claim 6
Dependent Claim
32 words
The spectroscopy system of claim 4 in which the beamsplitter is located in a plane which is at an angle of approximately 45° to the axis of symmetry of the radiation beam.
Claim 7
Dependent Claim
17 words
The spectroscopy system of claim 3 in which the radiation beam at the beamsplitter is substantially collimated.
Claim 8
Dependent Claim
29 words
The spectroscopy system of claim 2 which also comprises: a focusing mirror which reflects post-beamsplitter radiation to a focus at the sample, and returns post-sample radiation to the beamsplitter.
Claim 9
Dependent Claim
18 words
The spectroscopy system of claim 7 in which the beamsplitter is located in or near its self-conjugate plane.
Claim 10
Dependent Claim
24 words
The spectroscopy system of claim 2 in which the number of beamsplitter blades is three, and the number of opposite open area is three.
Claim 11
Dependent Claim
36 words
The spectroscopy system of claim 2 in which the number of beamsplitter blades is an uneven number of at least three, and the number of opposite open areas is the same as the number of blades.
Claim 12
Dependent Claim
29 words
The spectroscopy system of claim 1 which also comprises: a focusing mirror which reflects post-beamsplitter radiation to a focus at the sample, and returns post-angle radiation to the beamsplitter.
Claim 13
Dependent Claim
17 words
The spectroscopy system of claim 11 in which the radiation beam at the beamsplitter is substantially collimated.
Claim 14
Dependent Claim
112 words
A spectroscopy method for analysis of a sample, using external reflections spectroscopy, which comprises: providing a pre-sample analytical radiation beam; detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; positioning a sample which will provide a significant amount of specular reflection; and using a beamsplitter to (a) cause approximately half of the pre-sample radiation beam to reach the sample, (b) cause substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensure a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 15
Dependent Claim
112 words
A spectroscopy method for analysis of a sample, using external reflections spectroscopy, which comprises: providing a pre-sample analytical radiation beam; detecting a post-sample analytical radiation beam; the analytical radiation beam comprising rays which have "p" state and "s" state polarization vectors; positioning a sample which will provide a significant amount of specular reflection; and using a beamsplitter to (a) cause approximately half of the pre-sample radiation beam to reach the sample, (b) cause substantially the full specularly reflected radiation from the sample to reach the detecting means, and (c) ensure a substantial balance between the total "p" state polarization and the total "s" state polarization of the radiation reflected by the sample.
Claim 16
Dependent Claim
109 words
A spectroscopy method for analysis of a sample, using external reflectance spectroscopy, which comprises: providing a pre-sample analytical radiation beam whose rays have "p" state; and "s" state polarization vectors; detecting a post-sample analytical radiation beam; directing the beam to the sample to provide a significant amount of specular reflection; splitting the beam to cause approximately half of the pre-sample radiation to reach the sample and substantially all of the specularly reflected radiation to reach the detecting means; and providing opposite matched beam reflecting and beam transmitting areas at the beam splitting location, in order to substantially equalize the total "p" state polarization and the total "s" state polarization.
Claim 17
Dependent Claim
109 words
A spectroscopy method for analysis of a sample, using external reflectance spectroscopy, which comprises: providing a pre-sample analytical radiation beam whose rays have "p" state; and "s" state polarization vectors; detecting a post-sample analytical radiation beam; directing the beam to the sample to provide a significant amount of specular reflection; splitting the beam to cause approximately half of the pre-sample radiation to reach the sample and substantially all of the specularly reflected radiation to reach the detecting means; and providing opposite matched beam reflecting and beam transmitting areas at the beam splitting location, in order to substantially equalize the total "p" state polarization and the total "s" state polarization.
Claim 18
Dependent Claim
20 words
The spectroscopy method of claim 14 in which the pre-sample analytical beam is a collimated beam when beam splitting occurs.